Publications by all authors

Journal articles with impact factor: accepted, 2024, 2023, 2022, 2021, 2020, 2019, 2018, 2017, 2016, 2015, 2014, 2013, 2012, 2011, 2010, 2009, 2008, 2007, 2006, 2005, 2004, 2003, 2002, 2001, 2000, 1999, 1998, 1996, 1995, 1994, 1993, 1992, 1991, 1990, 1989, 1988, 1987, 1986, 1985, 1984, 1982, 1981, 1980, 1979, 1977, 1976, 1974, 1973, 1972, 1971
Journal articles without impact factor: 2018, 2017, 2009, 2008, 2007, 2005, 2004, 2003, 2002, 2001, 1999, 1998

Conference proceedings available from ISI Web of Science: 2016, 2015, 2011, 2010, 2009
Conference proceedings not available from ISI Web of Science: 2014, 2010, 2009, 2008, 2007, 2006, 2005, 2004, 2003, 2001, 2000, 1999, 1998, 1997, 1996, 1995

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Articles in journals with impact factor

accepted

390. Skalný J., Stoica A., Országh J., Vlădoiu R., Mason N.,
Positive and negative corona discharges in flowing carbon dioxide,
Journal of Physics D (accepted)

389. Gómez J., Křížková P., Dolečková A., Cardo L., Wetzl C., Pizúrová N., Prato M., Medalová J., Zajíčková L.,
Multifunctional Graphene Quantum Dots: A Therapeutic Strategy for Neurodegenerative Diseases by Regulating Calcium Influx, Inhibiting Aβ-Protein Aggregation, and Enhancing Blood-Brain Barrier Permeability,
Appl. Mater. Today (accepted)

2024

388. Navascués P., Buchtelová M., Zajíčková L., Rupper P., Hegemann D.,
Polymerization mechanisms of hexamethyldisiloxane in low-pressure plasmas involving complex geometries,
Applied Surface Science 645 (2024) 158824

387. Roy R., Holec D., Michal L., Hemzal D., Sarkar S., Kumar G., Nečas D., Dhankhar M., Kaushik P., Gómez J., Zajíčková L.,
Possible charge ordering and anomalous transport in graphene/graphene quantum dot heterostructure,
Journal of Physics: Condensed Matter 36(26) (2024) 265601

2023

386. Buchtelová M., Blahová L., Nečas D., Křížková P., Bartošíková J., Medalová J., Kolská Z., Hegemann D., Zajíčková L.,
Insight into peculiar adhesion of cells to plasma-chemically prepared multifunctional “amino-glue” surfaces,
Plasma Processes and Polymers 20 (2023) e2200157

385. Nečas D., Yacoot A., Valtr M., Klapetek P.,
Demystifying data evaluation in the measurement of periodic structures,
Measurement Science and Technology 34 (2023) 055015

384. Franta D., Vohánka J., Dvořák J., Franta P., Ohlídal I., Klapetek P., Březina J., Skoda D.,
Optical Characterization of Gadolinium Fluoride Films Using Universal Dispersion Model,
Coatings 13(2) (2023) 218

383. Gómez J., Sulleiro M., Pizúrová N., Bednařík A., Lepcio P., Holec D., Preisler J., Zajíčková L.,
Spontaneous formation of carbon dots helps to distinguish molecular fluorophores species,
Applied Surface Science 610 (2023) 155536

382. Valtr M., Klapetek P., Martinek J., Novotný O., Jelínek Z., Hortvík V., Nečas D.,
Scanning Probe Microscopy controller with advanced sampling support,
HardwareX 15 (2023) e00451

381. Janů L., Dvořáková E., Polášková K., Buchtelová M., Rysanek P., Chlup Z., Kruml T., Galmiz O., Nečas D., Zajíčková L.,
Enhanced adhesion of electrospun polycaprolactone nanofibers to plasma-modified polypropylene fabric,
Polymers 15 (2023) 1686

380. Polášková K., Ozkan A., Klíma M., Jeníková Z., Buddhadasa M., Reniers F., Zajíčková L.,
Comparing Efficiencies of Polypropylene Treatment by Atmospheric Pressure Plasma Jets,
Plasma Processes and Polymers 20 (2023) e2300031

379. Franta D., Vohánka J., Hroncová B.,
Dispersion models exhibiting natural optical activity: theory of dielectric response of isotropic systems,
Journal of the Optical Society of America B 40 (2023) 2928-2941

378. Gómez J., Ovejero-Paredes K., Méndez-Arriaga J., Pizúrová N., Filice M., Zajíčková L., Prashar S., Gómez-Ruiz S.,
Organotin(IV)-Decorated Graphene Quantum Dots as Dual Platform for Molecular Imagingand Treatment of Triple Negative Breast Cancer,
Chem.-Eur. J. 29 (2023) e202301845

377. Harumningtyas A., Ito T., Isobe M., Zajíčková L., Hamaguchi S.,
Molecular dynamics simulation of amine formation in plasma-enhanced chemical vapor deposition (PECVD) with hydrocarbon and amino radicals,
Journal of Vacuum Science and Technology A 41 (2023) 063007

376. Hroncová B., Franta D., Dvořák J., Pavliňák D.,
Dispersion models exhibiting natural optical activity: application to tartaric acid solutions,
Journal of the Optical Society of America B 40 (2023) 3209-3220

375. Gómez J., Diaz-Sanchez M., Pizúrová N., Zajíčková L., Prashar S., Gómez-Ruiz S.,
Crystalline F-doped titanium dioxide nanoparticles decorated with graphene quantum dots for improving the photodegradation of water pollutants,
J. Photochem. Photobiol. A-Chem. 443 (2023) 114875

2022

374. Gómez J., Sulleiro M., Dolečková A., Pizúrová N., Medalová J., Bednařík A., Preisler J., Nečas D., Zajíčková L.,
Structure elucidation of multicolor emissive graphene quantum dots towards cell guidance,
Materials Chemistry Frontiers 6 (2022) 145-154

373. Kovač J., Ekar J., Čekada M., Zajíčková L., Nečas D., Blahová L., Yong Wang J., Mozetič M.,
Depth profiling of thin plasma-polymerized amine films using GDOES in an Ar-O2 plasma,
Applied Surface Science 581 (2022) 152292

372. Manakhov A., Permyakova E., Sitnikova N., Tsygankova A., Alekseev A., Solomatina M., Baidyshev V., Popov Z., Blahová L., Eliáš M., Zajíčková L., Kovalskii A., Sheveyko A., Kiryukhantsev-Korneev P., Shtansky D., Nečas D., Solovieva A.,
Biodegradable Nanohybrid Materials as Candidates for Self-Sanitizing Filters Aimed at Protection from SARS-CoV-2 in Public Areas ,
Molecules 27(4) (2022) 1333

371. Gómez J., Russo M., Arcidiacono O., Sánchez-Carnerero E., Klán P., Zajíčková L.,
Coupling BODIPY with nitrogen-doped graphene quantum dots to address the water solubility of photosensitizers,
Materials Chemistry Frontiers 6(12) (2022) 1719-1726

370. Polášková K., Nečas D., Dostál L., Klíma M., Fiala P., Zajíčková L.,
Self-organization phenomena in cold atmospheric pressure plasma slit jet,
Plasma Sources Science and Technology 31 (2022) 125014

369. Michal L., Roy R., Holec D., Gómez J., Pizúrová N., Nečas D., Dolečková A., Medalová J., Lepcio P., Zajíčková L.,
Long range magnetic order in Nickel Hydroxide-functionalized graphene quantum dots,
Journal of Physical Chemistry Letters 13 (2022) 11536-11542

368. Roy R., Holec D., Kratzer M., Muenzer P., Kaushik P., Michal L., Kumar G., Zajíčková L., Teichert C.,
Probing the charge transfer and electron-hole asymmetry in graphene-graphene quantum dot heterostructure,
Nanotechnology 33(32) (2022) 325704

367. Muñoz J., Palacios-Corella M., Gómez J., Zajíčková L., Pumera M.,
Synthetic Nanoarchitectonics of Functional Organic–Inorganic 2D Germanane Heterostructures via Click Chemistry,
Advanced Materials 34 (2022) 2206382

2021

366. Klapetek P., Grolich P., Nezval D., Valtr M., Šlesinger R., Nečas D.,
GSvit – an open source FDTD solver for realistic nanoscale optics simulations,
Computer Physics Communications 265 (2021) 108025

365. Michlíček M., Blahová L., Dvořáková E., Nečas D., Zajíčková L.,
Deposition Penetration Depth and Sticking Probability in Plasma Polymerization of Cyclopropylamine,
Applied Surface Science 540 (2021) 147979

364. Kodama J., Harumningtyas A., Ito T., Michlíček M., Sugimoto S., Kita H., Chijimatsu R., Ukon Y., Kushioka J., Rintaro O., Kamatani T., Hashimoto K., Tateiwa D., Tsukazaki H., Nakagawa S., Takenaka S., Makino T., Sakai Y., Nečas D., Zajíčková L., Hamaguchi S., Kaito T.,
Amine modification of calcium phosphate by low-pressure plasma for bone regeneration,
Scientific Reports 11 (2021) 17870

363. Gómez J., Sulleiro M., Dolečková A., Pizúrová N., Medalová J., Roy R., Nečas D., Zajíčková L.,
Exploring the Emission Pathways in Nitrogen-Doped Graphene Quantum Dots for Bioimaging,
Journal of Physical Chemistry C 125 (2021) 21044-21054

362. Franta D., Vohánka J.,
Constitutive equations describing optical activity in theory of dispersion,
Journal of the Optical Society of America B 38 (2021) 553-561

361. Ohlídal I., Vohánka J., Čermák M.,
Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization,
Coatings 11(22) (2021) 31

360. Roy R., Nečas D., Zajíčková L.,
Evidence of flexoelectricity in graphene nanobubbles created by tip induced electric field,
Carbon 179 (2021) 677-682

359. Nečas D., Klapetek P.,
Synthetic Data in Quantitative Scanning Probe Microscopy,
Nanomaterials 11 (2021) 1746

358. Kaushik P., Eliáš M., Prášek J., Michalička J., Zajíčková L.,
Manipulating MWCNT/TiO2 heterostructure morphology at nanoscale and its implications to NO2 sensing properties,
Materials Chemistry and Physics 271 (2021) 124901

357. Franta D., Muresan M.,
Wide spectral range optical characterization of yttrium aluminum garnet (YAG) single crystal by universal dispersion model,
Optical Materials Express 11 (2021) 3930-3945

356. Polášková K., Klíma M., Jeníková Z., Blahová L., Zajíčková L.,
Effect of Low Molecular Weight Oxidized Materials and Nitrogen Groups on Adhesive Joints of Polypropylene Treated by a Cold Atmospheric Plasma Jet,
Polymers 13 (2021) 4396

355. Manakhov A., Sitnikova N., Tsygankova A., Alekseev A., Adamenko L., Permyakova E., Baidyshev V., Popov Z., Blahová L., Eliáš M., Zajíčková L., Solovieva A.,
Electrospun Biodegradable Nanofibers Coated Homogenously by Cu Magnetron Sputtering Exhibit Fast Ion Release. Computational and Experimental Study,
Membranes 11 (2021) 965

2020

354. Ohlídal I., Vohánka J., Buršíková V., Franta D., Čermák M.,
Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers,
Optics Express 28 (2020) 160-174

353. Ondračka P., Nečas D., Carette M., Elisabeth S., Holec D., Granier A., Goullet A., Zajíčková L., Richard-Plouet M.,
Unravelling local environments in mixed TiO2–SiO2 thin films by XPS and ab initio calculations,
Applied Surface Science 510 (2020) 145056

352. Nečas D., Klapetek P., Valtr M.,
Estimation of roughness measurement bias originating from background subtraction,
Measurement Science and Technology 31 (2020) 094010

351. Klapetek P., Yacoot A., Hortvík V., Duchoň V., Dongmo H., Rerucha S., Valtr M., Nečas D.,
Multiple fibre interferometry setup for probe sample interaction measurements in atomic force microscopy,
Measurement Science and Technology 31 (2020) 094001

350. Černochová P., Blahová L., Medalová J., Nečas D., Michlíček M., Kaushik P., Přibyl J., Bartošíková J., Manakhov A., Bačáková L., Zajíčková L.,
Cell type specific adhesion to surfaces functionalised by amine plasma polymers,
Scientific Reports 10 (2020) 9357

349. Hu X., Dai G., Sievers S., Fernández-Scarioni A., Corte-León H., Puttock R., Barton C., Kazakova O., Ulvr M., Klapetek P., Havlíček M., Nečas D., Tang Y., Neu V., Schumacher H.,
Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy,
Journal of Magnetism and Magnetic Materials 511 (2020) 166947

348. Nečas D., Valtr M., Klapetek P.,
How levelling and scan line corrections ruin roughness measurement and how to prevent it,
Scientific Reports 10 (2020) 15294

347. Garnæs J., Nečas D., Nielsen L., Madsen M., Torras-Rosell A., Zeng G., Klapetek P., Yacoot A.,
Algorithms for using silicon steps for scanning probe microscope evaluation,
Metrologia 57 (2020) 064002

346. Heger T., Zukal J., Seidlová V., Němcová M., Nečas D., Papežíková I., Piaček V., Zajíčková R., Banďouchová H., Pikula J.,
Measurement of phagocyte activity in heterotherms,
Acta Veterinaria Brno 89 (2020) 79-87

345. Franta D.,
Symmetry of Linear Dielectric Response Tensors: Dispersion Models Fulfilling Three Fundamental Conditions,
Journal of Applied Physics 127 (2020) 223101

344. Kupka V., Dvořáková E., Manakhov A., Michlíček M., Petruš J., Vojtová L., Zajíčková L.,
Well-Blended PCL/PEO Electrospun Nanofibers with Functional Properties Enhanced by Plasma Processing,
Polymers 12(1403) (2020) 16

343. Vohánka J., Franta D., Čermák M., Homola V., Buršíková V., Ohlídal I.,
Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials,
Optics Express 28 (2020) 5492-5506

342. Čermák M., Vohánka J., Franta D., Ohlídal I.,
Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh–Rice theory and Yeh matrix formalism,
Physica Scripta 95 (2020) 095503

341. Mullen J., Atanasova M., Obrusník A., Zajíčková L.,
Thomson scattering versus modeling of the microwave plasma torch: a long standing discrepancy almost solved,
Journal of Analytical Atomic Spectrometry 35 (2020) 2064-2074

340. Zhang X., Li H., Yang H., Xie F., Yuan Z., Zajíčková L., Li W.,
Phase-Engineering of 1T/2H Molybdenum Disulfide by Using Ionic Liquid for Enhanced Electrocatalytic Hydrogen Evolution,
ChemElectroChem 7 (2020) 3347-3352

339. Vohánka J., Šustek Š., Buršíková V., Šklíbová V., Šulc V., Homola V., Franta D., Čermák M., Ohlídal M., Ohlídal I.,
Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry,
Applied Surface Science 534 (2020) 147625

338. Michlíček M., Hamaguchi S., Zajíčková L.,
Molecular dynamics simulation of amine groups formation during plasma processing of polystyrene surfaces,
Plasma Sources Science and Technology 29(10) (2020) 105020

337. Nemcakova I., Blahová L., Rysanek P., Blanquer A., Bačáková L., Zajíčková L.,
Behaviour of Vascular Smooth Muscle Cells on Amine Plasma-Coated Materials with Various Chemical Structures and Morphologies,
International Journal of Molecular Sciences 21 (2020) 9467

336. Donkó Z., Zajíčková L., Sugimoto S., Harumningtyas A., Hamaguchi S.,
Modeling Characterisation of a Bipolar Pulsed Discharge,
Plasma Sources Science and Technology 29 (2020) 104001

335. Ohlídal I., Vohánka J., Buršíková V., Šulc V., Šustek Š., Ohlídal M.,
Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films,
Optics Express 28 (2020) 36796-36811

2019

334. Miroshnichenko S., Timofeeva V., Permykova E., Ershov S., Kiryukhantsev-Korneev P., Dvořáková E., Shtansky D., Zajíčková L., Solovieva A., Manakhov A.,
Plasma-Coated Polycaprolactone Nanofibers with Covalently Bonded Platelet-Rich Plasma Enhance Adhesion and Growth of Human Fibroblasts,
Nanomaterials 9 (2019) 637-655

333. Jelínek P., Polášková K., Jeník F., Jeníková Z., Dostál L., Dvořáková E., Cerman J., Šourková H., Buršíková V., Špatenka P., Zajíčková L.,
Effects of additives on atmospheric pressure gliding arc applied to the modification of polypropylene,
Surface and Coatings Technology 372 (2019) 45-55

332. Makhneva E., Farka Z., Pastucha M., Obrusník A., Horáčková V., Skládal P., Zajíčková L.,
Maleic anhydride and acetylene plasma copolymer surfaces for SPR immunosensing,
Anal. Bioanal. Chem. 411 (2019) 7689-7697

331. Michlíček M., Manakhov A., Dvořáková E., Zajíčková L.,
Homogeneity and Penetration Depth of Atmospheric Pressure Plasma Polymerization onto Electrospun Nanofibrous Mats,
Applied Surface Science 471 (2019) 835–841

330. Mokhtar Hefny M., Nečas D., Zajíčková L., Benedikt J.,
The transport and surface reactivity of O atoms during the atmospheric plasma etching of hydrogenated amorphous carbon films,
Plasma Sources Science and Technology 28 (2019) 035010

329. Nečas D., Klapetek P., Neu V., Havlíček M., Puttock R., Kazakova O., Hu X., Zajíčková L.,
Determination of tip transfer function for quantitative MFM using frequency domain filtering and least squares method,
Scientific Reports 9 (2019) 3880

328. Manakhov A., Permyakova E., Ershov S., Sheveyko A., Kovalskii A., Polčák J., Zhitnyak I., Gloushankova N., Zajíčková L., Shtansky D.,
Bioactive TiCaPCON-coated PCL nanofibers as a promising material for bone tissue engineering,
Applied Surface Science 479 (2019) 796-802

327. Kaushik P., Eliáš M., Michalička J., Hegemann D., Pytlíček Z., Nečas D., Zajíčková L.,
Atomic Layer Deposition of Titanium Dioxide on Multi-Walled Carbon Nanotubes for Ammonia Gas Sensing,
Surface and Coatings Technology 370 (2019) 235-243

326. Franta D., Vohánka J., Čermák M., Franta P., Ohlídal I.,
Temperature dependent dispersion models applicable in solid state physics,
Journal Of Electrical Engineering 70 (2019) 1-15

325. Ohlídal I., Vohánka J., Franta D., Čermák M., Ženíšek J., Vasina P.,
Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films,
Journal Of Electrical Engineering 70 (2019) 16-26

324. Vohánka J., Čermák M., Franta D., Ohlídal I.,
Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh–Rice theory,
Physica Scripta 94 (2019) 045502

323. Ponomarev V., Sheveyko A., Permyakova E., Lee J., Voevodin A., Berman D., Manakhov A., Michlíček M., Slukin P., Firstova V., Ignatov S., Chepkasov I., Popov Z., Shtansky D.,
TiCaPCON-Supported Pt- and Fe-Based Nanoparticles and Related Antibacterial Activity,
ACS Applied Materials & Interfaces 11 (2019) 28699

322. Vohánka J., Ohlídal I., Ohlídal M., Šustek Š., Čermák M., Šulc V., Vasina P., Ženíšek J., Franta D.,
Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects,
Coatings 9(7) (2019) 416

321. Franta D., Vohánka J., Bránecký M., Franta P., Čermák M., Ohlídal I., Čech V.,
Optical Properties of the Crystalline Silicon Wafers Described Using the Universal Dispersion Model,
Journal of Vacuum Science & Technology B 37 (2019) 062907

320. Vohánka J., Nečas D., Franta D.,
Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions,
Journal of Vacuum Science & Technology B 37 (2019) 062909

319. Ohlídal I., Vohánka J., Čermák M., Franta D.,
Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers,
Surface Topography: Metrology and Properties 7(4) (2019) 045004

318. Ohlídal I., Vohánka J., Buršíková V., Ženíšek J., Vasina P., Čermák M., Franta D.,
Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model,
Journal of Vacuum Science & Technology B 37(6) (2019) 062921

317. Ohlídal I., Vohánka J., Mistrík J., Čermák M., Vižďa F., Franta D.,
Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model,
Thin Solid Films 692 (2019) 137189

316. Kubena M., Eliáš M., Zajíčková L., Poduska J., Kruml T.,
On the Tensile Tests of Polyurethane and Its Composites with Carbon Nanotubes,
Advances in Materials Science and Engineering 2019(6598452) (2019) 9

315. Salingova B., Simara P., Matula P., Zajíčková L., Synek P., Jašek O., Veverkova L., Sedlackova M., Nichtova Z., Koutna I.,
The Effect of Uncoated SPIONs on hiPSC-Differentiated Endothelial Cells,
International Journal of Molecular Sciences 20(3536) (2019) 16

2018

314. Obrusník A., Makhneva E., Farka Z., Vandenbossche M., Hegemann D., Skládal P., Zajíčková L.,
Carboxyl-rich plasma polymer surfaces in surface plasmon resonance immunosensing,
Japanese Journal of Applied Physics 57 (2018) 01AG06

313. Kobayashi E., Boccard M., Jeangros Q., Rodkey N., Vresilovic D., Hessler-Wyser A., Döbeli M., Franta D., De Wolf S., Morales-Masis M., Ballif C.,
Amorphous gallium oxide grown by low-temperature PECVD,
Journal of Vacuum Science and Technology A 36 (2018) 021518

312. Manakhov A., Kiryukhantsev-Korneev P., Michlíček M., Permyakova E., Dvořáková E., Polčák J., Popov Z., Visotin M., Shtansky D.,
Grafting of carboxyl groups using CO2/C2H4/Ar pulsed plasma: Theoretical modeling and XPS derivatization,
Applied Surface Science 435 (2018) 1220-1227

311. Franta D., Franta P., Vohánka J., Čermák M., Ohlídal I.,
Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region,
Journal of Applied Physics 123 (2018) 185707

310. Čermák M., Vohánka J., Ohlídal I., Franta D.,
Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory,
Journal of Modern Optics 65(14) (2018) 1720-1736

309. Ohlídal I., Vohánka J., Mistrík J., Čermák M., Franta D.,
Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers,
Surface and Interface Analysis 50 (2018) 1230-1233

308. Vohánka J., Ohlídal I., Ženíšek J., Vasina P., Čermák M., Franta D.,
Use of the Richardson extrapolation in optics of inhomogeneous layers: application to optical characterization,
Surface and Interface Analysis 50(7) (2018) 757-765

307. Porto C., Palumbo F., Buxadera‐Palomero J., Canal C., Jelínek P., Zajíčková L., Favia P.,
On the plasma deposition of vancomycin‐containing nano‐capsules for drug‐delivery applications,
Plasma Processes and Polymers 15 (2018) e1700232

306. Permyakova E., Polčák J., Slukin P., Ignatov S., Gloushankova N., Zajíčková L., Shtansky D., Manakhov A.,
Antibacterial biocompatible PCL nanofibers modified by COOH-anhydride plasma polymers and gentamicin immobilization,
Materials & Design 153 (2018) 60-70

305. Holovský J., Remeš Z., Poruba A., Franta D., Conrad ., Abelová L., Bušek D.,
Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence,
Review of Scientific Instruments 89 (2018) 063114

304. Manakhov A., Fuková Š., Nečas D., Michlíček M., Ershov S., Eliáš M., Visotin M., Popov Z., Zajíčková L.,
Analysis of epoxy functionalized layers synthesized by plasma polymerization of allyl glycidyl ether,
Physical Chemistry Chemical Physics 20 (2018) 20070-20077

303. Makhneva E., Farka Z., Skládal P., Zajíčková L.,
Cyclopropylamine plasma polymer surfaces for label-free SPR and QCM immunosensing of Salmonella,
Sens. Actuator B-Chem. 276 (2018) 447-455

302. Hegemann D., Indutnyi I., Zajíčková L., Makhneva E., Farka Z., Ushenin Y., Vandenbossche M.,
Stable, nanometer-thick oxygen-containing plasma polymer films suited for enhanced biosensing,
Plasma Processes and Polymers 15 (2018) e1800090

301. Bannov A., Jašek O., Prášek J., Buršík J., Zajíčková L.,
Enhanced Ammonia Adsorption on Directly Deposited Nanofibrous Carbon Films,
Journal of Sensors 2018 (2018) 7497619

2017

300. Ohlídal I., Franta D., Nečas D.,
Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness,
Applied Surface Science 421 (2017) 687-696

299. Vodák J., Nečas D., Pavliňák D., Macák J., Řičica T., Jambor R., Ohlídal M.,
Application of imaging spectroscopic reflectometry for characterization of Au reduction from organometallic compound by means of plasma jet technology,
Applied Surface Science 396 (2017) 284-290

298. Nečas D., Klapetek P.,
Study of user influence in routine SPM data processing,
Measurement Science and Technology 28(3) (2017) 034014

297. Klapetek P., Yacoot A., Grolich P., Valtr M., Nečas D.,
Gwyscan: a library to support non-equidistant Scanning Probe Microscope measurements,
Measurement Science and Technology 28(3) (2017) 034015

296. Manakhov A., Landová M., Medalová J., Michlíček M., Polčák J., Nečas D., Zajíčková L.,
Cyclopropylamine plasma polymers for increased cell adhesion and growth,
Plasma Processes and Polymers 14 (2017) e1600123

295. Franta D., Nečas D., Giglia A., Franta P., Ohlídal I.,
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride,
Applied Surface Science 421 (2017) 424-429

294. Zajíčková L., Jelínek P., Obrusník A., Vodák J., Nečas D.,
Plasma Enhanced CVD of Functional Coatings in Ar/Maleic Anhydride/C2H2 Homogeneous Dielectric Barrier Discharges at Atmospheric Pressure,
Plasma Phys. Control. Fusion 59(3) (2017) 034003

293. Vodák J., Nečas D., Ohlídal M., Ohlídal I.,
Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution,
Measurement Science and Technology 28 (2017) 025205

292. Obrusník A., Jelínek P., Zajíčková L.,
Modelling of the gas flow and plasma co-polymerization of two monomers in an atmospheric-pressure dielectric barrier discharge ,
Surface and Coatings Technology 314 (2017) 139-147

291. Franta D., Kotilainen M., Krumpolec R., Ohlídal I.,
Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry,
Applied Surface Science 421 (2017) 420-423

290. Ondračka P., Holec D., Nečas D., Kedroňová E., Elisabeth S., Goullet A., Zajíčková L.,
Optical properties of TixSi1−xO2 solid solutions,
Physical Review B 95 (2017) 195163

289. Manakhov A., Michlíček M., Felten A., Pireaux J., Nečas D., Zajíčková L.,
XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach,
Applied Surface Science 394 (2017) 578-585

288. Bannov A., Jašek O., Manakhov A., Márik M., Nečas D., Zajíčková L.,
High performance ammonia gas sensors based on plasma treated carbon nanostructures,
IEEE Sensors J. 17(7) (2017) 1964-1970

287. Franta D., Dubroka A., Wang C., Giglia A., Vohánka J., Franta P., Ohlídal I.,
Temperature-dependent dispersion model of float zone crystalline silicon,
Applied Surface Science 421 (2017) 405-419

286. Bannov A., Prášek J., Jašek O., Zajíčková L.,
Investigation of Pristine Graphite Oxide as Room-Temperature Chemiresistive Ammonia Gas Sensing Material,
Sensors 17(2) (2017) 320

285. Ghosal K., Manakhov A., Zajíčková L., Thomas S.,
Structural and Surface Compatibility Study of Modified Electrospun Poly(ε-caprolactone) (PCL) Composites for Skin Tissue Engineering,
AAPS PharmSciTech 18(1) (2017) 72-81

284. Schäfer J., Fricke K., Mika F., Pokorná Z., Zajíčková L., Foest R.,
Liquid assisted plasma enhanced chemical vapour deposition with a non-thermal plasma jet at atmospheric pressure,
Thin Solid Films 630 (2017) 71-78

283. Kotilainen M., Krumpolec R., Franta D., Souček P., Homola T., Cameron D., Vuoristo P.,
Hafnium oxide thin films as a barrier against copper diffusion in solar absorbers,
Solar Energy Materials and Solar Cells 166 (2017) 140-146

282. Franta D., Čermák M., Vohánka J., Ohlídal I.,
Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model,
Thin Solid Films 631 (2017) 12-22

281. Ohlídal I., Vohánka J., Čermák M., Franta D.,
Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory,
Applied Surface Science 419 (2017) 942-956

280. Manakhov A., Kedroňová E., Medalová J., Černochová P., Obrusník A., Michlíček M., Shtansky D., Zajíčková L.,
Carboxyl-anhydride and amine plasma coating of PCL nanofibers to improve their bioactivity,
Materials & Design 132 (2017) 257-265

279. Manakhov A., Čechal J., Michlíček M., Shtansky D.,
Determination of NH2 concentration on 3-aminopropyl tri-ethoxy silane layers and cyclopropylamine plasma polymers by liquid-phase derivatization with 5-iodo 2-furaldehyde,
Applied Surface Science 414 (2017) 390-397

278. Solovieva A., Miroshnichenko S., Kovalski A., Permyakova E., Popov Z., Dvořáková E., Kiryukhantsev-Korneev P., Obrosov A., Polčák J., Zajíčková L., Shtansky D., Manakhov A.,
Immobilization of Platelet-Rich Plasma onto COOH Plasma-Coated PCL Nanofibers Boost Viability and Proliferation of Human Mesenchymal Stem Cells,
Polymers 9(12) (2017) 736

2016

277. Nečas D., Ohlídal I., Franta D., Ohlídal M., Vodák J.,
Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry,
Journal of Optics 18 (2016) 015401

276. Ondračka P., Holec D., Nečas D., Zajíčková L.,
Accurate prediction of band gaps and optical properties of HfO2,
Journal of Physics D 49 (2016) 395301

275. Makhneva E., Manakhov A., Skládal P., Zajíčková L.,
Development of effective QCM biosensors by cyclopropylamine plasma polymerization and antibody immobilization using cross-linking reactions ,
Surface and Coatings Technology 290 (2016) 116-123

274. Manakhov A., Makhneva E., Skládal P., Nečas D., Čechal J., Kalina L., Eliáš M., Zajíčková L.,
The robust bio-immobilization based on pulsed plasma polymerization of cyclopropylamine and glutaraldehyde coupling chemistry,
Applied Surface Science 360(Part A) (2016) 28-36

273. Hegemann D., Michlíček M., Blanchard N., Schuetz U., Lohmann D., Vandenbossche M., Zajíčková L., Drábik M.,
Deposition of Functional Plasma Polymers Influenced by Reactor Geometry in Capacitively Coupled Discharges,
Plasma Processes and Polymers 13 (2016) 279–286

272. Manakhov A., Michlíček M., Nečas D., Polčák J., Makhneva E., Eliáš M., Zajíčková L.,
Carboxyl-rich coatings deposited by atmospheric plasma co-polymerization of maleic anhydride and acetylene,
Surface and Coatings Technology 295 (2016) 37-45

271. Voráč J., Potočňáková L., Synek P., Hnilica J., Kudrle V.,
Gas mixing enhanced by power modulations in atmospheric pressure microwave plasma jet,
Plasma Sources Science and Technology 25(2) (2016) 025018

270. Schäfer J., Hnilica J., Šperka J., Quade A., Kudrle V., Foest R., Vodák J., Zajíčková L.,
Tetrakis(trimethylsilyloxy)silane for nanostructured SiO2-like films deposited by PECVD at atmospheric pressure,
Surface and Coatings Technology 295 (2016) 112-118

269. Štrbková L., Manakhov A., Zajíčková L., Stoica A., Veselý P., Chmelík R.,
The adhesion of normal human dermal fibroblasts to the cyclopropylamine plasma polymers studied by holographic microscopy,
Surface and Coatings Technology 295 (2016) 70-77

268. Siefke T., Kroker S., Pfeiffer K., Puffky O., Dietrich K., Franta D., Ohlídal I., Szeghalmi A., Kley E., Tünnermann A.,
Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range,
Advanced Optical Materials 4 (2016) 1780-1786

267. Obrusník A., Synek P., Hübner S., van der Mullen J., Zajíčková L., Nijdam S.,
Coherent and incoherent Thomson scattering on an argon/hydrogen microwave plasma torch with transient behaviour,
Plasma Sources Science and Technology 25(5) (2016) 055018

266. Arjunan K., Obrusník A., Jones B., Zajíčková L., Ptasinska S.,
Effect of Additive Oxygen on the Reactive Species Profile and Microbicidal Property of a Helium Atmospheric Pressure Plasma Jet,
Plasma Processes and Polymers 13 (2016) 1089-1105

265. Sobota A., Guaitella O., Sretenović G., Krstić I., Kovačević V., Obrusník A., Nguyen Y., Zajíčková L., Obradovic B., Kuraica M.,
Electric field measurements in a kHz-driven He jet—the influence of the gas flow speed,
Plasma Sources Science and Technology 25(6) (2016) 065026

2015

264. Obrusník A., Bonaventura Z.,
Studying a low-pressure microwave coaxial discharge in hydrogen using a mixed 2D/3D model,
Journal of Physics D 48 (2015) 065201

263. Synek P., Obrusník A., Zajíčková L., Hübner S., Nijdam S.,
On the interplay of gas dynamics and the electromagnetic field in an atmospheric Ar/H₂ microwave plasma torch,
Plasma Sources Science and Technology 24 (2015) 025030

262. Manakhov A., Nečas D., Čechal J., Pavliňák D., Eliáš M., Zajíčková L.,
Deposition of stable amine coating onto polycaprolactone nanofibers by low pressure cyclopropylamine plasma polymerization,
Thin Solid Films 581 (2015) 7-13

261. Nečas D., Vodák J., Ohlídal I., Ohlídal M., Majumdar A., Zajíčková L.,
Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry,
Applied Surface Science 350 (2015) 149-155

260. Pekárek J., Vrba R., Prášek J., Jašek O., Majzlíková P., Pekárková J., Zajíčková L.,
MEMS Carbon Nanotubes Field Emission Pressure Sensor With Simplified Design: Performance and Field Emission Properties Study,
IEEE Sensors J. 15(3) (2015) 1430-1436

259. Majzlíková P., Sedláček J., Prášek J., Pekárek J., Svatoš V., Bannov A., Jašek O., Synek P., Eliáš M., Zajíčková L., Hubálek J.,
Sensing Properties of Multiwalled Carbon Nanotubes Grown in MW Plasma Torch: Electronic and Electrochemical Behavior, Gas Sensing, Field Emission, IR Absorption,
Sensors 15(2) (2015) 2644-2661

258. Eliáš M., Kloc P., Jašek O., Mazánková V., Trunec D., Hrdý R., Zajíčková L.,
Atmospheric pressure barrier discharge at high temperature: Diagnostics and carbon nanotubes deposition,
Journal of Applied Physics 117(10) (2015) 103301

257. Muresan M., Charvátová-Campbell A., Ondračka P., Buršíková V., Peřina V., Polcar T., Reuter S., Hammer M., Valtr M., Zajíčková L.,
Protective double-layer coatings prepared by plasma enhanced chemical vapor deposition on tool steel,
Surface and Coatings Technology 272 (2015) 229-238

256. Stoica A., Manakhov A., Polčák J., Ondračka P., Buršíková V., Zajíčková R., Medalová J., Zajíčková L.,
Cell proliferation on modified DLC thin films prepared by plasma enhanced chemical vapor deposition,
Biointerphases 10 (2015) 029520

255. Kedroňová E., Zajíčková L., Hegemann D., Klíma M., Michlíček M., Manakhov A.,
Plasma Enhanced CVD of Organosilicon Thin Films on Electrospun Polymer Nanofibers,
Plasma Processes and Polymers 12 (2015) 1231–1243

254. Franta D., Nečas D., Ohlídal I.,
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia,
Applied Optics 54 (2015) 9108-9119 (1× cited)

2014

253. Franta D., Nečas D., Zajíčková L., Ohlídal I.,
Broadening of dielectric response and sum rule conservation,
Thin Solid Films 571 (2014) 496-501

252. Nečas D., Ohlídal I., Franta D., Čudek V., Ohlídal M., Vodák J., Sládková L., Zajíčková L., Eliáš M., Vižďa F.,
Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry,
Thin Solid Films 571 (2014) 573-578

251. Klapetek P., Nečas D.,
Independent analysis of mechanical data from atomic force microscopy,
Measurement Science and Technology 25 (2014) 044009

250. Nečas D., Ohlídal I.,
Consolidated series for efficient calculation of the reflection and transmission in rough multilayers,
Optics Express 22(4) (2014) 4499-4515

249. Franta D., Nečas D., Zajíčková L., Ohlídal I.,
Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen,
Thin Solid Films 571 (2014) 490-495

248. Manakhov A., Zajíčková L., Eliáš M., Čechal J., Polčák J., Hnilica J., Bittnerová Š., Nečas D.,
Optimization of Cyclopropylamine Plasma Polymerization Toward Enhanced Layer Stability in Contact with Water,
Plasma Processes and Polymers 11 (2014) 532-544 (1× cited)

247. Ohlídal I., Franta D., Nečas D.,
Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces,
Thin Solid Films 571 (2014) 695-700

246. Synek P., Jašek O., Zajíčková L.,
Study of Microwave Torch Plasmachemical Synthesis of Iron Oxide Nanoparticles Focused on the Analysis of Phase Composition,
Plasma Chem. Plasma Process. 34(2) (2014) 327-341 (1× cited)

245. David B., Pizúrová N., Synek P., Kudrle V., Jašek O., Schneeweiss O.,
epsilon-Fe2O3 nanoparticles synthesized in atmospheric-pressure microwave torch,
Materials Letters 116(AA3WI) (2014) 370-373

244. Voráč J., Obrusník A., Procházka V., Dvořák P., Talába M.,
Spatially resolved measurement of hydroxyl radical (OH) concentration in an argon RF plasma jet by planar laser-induced fluorescence,
Plasma Sources Science and Technology 23(2) (2014) 025011

243. Šperka J., Souček P., Loon J., Dowson A., Schwarz C., Krause J., Butenko Y., Kroesen G., Kudrle V.,
Hypergravity synthesis of graphitic carbon nanomaterial in glide arc plasma,
Materials Research Bulletin 54 (2014) 61-65

242. Schäfer J., Šperka J., Gött G., Zajíčková L., Foest R.,
High-Speed Visualization of Filament Instabilities and Self-Organization Effect in RF Argon Plasma Jet at Atmospheric Pressure,
IEEE Transactions on Plasma Science 42 (2014) 2454-2455

241. Potočňáková L., Šperka J., Zikán P., Loon J., Beckers J., Kudrle V.,
Gliding Arc in Noble Gases Under Normal and Hypergravity Conditions,
IEEE Transactions on Plasma Science 42 (2014) 2724-2725

240. Nečas D., Čudek V., Vodák J., Ohlídal M., Klapetek P., Benedikt J., Rügner K., Zajíčková L.,
Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry,
Measurement Science and Technology 25 (2014) 115201

239. Nečas D., Ohlídal I., Franta D., Ohlídal M., Čudek V., Vodák J.,
Measurement of thickness distribution, optical constants and roughness parameters of rough non-uniform ZnSe thin films,
Applied Optics 53 (2014) 5606-5614

238. Franta D., Nečas D., Zajíčková L., Ohlídal I.,
Dispersion model of two-phonon absorption: application to c-Si,
Optical Materials Express 4 (2014) 1641-1656

237. David B., Schneeweiss O., Pizúrová N., Rek A., Kudrle V., Jašek O.,
Nanocrystalline alpha-Fe Layer Examined by Mossbauer Spectrometry,
Acta Physica Polonica A 126(1) (2014) 94-95

236. Manakhov A., Skládal P., Nečas D., Čechal J., Polčák J., Eliáš M., Zajíčková L.,
Cyclopropylamine plasma polymers deposited onto quartz crystal microbalance for biosensing application,
Physica Status Solidi A 211(12) (2014) 2801-2808

235. Majzlíková P., Prášek J., Eliáš M., Jašek O., Pekárek J., Hubálek J., Zajíčková L.,
Comparison of different modifications of screen-printed working electrodes of electrochemical sensors using carbon nanotubes and plasma treatment,
Physica Status Solidi A 211(12) (2014) 2756–2764

2013

234. Nečas D., Klapetek P.,
One-dimensional autocorrelation and power spectrum density functions of irregular regions,
Ultramicroscopy 124 (2013) 13-19

233. Zajíčková L., Eliáš M., Buršíková V., Studýnková Z., Mazánková V., Michlíček M., Houdková J.,
Low Pressure Plasmachemical Processing of Multi-Walled Carbon Nanotubes for the Production of Polyurethane Composite Films with Improved Mechanical Properties,
Thin Solid Films 538 (2013) 7-15

232. Franta D., Nečas D., Zajíčková L.,
Application of Thomas–Reiche–Kuhn sum rule to construction of advanced dispersion models,
Thin Solid Films 534 (2013) 432-441 (2× cited)

231. Franta D., Nečas D., Zajíčková L., Ohlídal I., Stuchlík J., Chvostová D.,
Application of sum rule to the dispersion model of hydrogenated amorphous silicon,
Thin Solid Films 539 (2013) 233-244 (1× cited)

230. Franta D., Nečas D., Zajíčková L., Ohlídal I., Stuchlík J.,
Advanced modeling for optical characterization of amorphous hydrogenated silicon films,
Thin Solid Films 541 (2013) 12-16

229. Nečas D., Franta D., Ohlídal I., Poruba A., Wostrý P.,
Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films,
Surface and Interface Analysis 45 (2013) 1188-1192

228. Hnilica J., Schaefer J., Foest R., Zajíčková L., Kudrle V.,
PECVD of nanostructured SiO2 in a modulated microwave plasma jet at atmospheric pressure,
Journal of Physics D 46(33) (2013) 335202 (1× cited)

227. Šperka J., Souček P., Loon J., Dowson A., Schwarz C., Krause J., Kroesen G., Kudrle V.,
Hypergravity effects on glide arc plasma,
European Physical Journal D 67(12) (2013) 1-9

2012

226. Nečas D., Klapetek P.,
Gwyddion: an open-source software for SPM data analysis,
Central European Journal of Physics 10(1) (2012) 181-188

225. David B., Schneeweiss O., Santava E., Jašek O.,
Magnetic Properties of gamma-Fe2O3 Nanopowder Synthesized by Atmospheric Microwave Torch Discharge,
Acta Physica Polonica A 122(1) (2012) 9-11

224. David B., Pizúrová N., Schneeweiss O., Santava E., Kudrle V., Jašek O.,
gamma-Fe2O3 Nanopowders Synthesized in Microwave Plasma and Extraordinarily Strong Temperature Influence on Their Mossbauer Spectra,
Journal of Nanoscience and Nanotechnology 12(12) (2012) 9277-9285

223. Mocanu V., Stoica A., Kelar L., Franta D., Buršíková V., Mikšová R., Peřina V.,
Multifunctional transparent protective coatings on polycarbonates prepared using PECVD,
Chemické listy 106 (2012) S1460-S1464

222. Schäfer J., Foest R., Reuter S., Kewitz T., Šperka J., Weltmann D.,
Laser schlieren deflectometry for temperature analysis of filamentary non-thermal atmospheric pressure plasma,
Review of Scientific Instruments 83(10) (2012) 103506

2011

221. Franta D., Nečas D., Zajíčková L., Buršíková V., Cobet C.,
Combination of synchrotron ellipsometry and table-top optical measurements for determination of band structure of DLC films,
Thin Solid Films 519 (2011) 2694-2697 (2× cited)

220. Franta D., Nečas D., Ohlídal I.,
Anisotropy-enhanced depolarization on transparent film/substrate system,
Thin Solid Films 519 (2011) 2637-2640

219. Nečas D., Franta D., Buršíková V., Ohlídal I.,
Ellipsometric characterisation of thin films non-uniform in thickness,
Thin Solid Films 519 (2011) 2715-2717 (1× cited)

218. Ohlídal I., Ohlídal M., Nečas D., Franta D., Buršíková V.,
Optical characterisation of SiO_xC_yH_z thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry,
Thin Solid Films 519 (2011) 2874-2876 (1× cited)

217. Zajíčková L., Franta D., Nečas D., Buršíková V., Muresan M., Peřina V., Cobet C.,
Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture,
Thin Solid Films 519 (2011) 4299-4308 (2× cited)

216. Franta D., Ohlídal I., Nečas D., Vižďa F., Caha O., Hasoň M., Pokorný P.,
Optical characterization of HfO₂ thin films,
Thin Solid Films 519 (2011) 6085-6091 (1× cited)

215. Nečas D., Ohlídal I., Franta D.,
Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films,
Journal of Optics 13(8) (2011) 085705 (2× cited)

214. Ohlídal M., Ohlídal I., Klapetek P., Nečas D., Majumdar A.,
Measurement of the thickness distribution and optical constants of non-uniform thin films ,
Measurement Science and Technology 22(8) (2011) 085104

213. Klapetek P., Nečas D., Campbellová A., Yacoot A., Koenders L.,
Methods for determining and processing 3D errors and uncertainties for AFM data analysis,
Measurement Science and Technology 22(2) (2011) 025501

212. Klapetek P., Valtr M., Nečas D., Salyk O., Dzik P.,
Atomic force microscopy analysis of nanoparticles in non-ideal conditions,
Nanoscale Research Letters 6 (2011) 514

211. Prášek J., Húska D., Jašek O., Zajíčková L., Trnková L., Adam V., Kizek R., Hubálek J.,
Carbon composite micro- and nano-tubes-based electrodes for detection of nucleic acids,
Nanoscale Research Letters 6 (2011) 385 (2× cited)

210. Synek P., Jašek O., Zajíčková L., David B., Kudrle V., Pizúrová N.,
Plasmachemical synthesis of maghemite nanoparticles in atmospheric pressure microwave torch,
Materials Letters 65(6) (2011) 982-984 (4× cited)

209. Sobota J., Grossman J., Buršíková V., Dupak L., Vyskocil J.,
Evaluation of hardness, tribological behaviour and impact load of carbon-based hard composite coatings exposed to the influence of humidity,
Diamond and Related Materials 20(4) (2011) 596-599

208. Vasina P., Souček P., Schmidtova T., Eliáš M., Buršíková V., Jilek M., Jilek J., Schaefer J., Buršík J.,
Depth profile analyses of nc-TiC/a-C:H coating prepared by balanced magnetron sputtering,
Surface and Coatings Technology 205(2) (2011) S53-S56

207. Mikula M., Grancic B., Roch T., Plecenik T., Vavra I., Dobrocka E., Satka A., er e., Buršíková V., Drzik M., Zahoran M., Plecenik A., Kus P.,
The influence of low-energy ion bombardment on the microstructure development and mechanical properties of TiB(x) coatings,
Vacuum 85(9) (2011) 866-870

206. Sopousek J., Buršík J., Zalesak J., Buršíková V., Broz P.,
Interaction of Silver Nanopowder with Copper Substrate,
Science of Sintering 43(1) (2011) 33-38

205. Buršík J., Sopousek J., Buršíková V., Styskalik A., Skoda D.,
Characterization of Sintered Ag Nanopowder Joints using Nanoindentation Tests,
Chemické listy 105(S) (2011) S777-S778

204. Buršíková V., Bláhová O., Karásková M., Zajíčková L., Jašek O., Franta D., Klapetek P., Buršík J.,
Mechanical properties of ultrananocrystalline thin films deposited using dual frequency discharges,
Chemické listy 105(2, SI) (2011) S98-S101

203. Buršíková V., Kučerová Z., Zajíčková L., Jašek O., Kudrle V., Matějková J., Synek P.,
MEASUREMENT OF MECHANICAL PROPERTIES OF COMPOSITE MATERIALS,
Chemické listy 105(2) (2011) S171-S174

2010

202. Franta D., Nečas D., Zajíčková L., Buršíková V., Cobet C.,
Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range,
Diamond and Related Materials 19 (2010) 114–122 (9× cited)

201. Trunec D., Zajíčková L., Buršíková V., Studnička F., Sťahel P., Prysiazhnyi V., Peřina V., Houdková J., Navrátil Z., Franta D.,
Deposition of hard thin films from HMDSO in atmospheric pressure dielectric barrier discharge,
Journal of Physics D 43 (2010) 225403 (7× cited)

200. Zajíčková L., Jašek O., Eliáš M., Synek P., Lazar L., Schneeweiss O., Hanzlíková R.,
Synthesis of carbon nanotubes by plasma- enhanced chemical vapor deposition in an atmospheric-pressure microwave torch,
Pure and Applied Chemistry 82 (2010) 1259–1272 (2× cited)

199. Karásková M., Zajíčková L., Buršíková V., Franta D., Nečas D., Bláhová O., Šperka J.,
Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges,
Surface and Coatings Technology 204 (2010) 1997–2001 (1× cited)

198. Klapetek P., Valtr M., Poruba A., Nečas D., Ohlídal M.,
Rough surface scattering simulations using graphics cards,
Applied Surface Science 256(18) (2010) 5640-5643

197. Jašek O., Synek P., Zajíčková L., Eliáš M., Kudrle V.,
Synthesis of Carbon Nanostructures by Plasma Enhanced Chemical Vapour Deposition at Atmospheric Pressure,
Journal Of Electrical Engineering 61(5) (2010) 311-313 (1× cited)

196. Dvořák P., Vasina P., Buršíková V., Zemlicka R.,
Monitoring of PVD, PECVD and etching plasmas using Fourier components of RF voltage,
Plasma Phys. Control. Fusion 52(12, Part 2) (2010) 124011-124022

195. Campbellová A., Klapetek P., Buršíková V., Valtr M., Buršík J.,
Small-load nanoindentation experiments on metals,
Surface and Interface Analysis 42(6-7, SI) (2010) 766-769

2009

194. Zajíčková L., Synek P., Jašek O., Eliáš M., David B., Buršík J., Pizúrová N., Hanzlíková R., Lazar L.,
Synthesis of Carbon Nanotubes and Iron Oxide Nanoparticles in MW Plasma Torch with Fe(CO)5 in Gas Feed,
Applied Surface Science 255 (2009) 5421–5424 (5× cited)

193. Ohlídal I., Nečas D., Franta D., Buršíková V.,
Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry,
Diamond and Related Materials 18 (2009) 364–367 (5× cited)

192. Ohlídal M., Ohlídal I., Klapetek P., Nečas D., Buršíková V.,
Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films,
Diamond and Related Materials 18 (2009) 384–387

191. Franta D., Nečas D., Zajíčková L., Buršíková V.,
Limitations and possible improvements of DLC dielectric response model based on parameterization of density of states,
Diamond and Related Materials 18 (2009) 413–418 (4× cited)

190. Franta D., Nečas D., Ohlídal I., Hrdlička M., Pavlišta M., Frumar M., Ohlídal M.,
Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films,
Journal of Optoelectronics and Advanced Materials 11 (2009) 1891–1898 (1× cited)

189. Nečas D., Ohlídal I., Franta D.,
The reflectance of non-uniform thin films,
Journal of Optics A: Pure and Applied Optics 11 (2009) 045202 (6× cited)

188. Kučerová Z., Zajíčková L., Buršíková V., Kudrle V., Eliáš M., Jašek O., Synek P., Matějková J., Buršík J.,
Mechanical and Microwave Absorbing Properties of Carbon-Filled Polyurethane,
Micron 40 (2009) 70–73 (7× cited)

187. Zajíčková L., Kučerová Z., Buršíková V., Eliáš M., Houdková J., Synek P., Maršíková H., Jašek O.,
Carbon Nanotubes Functionalized in Oxygen and Water Low Pressure Discharges used as Reinforcement of Polyurethane Composites,
Plasma Processes and Polymers 6 (2009) S864–S869 (1× cited)

186. Kolmacka M., Kadlečíková M., Breza J., Lazist\'an F., Zajíčková L., Eliáš M., Jesenak K., Pastorkova K.,
Wireless temperature measurement in the hot filament CVD reactor for deposition of carbon nanotubes,
Journal Of Electrical Engineering 60(6) (2009) 346-349

185. Hartmanova M., Lomonova E., Kubel F., Schneider J., Buršíková V., Jergel M., Navrátil V., Kundracik F.,
Relationship between effective ionic radii, structure and electro-mechanical properties of zirconia stabilized with rare earth oxides M(2)O(3) (M = Yb, Y, Sm),
Journal of Materials Science 44(1) (2009) 234-243

184. Hazdra P., Komarnitskyy V., Buršíková V.,
Hydrogenation of platinum introduced in silicon by radiation enhanced diffusion,
Materials Science and Engineering B 159-60(466BM) (2009) 342-345

2008

183. Franta D., Zajíčková L., Karásková M., Jašek O., Nečas D., Klapetek P., Valtr M.,
Optical characterization of ultrananocrystalline diamond films,
Diamond and Related Materials 17 (2008) 1278–1282 (11× cited)

182. Franta D., Buršíková V., Nečas D., Zajíčková L.,
Modeling of optical constants of diamond-like carbon,
Diamond and Related Materials 17 (2008) 705–708 (9× cited)

181. Ohlídal I., Nečas D., Buršíková V., Franta D., Ohlídal M.,
Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry,
Diamond and Related Materials 17 (2008) 709–712 (1× cited)

180. Lazar L., Synek P., Karásková M., Eliáš M., Jašek O., Kelar L., Konupčík P., Zajíčková L.,
Comparison of Various Plasmachemical Processes with Respect to the Gas Temperature,
Chemické listy 102 (2008) 1158–1161

179. Valtr M., Klapetek P., Buršíková V., Ohlídal I., Franta D.,
Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge,
Chemické listy 102 (2008) s1529–s1532

178. Ohlídal I., Nečas D.,
Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films,
Journal of Modern Optics 55 (2008) 1077–1099

177. Brzobohatý O., Buršíková V., Nečas D., Valtr M., Trunec D.,
Influence of substrate material on plasma in deposition/sputtering reactor: experiment and computer simulation,
Journal of Physics D 41 (2008) 035213

176. Franta D., Ohlídal I., Nečas D.,
Influence of cross-correlation effects on the optical quantities of rough films,
Optics Express 16 (2008) 7789–7803 (6× cited)

175. Sťahel P., Buršíková V., Buršík J., Čech J., Janča J., Cernak M.,
Hydrophylisation of non-woven polypropylene textiles using atmospheric pressure surface barrier discharge,
Journal of Optoelectronics and Advanced Materials 10(1) (2008) 213-218

174. Šíra M., Trunec D., Sťahel P., Buršíková V., Navrátil Z.,
Surface modification of polycarbonate in homogeneous atmospheric pressure discharge,
Journal of Physics D 41(1) (2008) 015205

173. Hartmanova M., Kubel F., Buršíková V., Lomonova E., Holgado J., Navrátil V., Navrátil K., Kundracik F.,
Phase composition-dependent physical and mechanical properties of YbxZr1-xO2-x/2 solid solutions,
Journal of Physics and Chemistry of Solids 69(4) (2008) 805-814

172. Buršíková V., Sobota J., Fort T., Grossman J., Stoica A., Buršík J., Klapetek P., Peřina V.,
Optimisation of mechanical properties of plasma deposited graded multilayer diamond-like carbon coatings,
Journal of Optoelectronics and Advanced Materials 10(12) (2008) 3229-3232

2007

171. Franta D., Buršíková V., Ohlídal I., Sťahel P., Ohlídal M., Nečas D.,
Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films,
Diamond and Related Materials 16 (2007) 1331–1335 (6× cited)

170. Zajíčková L., Buršíková V., Kučerová Z., Franclová J., Sťahel P., Peřina V., Macková A.,
Organosilicon Thin Films Deposited by Plasma Enhanced CVD: Thermal Changes of Chemical Structure and Mechanical Properties,
Journal of Physics and Chemistry of Solids 68 (2007) 1255–1259 (13× cited)

169. Jašek O., Eliáš M., Zajíčková L., Kučerová Z., Matějková J., Rek A., Buršík J.,
Discussion of Important Factors in Deposition of Carbon Nanotubes by Atmospheric Pressure Microwave Plasma Torch,
Journal of Physics and Chemistry of Solids 68 (2007) 738–743 (6× cited)

168. Klapetek P., Ohlídal I., Buršík J.,
Atomic force microscopy studies of cross-sections of columnar thin films,
Measurement Science and Technology 18 (2007) 528–531

167. Franta D., Nečas D., Zajíčková L.,
Models of dielectric response in disordered solids,
Optics Express 15 (2007) 16230–16244 (30× cited)

166. Zajíčková L., Eliáš M., Jašek O., Kučerová Z., Synek P., Matějková J., Kadlečíková M., Klementová M., Buršík J., Vojačková A.,
Characterization of Carbon Nanotubes Deposited in Microwave Torch at Atmospheric Pressure,
Plasma Processes and Polymers 4 (2007) S245–S249 (7× cited)

165. Zajíčková L., Buršíková V., Franta D., Bousquet A., Granier A., Goullet A., Buršík J.,
Comparative study of films deposited from HMDSO/O₂ in continuous wave and pulsed rf discharges,
Plasma Processes and Polymers 4 (2007) S287–S293 (3× cited)

164. Zajíčková L., Buršíková V., Kučerová Z., Franta D., Dvořák P., Šmíd R., Peřina V., Macková A.,
Deposition of protective coatings in RF organosilicon discharges,
Plasma Sources Science and Technology 16 (2007) S123–S132 (20× cited)

163. Vladoiu R., Lungu C., Mustata I., Buršíková V., Buršík J.,
Characterization by nanoindentation and Scanning Electron Microscopy of the spin valves structures prepared by Thermionic Vacuum Arc (TVA) method,
Journal of Optoelectronics and Advanced Materials 9(4) (2007) 1087-1090

162. Vladoiu R., Ciupina V., Surdu-Bob C., Lungu C., Janik J., Skalny J., Buršíková V., Buršík J., Musa G.,
Properties of the carbon thin films deposited by thermionic vacuum arc,
Journal of Optoelectronics and Advanced Materials 9(4) (2007) 862-866

161. Buršíková V., Rehulka P., Chmelik J., Alberti M., Spalt Z., Janča J., Havel J.,
Laser ablation time-of-flight mass spectrometry (LA-TOF-MS) of "nitrogen doped diamond-like carbon (DLN) nano-layers",
Journal of Physics and Chemistry of Solids 68(5-6, SI) (2007) 701-706

160. Mikula M., Grancic B., Buršíková V., Csuba A., Drzik M., Kavecky S., Plecenik A., Kus P.,
Mechanical properties of superhard TiB2 coatings prepared by DC magnetron sputtering,
Vacuum 82(2) (2007) 278-281

2006

159. Polcar J., Topinka M., Nečas D., Hudec R., Hudcová V., Hroch F., Masetti N., Pizzichini G., Palazzi E.,
Search for correlations between BATSE gamma-ray bursts and supernovae,
Astronomy and Astrophysics 452 (2006) 439–449 (1× cited)

158. Šmíd R., Granier A., Bousquet A., Cartry G., Zajíčková L.,
Study of Magnetic Field Influence on Charged Species in a Low Pressure Helicon Reactor,
Czechoslovak Journal of Physics 56 (2006) B1091–B1096

157. Valtr M., Ohlídal I., Franta D.,
Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry,
Czechoslovak Journal of Physics 56 (2006) B1103–B1109

156. Frgala Z., Jašek O., Karásková M., Zajíčková L., Buršíková V., Franta D., Matějková J., Rek A., Klapetek P., Buršík J.,
Microwave PECVD of nanocrystalline diamond with RF induced bias nucleation,
Czechoslovak Journal of Physics 56 (2006) B1218–B1223 (3× cited)

155. Kučerová Z., Zajíčková L., Jašek O., Eliáš M., Ficek R., Vrba R., Matějka F., Matějková J., Buršík J.,
Carbon Nanotubes Synthesized by Plasma Enhanced CVD: Preparation for Measurements of Their Electrical Properties,
Czechoslovak Journal of Physics 56 (2006) B1244–B1249 (1× cited)

154. Šíra M., Trunec D., Sťahel P., Buršíková V., Franta D.,
Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge,
Czechoslovak Journal of Physics 56 (2006) B1377–B1382

153. Buršíková V., Zajíčková L., Dvořák P., Valtr M., Buršík J., Bláhová O., Peřina V., Janča J.,
Influence of Silicon, Oxygen and Nitrogen Admixtures Upon the Properties of Plasma Deposited Amorphous Diamond-Like Carbon Coatings,
Journal of Advanced Oxidation Technologies 9 (2006) 232–236 (3× cited)

152. Ohlídal I., Franta D., Šiler M., Vižďa F., Frumar M., Jedelský J., Omasta J.,
Comparison of dispersion models in the optical characterization of As–S chalcogenide thin films,
Journal of Non-Crystalline Solids 352 (2006) 5633–5641 (4× cited)

151. Franta D., Ohlídal I.,
Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces,
Journal of Optics A: Pure and Applied Optics 8 (2006) 763–774 (13× cited)

150. Trunec D., Bonaventura Z., Nečas D.,
Solution of time-dependent Boltzmann equation for electrons in non-thermal plasma,
Journal of Physics D 39 (2006) 2544–2552 (1× cited)

149. Jašek O., Eliáš M., Zajíčková L., Kudrle V., Bublan M., Matějková J., Rek A., Buršík J., Kadlečíková M.,
Carbon Nanotubes Synthesis in Microwave Plasma Torch at Atmospheric Pressure,
Materials Science and Engineering C 26 (2006) 1189–1193 (9× cited)

148. Bousquet A., Buršíková V., Goullet A., Djouadi A., Zajíčková L., Granier A.,
Comparison of Structure and Mechanical Properties of SiO2-Like Films Deposited in O-2/HMDSO Pulsed and Continuous Plasmas,
Surface and Coatings Technology 200 (2006) 6517–6521 (14× cited)

147. Klapetek P., Ohlídal I., Buršík J.,
Applications of scanning thermal microscopy in the analysis of the geometry of patterned structures,
Surface and Interface Analysis 38 (2006) 383–387

146. Franta D., Ohlídal I., Klapetek P., Nepustilová R., Bajer S.,
Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy,
Surface and Interface Analysis 38 (2006) 842–846 (1× cited)

145. Vladoiu R., Ciupina V., Lungu C., Buršíková V., Musa G.,
Thermoionic vacuum arc (TVA) deposited tungsten thin film characterization,
Journal of Optoelectronics and Advanced Materials 8(1) (2006) 71-73

144. Buršíková V., Sládek P., Sťahel P., Buršík J.,
Complex study of mechanical properties of a-Si : H and a-SiC : H boron doped films,
Journal of Non-Crystalline Solids 352(9-20) (2006) 1238-1241

143. Buršíková V., Sládek P., Sťahel P., Buršík J.,
Mechanical properties of thin silicon films deposited on glass and plastic substrates studied by depth sensing indentation technique,
Journal of Non-Crystalline Solids 352(9-20) (2006) 1242-1245

142. Sťahel P., Buršíková V., Šíra M., Navrátil Z., Kloc P., Janča J.,
Modification of polymer surfaces using atmospheric pressure barrier discharges,
Journal of Advanced Oxidation Technologies 9(2) (2006) 228-231

141. Kloc P., Sťahel P., Buršíková V., Brablec A., Navrátil Z., Šíra M., Janča J.,
Deposition of teflon-like protective layers in surface discharge at atmospheric pressure,
Czechoslovak Journal of Physics 56(Part 7, B) (2006) B1345-B1350

140. Franclová J., Buršíková V.,
Poole-Frenkel conductivity in SiOxHyCz coatings prepared by PECVD,
Czechoslovak Journal of Physics 56(Part 6, B) (2006) B1146-BA1149

139. Hajkova P., Louda P., Spatenka P., Kolouch A., Spatenka P., Bláhová O., Buršíková V.,
Comparison of evaluating methods of thin films nanohardness,
Czechoslovak Journal of Physics 56(Part 6, B) (2006) B1162-B1168

2005

138. Ohlídal I., Franta D., Klapetek P.,
Combination of optical methods and atomic force microscopy at characterization of thin film systems,
Acta Physica Slovaca 55 (2005) 271–294 (1× cited)

137. Klapetek P., Ohlídal I.,
Applications of the wavelet transform in AFM data analysis,
Acta Physica Slovaca 55 (2005) 295–303

136. Dvořák P., Jánský J., Zajíčková L., Janča J.,
Energy Distribution of Hydrogen Ions in Capacitively Coupled Low Pressure Discharge,
Acta Physica Slovaca 55 (2005) 441–446

135. Antoš R., Ohlídal I., Franta D., Klapetek P., Mistrík J., Yamaguchi T., Višňovský Š.,
Spectroscopic ellipsometry of sinusoidal surface-relief gratings,
Applied Surface Science 244 (2005) 221–224 (2× cited)

134. Antoš R., Ohlídal I., Mistrík J., Murakami K., Yamaguchi T., Pištora J., Horie M., Višňovský Š.,
Spectroscopic ellipsometry on lamellar gratings,
Applied Surface Science 244 (2005) 225–229 (1× cited)

133. Franta D., Ohlídal I., Mistrík J., Yamaguchi T., Hu G., Dai N.,
Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions,
Applied Surface Science 244 (2005) 338–342 (3× cited)

132. Franta D., Negulescu B., Thomas L., Dahoo P., Guyot M., Ohlídal I., Mistrík J., Yamaguchi T.,
Optical properties of NiO thin films prepared by pulsed laser deposition technique,
Applied Surface Science 244 (2005) 426–430 (19× cited)

131. Mistrík J., Yamaguchi T., Franta D., Ohlídal I., Hu G., Dai N.,
Optical properties of slightly rough LaNiO₃ thin films studied by spectroscopic ellipsometry and reflectometry,
Applied Surface Science 244 (2005) 431–434 (10× cited)

130. Mistrík J., Ohlídal I., Antoš R., Aoyama M., Yamaguchi T.,
Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO₂ films,
Applied Surface Science 244 (2005) 51–54 (1× cited)

129. Franta D., Buršíková V., Ohlídal I., Zajíčková L., Sťahel P.,
Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films,
Diamond and Related Materials 14 (2005) 1795–1798 (10× cited)

128. Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Klapetek P., Páleníková K.,
Influence of technological conditions on mechanical stresses inside diamond-like carbon films,
Diamond and Related Materials 14 (2005) 1835–1838 (5× cited)

127. Kučerová Z., Buršíková V., Zajíčková L., Franclová J., Peřina V.,
Thermal Stability of SiOxCyHz Films Prepared by PECVD,
Chemické listy 99 (2005) 465–467

126. Antoš R., Pištora J., Ohlídal I., Postava K., Mistrík J., Yamaguchi T., Višňovský Š., Horie M.,
Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate,
Journal of Applied Physics 97 (2005) 053107

125. Šiler M., Ohlídal I., Franta D., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Optical characterization of double layers containing epitaxial ZnSe and ZnTe films,
Journal of Modern Optics 52 (2005) 583–602 (1× cited)

124. Franta D., Ohlídal I.,
Comparison of effective medium approximation and Rayleigh–Rice theory concerning ellipsometric characterization of rough surfaces,
Optics Communications 248 (2005) 459–467 (31× cited)

123. Zajíčková L., Eliáš M., Jašek O., Kudrle V., Frgala Z., Matějková J., Buršík J., Kadlečíková M.,
Atmospheric Pressure Microwave Torch for Synthesis of Carbon Nanotubes,
Plasma Phys. Control. Fusion 47 (2005) B655–B666 (14× cited)

122. Přikryl R., Čech V., Zajíčková L., Vaněk J., Behzadi S., Jones R.,
Mechanical and Optical Properties of Plasma-Polymerized Vinyltriethoxysilane,
Surface and Coatings Technology 200 (2005) 468–471 (11× cited)

121. Franta D., Ohlídal I., Petrýdes D.,
Optical characterization of TiO₂ thin films by the combined method of spectroscopic ellipsometry and spectroscopic photometry,
Vacuum 80 (2005) 159–162 (12× cited)

120. Klapetek P., Ohlídal I., Montaigne-Ramil A., Bonanni A., Sitter H.,
Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD,
Vacuum 80 (2005) 53–57 (2× cited)

119. Šíra M., Trunec D., Sťahel P., Buršíková V., Navrátil Z., Buršík J.,
Surface modification of polyethylene and polypropylene in atmospheric pressure glow discharge,
Journal of Physics D 38(4) (2005) 621-627

2004

118. Šmíd R., Zajíčková L., Janča J.,
Spatially Resolved Measurements in RF Capacitive Discharges in Argon and Nitrogen,
Czechoslovak Journal of Physics 54 (2004) C592–C598

117. Franclová J., Kučerová Z., Buršíková V., Zajíčková L., Peřina V.,
Structural Changes of Plasma Deposited SiOxCyHz Thin Films Attained by Thermal Annealing,
Czechoslovak Journal of Physics 54 (2004) C847–C852

116. Trunec D., Navrátil Z., Sťahel P., Zajíčková L., Buršíková V.,
Deposition of Thin Organosilicon Polymer Films in Atmospheric Pressure Glow Discharge,
Journal of Physics D 37 (2004) 2112–2120 (65× cited)

115. Klapetek P., Ohlídal I., Navrátil K.,
Atomic force microscopy analysis of statistical roughness of GaAs surfaces originated by thermal oxidation,
Microchimica Acta 147 (2004) 175–180 (5× cited)

114. Franta D., Ohlídal I., Klapetek P., Ohlídal M.,
Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy,
Surface and Interface Analysis 36 (2004) 1203–1206 (3× cited)

113. Franta D., Ohlídal I., Buršíková V., Zajíčková L.,
Optical properties of diamond-like carbon films containing SiO_x studied by the combined method of spectroscopic ellipsometry and spectroscopic reflectometry,
Thin Solid Films 455–456 (2004) 393–398 (20× cited)

112. Franta D., Ohlídal I., Klapetek P., Roca i Cabarrocas P.,
Complete characterization of rough polymorphous silicon films by atomic force microscopy and the combined method of spectroscopic ellipsometry and spectroscopic reflectometry,
Thin Solid Films 455–456 (2004) 399–403 (12× cited)

111. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Optical properties of ZnTe films prepared by molecular beam epitaxy,
Thin Solid Films 468 (2004) 193–202 (11× cited)

110. Klapetek P., Ohlídal I., Bílek J.,
Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces,
Ultramicroscopy 102 (2004) 51–59 (1× cited)

109. Čech J., Sťahel P., Šíra M., Buršíková V., Navrátil Z., Trunec D., Brablec A.,
Thermal stability of coatings prepared in atmospheric pressure glow discharge,
Czechoslovak Journal of Physics 54(Part 5) (2004) C872-C876

108. Brzobohatý O., Buršíková V., Trunec D.,
Mirror effect in PECVD reactor and its explanation via MC-PIC computer simulation,
Czechoslovak Journal of Physics 54(Part 4) (2004) C527-C532

107. Slavíček P., Buršíková V., Brablec A., Kapicka V., Klíma M.,
Deposition of polymer films by rf discharge at atmospheric pressure,
Czechoslovak Journal of Physics 54(Part 4) (2004) C586-C591

106. Navrátil Z., Buršíková V., Sťahel P., Šíra M., Zverina P.,
On the analysis of surface free energy of DLC coatings deposited in low pressure RF discharge,
Czechoslovak Journal of Physics 54(Part 5) (2004) C877-C882

105. Sťahel P., Buršíková V., Šíra M., Navrátil Z., Delgado M., Janča J.,
Deposition of teflon like coatings in surface barrier discharge,
Czechoslovak Journal of Physics 54(Part 5) (2004) C866-C871

104. Šíra M., Sťahel P., Buršíková V., Vohánka J., Trunec D.,
Activation of polyethylene and polypropylene in atmospheric pressure glow discharge,
Czechoslovak Journal of Physics 54(Part 5) (2004) C835-C839

2003

103. Klapetek P., Ohlídal I., Franta D., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Atomic force microscopy characterization of ZnTe epitaxial films,
Acta Physica Slovaca 53 (2003) 223–230 (5× cited)

102. Franta D., Zajíčková L., Buršíková V., Ohlídal I.,
New dispersion model of the optical constants of the DLC films,
Acta Physica Slovaca 53 (2003) 373–384 (13× cited)

101. Zajíčková L., Subedi D., Buršíková V., Veltruská K.,
Study of Argon Plasma Treatment of Polycarbonate Substrate and its Effect on Film Deposition,
Acta Physica Slovaca 53 (2003) 489–504 (11× cited)

100. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Optical constants of ZnTe and ZnSe epitaxial thin films,
Acta Physica Slovaca 53 (2003) 95–104 (2× cited)

99. Franta D., Ohlídal I., Frumar M., Jedelský J.,
Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model,
Applied Surface Science 212–213 (2003) 116–121 (23× cited)

98. Franta D., Ohlídal I., Buršíková V., Zajíčková L.,
Optical properties of diamond-like carbon films containing SiO_x,
Diamond and Related Materials 12 (2003) 1532–1538 (16× cited)

97. Klapetek P., Ohlídal I., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Atomic force microscopy characterization of ZnTe epitaxial thin films,
Japanese Journal of Applied Physics 42 (2003) 4706–4709 (1× cited)

96. Ohlídal M., Ohlídal I., Klapetek P., Jákl M., Čudek V., Eliáš M.,
New method for the complete optical analysis of thin films nonuniform in optical parameters,
Japanese Journal of Applied Physics 42 (2003) 4760–4763 (1× cited)

95. Zajíčková L., Buršíková V., Peřina V., Macková A., Janča J.,
Correlation Between SiOx Content and Properties of DLC : SiOx Films Prepared by PECVD,
Surface and Coatings Technology 174 (2003) 281–285 (22× cited)

94. Zajíčková L., Rudakowski S., Becker H., Meyer D., Valtr M., Wiesemann K.,
Study of Plasma Polymerization from Acetylene in Pulsed RF Discharges,
Thin Solid Films 425 (2003) 72–84 (12× cited)

93. Klapetek P., Ohlídal I.,
Theoretical analysis of the atomic force microscopy characterization of columnar thin films,
Ultramicroscopy 94 (2003) 19–29 (9× cited)

92. Drnovska H., Lapcik L., Buršíková V., Zemek J., Barros-Timmons A.,
Surface properties of polyethylene after low-temperature plasma treatment,
Colloid and Polymer Science 281(11) (2003) 1025-1033

2002

91. Zajíčková L., Dvořák P., Kudrle V., Šmíd R.,
Study of Mode Transition in Low Pressure Capacitive RF Discharges in Nitrogen,
Czechoslovak Journal of Physics 52 (2002) 427–432

90. Franta D., Zajíčková L., Ohlídal I., Janča J., Veltruská K.,
Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry,
Diamond and Related Materials 11 (2002) 105–117 (21× cited)

89. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Influence of overlayers on determination of the optical constants of ZnSe thin films,
Journal of Applied Physics 92 (2002) 1873–1880 (7× cited)

88. Buršíková V., Sládek P., Sťahel P., Zajíčková L.,
Improvement of the Efficiency of the Silicon Solar Cells by Silicon Incorporated Diamond-Like Carbon Antireflective Coatings,
Journal of Non-Crystalline Solids 299 (2002) 1147–1151 (12× cited)

87. Buršíková V., Navrátil V., Zajíčková L., Janča J.,
Temperature Dependence of Mechanical Properties of DLC/Si Protective Coatings Prepared by PECVD,
Materials Science and Engineering A 324 (2002) 251–254 (35× cited)

86. Choukourov A., Pihosh Y., Stelmashuk V., Biederman H., Slavínská D., Kormunda M., Zajíčková L.,
RF Sputtering of Composite SiOx/Plasma Polymer Films and Their Basic Properties,
Surface and Coatings Technology 151 (2002) 214–217 (16× cited)

85. Klapetek P., Ohlídal I., Franta D., Pokorný P.,
Analysis of the boundaries of ZrO₂ and HfO₂ thin films by atomic force microscopy and the combined optical method,
Surface and Interface Analysis 33 (2002) 559–564 (2× cited)

84. Ohlídal M., Ohlídal I., Franta D., Králík T., Jákl M., Eliáš M.,
Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method,
Surface and Interface Analysis 34 (2002) 660–663 (2× cited)

83. Franta D., Ohlídal I., Klapetek P., Pokorný P.,
Characterization of the boundaries of thin films of TiO₂ by atomic force microscopy and optical methods,
Surface and Interface Analysis 34 (2002) 759–762 (11× cited)

82. Buršíková V., Buršík J., Navrátil V., Milicka K.,
Creep behaviour of leaded brass,
Materials Science and Engineering A 324(1-2, SI) (2002) 235-238

81. Buršíková V., Janča J., Sťahel P.,
Enhancement of the material surface properties by plasma deposition of thin films at atmospheric pressure,
Czechoslovak Journal of Physics 52(D) (2002) 866-871

2001

80. Ohlídal I., Franta D., Ohlídal M., Navrátil K.,
Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances,
Applied Optics 40 (2001) 5711–5717 (4× cited)

79. Franta D., Ohlídal I., Frumar M., Jedelský J.,
Optical characterization of chalcogenide thin films,
Applied Surface Science 175–176 (2001) 555–561 (15× cited)

78. Ohlídal I., Franta D., Frumar M., Jedelský J., Navrátil K.,
Complete optical analysis of amorphous As–S chalcogenide thin films by the combined spectrophotometric method,
Journal of Optoelectronics and Advanced Materials 3 (2001) 873–878 (4× cited)

77. Janča J., Zajíčková L., Klíma M., Slavíček P.,
Diagnostics and Application of the High Frequency Plasma Pencil,
Plasma Chem. Plasma Process. 21 (2001) 565–579 (10× cited)

76. Zajíčková L., Buršíková V., Peřina V., Macková A., Subedi D., Janča J.,
Plasma Modification of Polycarbonates,
Surface and Coatings Technology 142 (2001) 449–454 (36× cited)

75. Franta D., Ohlídal I., Klapetek P., Pokorný P., Ohlídal M.,
Analysis of inhomogeneous thin films of ZrO₂ by the combined optical method and atomic force microscopy,
Surface and Interface Analysis 32 (2001) 91–94 (3× cited)

74. Zajíčková L., Veltruská K., Tsud N., Franta D.,
XPS and ellipsometric study of DLC/silicon Interface,
Vacuum 61 (2001) 269–273 (12× cited)

73. Franta D., Zajíčková L., Ohlídal I., Janča J.,
Optical characterization of diamond-like carbon films,
Vacuum 61 (2001) 279–283 (3× cited)

72. Ohlídal I., Franta D., Ohlídal M., Navrátil K.,
Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances,
Vacuum 61 (2001) 285–289

71. Obrusník A.,
Test,
Acta Physica Polonica A 56(567) (2001) 890

2000

70. Franta D., Ohlídal I.,
Analysis of thin films by optical multi-sample methods,
Acta Physica Slovaca 50 (2000) 411–421 (15× cited)

69. Ohlídal I., Franta D.,
Matrix formalism for imperfect thin films,
Acta Physica Slovaca 50 (2000) 489–500 (18× cited)

68. Eliáš M., Zajíčková L., Buršíková V., Janča J.,
Characterization of CNx/SiOy Films Prepared by the Inductively Coupled RF Discharge,
Czechoslovak Journal of Physics 50 (2000) 453–456

67. Eliáš M., Zajíčková L., Buršíková V., Janča J., Lorenc M.,
Deposition of Nanocomposite CNx/SiO2 Films in Inductively Coupled RF Discharge,
Diamond and Related Materials 9 (2000) 552–555 (4× cited)

66. Franta D., Ohlídal I., Klapetek P.,
Analysis of slightly rough thin films by optical methods and AFM,
Mikrochimica Acta 132 (2000) 443–447 (30× cited)

65. Franta D., Ohlídal I.,
Optical characterization of inhomogeneous thin films of ZrO₂ by spectroscopic ellipsometry and spectroscopic reflectometry,
Surface and Interface Analysis 30 (2000) 574–579 (17× cited)

64. Pavelka R., Ohlídal I., Hlávka J., Franta D., Sitter H.,
Optical characterization of thin films with randomly rough boundaries using the photovoltage method,
Thin Solid Films 366 (2000) 43–50

63. Ohlídal I., Franta D.,
Ellipsometry of thin film systems,
Progress in Optics 41 (2000) 181-282 (44× cited)

1999

62. Zajíčková L., Buršíková V., Franta D.,
The influence of substrate emissivity on plasma enhanced CVD of diamond-like carbon films,
Czechoslovak Journal of Physics 49 (1999) 1213–1228 (20× cited)

61. Klíma M., Slavíček P., Zajíčková L., Janča J., Kuzmin S., Sulovský P.,
Plasma-Liquid Technologies for Treatment of Archaeological Artifacts,
Czechoslovak Journal of Physics 49 (1999) 321–328 (4× cited)

60. Ohlídal I., Vižďa F.,
Optical quantities of multilayer systems with correlated randomly rough boundaries,
Journal of Modern Optics 46 (1999) 2043–2062 (1× cited)

59. Ohlídal M., Unčovský M., Ohlídal I., Franta D.,
Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering,
Journal of Modern Optics 46 (1999) 279–293 (2× cited)

58. Janča J., Klíma M., Slavíček P., Zajíčková L.,
HF Plasma Pencil - New Source for Plasma Surface Processing,
Surface and Coatings Technology 116 (1999) 547–551 (17× cited)

57. Ohlídal I., Franta D., Pinčík E., Ohlídal M.,
Complete optical characterization of the SiO₂/Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy,
Surface and Interface Analysis 28 (1999) 240–244 (19× cited)

56. Zajíčková L., Janča J., Peřina V.,
Characterization of Silicon Oxide Thin Films Deposited by Plasma Enhanced Chemical Vapour Deposition from Octamethylcyclotetrasiloxane/Oxygen Feeds,
Thin Solid Films 338 (1999) 49–59 (18× cited)

55. Franta D., Ohlídal I., Munzar D., Hora J., Navrátil K., Manfredotti C., Fizzotti F., Vittone E.,
Complete optical characterization of imperfect hydrogenated amorphous silicon layers by spectroscopic ellipsometry and spectroscopic reflectometry,
Thin Solid Films 343–344 (1999) 295–298 (6× cited)

1998

54. Pavelka R., Hlávka J., Ohlídal I., Sitter H.,
Optical parameter analysis of thin absorbing films measured by the photovoltage method,
Acta Physica Polonica A 94 (1998) 468–472 (1× cited)

53. Franta D., Ohlídal I., Munzar D.,
Parameterisation of the model of dispersion dependences of solid state optical constants,
Acta Physica Slovaca 48 (1998) 451–458 (10× cited)

52. Ohlídal I., Franta D.,
Ellipsometry of Thin Films,
Acta Physica Slovaca 48 (1998) 459–468 (2× cited)

51. Franta D., Ohlídal I.,
Ellipsometric parameters and reflectances of thin films with slightly rough boundaries,
Journal of Modern Optics 45 (1998) 903–934 (53× cited)

50. Ohlídal I., Franta D., Hora J., Navrátil K., Weber J., Janda P.,
Analysis of thin films with slightly rough boundaries,
Mikrochimica Acta 15 (1998) 177–180 (1× cited)

49. Franta D., Ohlídal I.,
Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries,
Optics Communications 147 (1998) 349–358 (4× cited)

48. Zajíčková L., Buršíková V., Janča J.,
Protection Coatings for Polycarbonates Based on PECVD from Organosilicon Feeds,
Vacuum 50 (1998) 19–21 (20× cited)

1996

47. Hlávka J., Ohlídal I., Vižďa F., Sitter H.,
New technique of measurement of optical parameters of thin films,
Thin Solid Films 279 (1996) 209–212 (1× cited)

46. Zajíčková L., Ohlídal I., Janča J.,
Plasma-Enhanced Chemical Vapour Deposition of Thin Films from Tetraethoxysilane and Methanol: Optical Properties and XPS Analyses,
Thin Solid Films 280 (1996) 26–36 (10× cited)

1995

45. Ohlídal I., Vižďa F., Ohlídal M.,
Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries,
Optical Engineering 34 (1995) 1761–1768 (10× cited)

44. Ohlídal M., Ohlídal I., Druckmüller M., Franta D.,
A method of shearing interferometry for determining the statistical quantities of randomly rough surfaces of solids,
Pure and Applied Optics 4 (1995) 599–616

1994

43. Ohlídal I., Navrátil K., Ohlídal M., Druckmüller M.,
Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry,
Applied Optics 33 (1994) 7838–7845 (1× cited)

1993

42. Ohlídal I.,
Approximate formulas for the reflectance, transmittance, and scattering losses of nonabsorbing multilayer systems with randomly rough boundaries,
Journal of the Optical Society of America A 10 (1993) 158–171 (1× cited)

41. Holý V., Kuběna J., Ohlídal I., Lischka K., Plotz W.,
X-ray reflection from rough layered systems,
Physical Review B 47 (1993) 15896–15903 (20× cited)

1992

40. Musilová J., Ohlídal I.,
Influence of defects of thin films on determining their thickness by the method based on white light interference,
Journal of Physics D 25 (1992) 1131–1138

39. Strelec P., Ohlídal I., Schmidt E.,
Colour properties of detuned alternating multilayer systems,
Journal of Physics D 25 (1992) 297–302

38. Holý V., Kuběna J., Ohlídal I., Ploog K.,
The diffuse X-ray scattering in real periodical superlattices,
Superlattices and Microstructures 12 (1992) 25–35

1991

37. Ohlídal I., Líbezný M.,
Ellipsometric analysis of gallium arsenide surfaces,
Surface and Interface Analysis 17 (1991) 171–176 (3× cited)

1990

36. Ohlídal I., Schmidt E., Líbezný M.,
Complete unambiguous optical characterization of double layers consisting of two strongly absorbing thin films by combined reflection and transmission ellipsometry,
Applied Optics 29 (1990) 593–598 (1× cited)

35. Musilová J., Ohlídal I.,
Possibilities and limitations of the film thickness determination method based on white light interference,
Journal of Physics D 23 (1990) 1227–1238

34. Ohlídal I., Líbezný M.,
Immersion ellipsometry of semiconductor surfaces,
Surface and Interface Analysis 16 (1990) 46–53 (2× cited)

33. Ponížil P., Ohlídal I., Janča J.,
Optical properties of diamond-like carbon films,
Thin Solid Films 190 (1990) 65–72

1989

32. Ohlídal I.,
Reflectance of multilayer systems with randomly rough boundaries,
Optics Communications 71 (1989) 323–326

31. Ohlídal I., Schmidt E., Líbezný M., Tvarožek V., Novotný I.,
Ellipsometric analysis of thin NiCr films,
Thin Solid Films 169 (1989) 213–222 (1× cited)

1988

30. Ohlídal I., Lukeš F.,
Analysis of semiconductor surfaces with very thin native oxide layers by combined immersion and multiple angle of incidence ellipsometry,
Applied Surface Science 35 (1988) 259–273 (2× cited)

29. Ohlídal I.,
General Formulae for the Optical Characterization of Single Layers with Spectroscopic Reflectometry,
Journal of Modern Optics 35 (1988) 1373–1381 (1× cited)

28. Ohlídal I.,
Immersion spectroscopic reflectometry of multilayer systems. I. Theory,
Journal of the Optical Society of America A 5 (1988) 459–464

27. Ohlídal I.,
Immersion spectroscopic reflectometry of multilayer systems. II. Experimental results,
Journal of the Optical Society of America A 5 (1988) 465–470

26. Ohlídal I., Navrátil K.,
Simple method of spectroscopic reflectometry for the complete optical analysis of weakly absorbing thin films: Application to silicon films,
Thin Solid Films 156 (1988) 181–189 (1× cited)

25. Ohlídal I.,
Optical analysis of inhomogeneous weakly absorbing thin films by spectroscopic reflectometry: Application to carbon films,
Thin Solid Films 162 (1988) 101–109 (2× cited)

1987

24. Ohlídal I., Navrátil K.,
Complete optical analysis of a non-absorbing thin film on an absorbing substrate by a new method of immersion spectroscopic reflectometry,
Thin Solid Films 148 (1987) 17–27 (1× cited)

1986

23. Paneva A., Ohlídal I.,
Multiple angle of incidence ellipsometric analysis of non-absorbing two-layer and three-layer systems,
Thin Solid Films 145 (1986) 23–37 (1× cited)

1985

22. Ohlídal I., Navrátil K.,
Analysis of the basic statistical properties of randomly rough curved surfaces by shearing interferometry,
Applied Optics 24 (1985) 2690–2695 (1× cited)

21. Ohlídal I.,
Influence of Surface Roughness on Radiation from Parabolic Mirror Collimators with Cylindrical Symmetry in the Fraunhofer Region,
Optica Acta 32 (1985) 27–37

20. Ohlídal I., Navrátil K., Musilová J.,
A new method for the complete optical analysis of weakly absorbing thin films: Application to polycrystalline silicon films,
Thin Solid Films 127 (1985) 191–203

1984

19. Ohlídal I., Lukeš F.,
Optical analysis of absorbing double layers by combined reflection and transmission ellipsometry,
Thin Solid Films 115 (1984) 269–282 (1× cited)

1982

18. Ohlídal I., Navrátil K., Schmidt E.,
Simple Method for the Complete Optical Analysis of Very Thick and Weakly Absorbing Films,
Applied Physics A 29 (1982) 157–162

1981

17. Ohlídal I., Lukeš F.,
Optical analysis of thin gold films by combined reflection and transmission ellipsometry,
Thin Solid Films 85 (1981) 181–190 (1× cited)

1980

16. Ohlídal I.,
Expression for the reflectance of randomly rough surfaces derived with the Fresnel approximation,
Applied Optics 19 (1980) 1804–1811

15. Ohlídal I., Navrátil K.,
Optical analysis of non-absorbing double layers by means of immersion reflectometry I: Liquid immersion method,
Thin Solid Films 67 (1980) 245–251

14. Ohlídal I., Navrátil K.,
Optical analysis of non-absorbing double layers by means of immersion reflectometry II: Solid state immersion method,
Thin Solid Films 71 (1980) 91–102

13. Ohlídal I., Navrátil K.,
Determination of the optical parameters and packing density of non-absorbing columnar thin films by means of immersion reflectometry: Application to LiF thin films,
Thin Solid Films 74 (1980) 51–58 (1× cited)

1979

12. Navrátil K., Ohlídal I., Lukeš F.,
The physical structure of the interface between single-crystal GaAs and its oxide film,
Thin Solid Films 56 (1979) 163–171 (2× cited)

11. Ohlídal I., Navrátil K., Lukeš F.,
The optical analysis of non-absorbing thin films with randomly rough boundaries by means of immersion spectrophotometry,
Thin Solid Films 57 (1979) 179–184

1977

10. Navrátil K., Ohlídal I., Lukeš F.,
A model of oxide film originating at thermal oxidation of GaAs,
Czechoslovak Journal of Physics 27 (1977) 672–681

9. Ohlídal I., Navrátil K.,
Method for determining the refractive index and thickness of a non-absorbing thin film with randomly rough boundaries,
Thin Solid Films 44 (1977) 313–321

1976

8. Ohlídal M., Ohlídal I., Lukeš F.,
Ellipsometric studies of polished silicon surfaces,
Surface Science 55 (1976) 467–476

7. Ohlídal I., Navrátil K.,
Influence of the properties of thin films on the determination of the relative reflectance of a randomly rough surface,
Thin Solid Films 31 (1976) 223–234

1974

6. Ohlídal I., Lukeš F., Navrátil K.,
Rough silicon surfaces studied by optical methods,
Surface Science 45 (1974) 91–116 (5× cited)

1973

5. Ohlídal I., Lukeš F.,
Calculation of the Ellipsometric Parameters Characterizing a Randomly Rough Surface by Means of The Stratton-Chu-Silver Integral,
Optics Communications 7 (1973) 76–79 (1× cited)

1972

4. Ohlídal I., Lukeš F.,
Ellipsometric Parameters of Rough Surfaces and of a System Substrate-Thin Film with Rough Boundaries,
Optica Acta 19 (1972) 817–843 (5× cited)

3. Ohlídal I., Lukeš F.,
Ellipsometric parameters of randomly rough surfaces,
Optics Communications 5(5) (1972) 323-326 (2× cited)

1971

2. Ohlídal I., Navrátil K., Lukeš F.,
Reflection of Light by a System of Nonabsorbing Isotropic Film-Nonabsorbing Isotropic Substrate with Randomly Rough Boundaries,
Journal of the Optical Society of America 61 (1971) 1630–1639 (8× cited)

1. Ohlídal I., Navrátil K., Lukeš F.,
Reflection of light on a system of non-absorbing isotropic film - non-absorbing isotropic substrate with rough boundaries,
Optics Communications 3 (1971) 40–44 (1× cited)

Articles in journals without impact factor

2018

20. Franta D., Vohánka J., Čermák M.,
Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range: in Optical Characterization of Thin Solid Films,
Springer Series in Surface Sciences 64 (2018) 31-82

2017

19. Zajíčková L., Tessier P., Chirita V., Kelires P.,
Preface 2016 EMRS Spring Meeting, Symposium EE: Carbon, or Nitrogen-Containing Nanostructured Thin Films,
Thin Solid Films – Preface 630 (2017) 1

2009

18. Ohlídal M., Ohlídal I., Nečas D., Klapetek P.,
Complete Optical Characterization of Non-Uniform SiOx Thin Films Using Imaging Spectroscopic Reflectometry,
e-Journal of Surface Science and Nanotechnology 7 (2009) 409–412

17. Nečas D., Zajíčková L., Franta D., Sťahel P., Mikulík P., Meduňa M., Valtr M.,
Optical characterization of ultra-thin iron and iron oxide films,
e-Journal of Surface Science and Nanotechnology 7 (2009) 486–490

16. Franta D., Ohlídal I., Buršíková V., Zajíčková L.,
Modeling of dielectric response of Ge_xSb_yTe_z (GST) materials,
Physica Status Solidi C 6 (2009) S59–S62 (2× cited)

2008

15. Nečas D., Peřina V., Franta D., Ohlídal I., Zemek J.,
Optical characterization of non-stoichiometric silicon nitride films,
Physica Status Solidi C 5 (2008) 1320–1323

14. Franta D., Hrdlička M., Nečas D., Frumar M., Ohlídal I., Pavlišta M.,
Optical characterization of phase changing Ge₂Sb₂Te₅ chalcogenide films,
Physica Status Solidi C 5 (2008) 1324–1327 (4× cited)

13. Franta D., Ohlídal I., Nečas D.,
Optical quantities of rough films calculated by Rayleigh-Rice theory,
Physica Status Solidi C 5 (2008) 1395–1398 (2× cited)

12. Ohlídal I., Nečas D., Franta D.,
Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies,
Physica Status Solidi C 5 (2008) 1399–1402

2007

11. Buršíková V., Dvořák P., Zajíčková L., Franta D., Janča J., Buršík J., Sobota J., Klapetek P., Bláhová O., Peřina V.,
Deposition and characterisation of nanostructured silicon-oxide containing diamond-like carbon coatings,
Optoelectronics and Advanced Materials - Rapid Communications 1 (2007) 491–495

10. Valtr M., Klapetek P., Ohlídal I., Franta D.,
UV light enhanced oxidation of a-C:H thin film in air. A study of thickness reduction,
Optoelectronics and Advanced Materials - Rapid Communications 1 (2007) 620–624

2005

9. Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Šiler M.,
Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody,
Jemná mechanika a optika 50 (2005) 72–75

2004

8. Ohlídal I., Franta D., Frumar M., Jedelský J., Omasta J.,
Influence of composition, exposure and thermal annealing on optical properties of As–S chalcogenide thin films,
Chalcogenide Letters 1 (2004) 1–10 (18× cited)

2003

7. Ohlídal I., Klapetek P., Franta D.,
Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe,
Československý časopis pro fyziku 53 (2003) 97–100

2002

6. Klapetek P., Ohlídal I., Franta D.,
Applications of atomic force microscopy for thin film boundary measurements,
Jemná mechanika a optika 47 (2002) 195–199

2001

5. Klapetek P., Ohlídal I., Franta D.,
Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly,
Československý časopis pro fyziku 51 (2001) 16–21

4. Klapetek P., Ohlídal I., Franta D.,
Vliv diskrétní Fourierovy transformace na zpracování AFM dat,
Československý časopis pro fyziku 51 (2001) 49–51

3. Sonnenfeld A., Tun T., Zajíčková L., Kozlov A., Wagner H., Behnke J., Hippler R.,
Deposition Process Based on Organosilicon Precursors in Dielectric Barrier Discharges at Atmospheric Pressure - A Comparison,
Plasmas and Polymers 6 (2001) 237-266

1999

2. Ohlídal I., Franta D., Klapetek P., Vičar M.,
Relationship between AFM and optical measurements at analyzing surface roughness,
Jemná mechanika a optika 44 (1999) 307–311

1998

1. Ohlídal I., Ohlídal M., Franta D., Tykal M., Pražák D., Michálek A.,
Srovnání výsledků měření drsnosti povrchu dosažených vybranými optickými metodami a metodou profilometrickou,
Jemná mechanika a optika 43 (1998) 130–136

Proceedings available from ISI Web of Science

2016

10. Franta D., Nečas D., Ohlídal I., Giglia A.,
Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range,
Photonics Europe 2016: Optical Micro- and Nanometrology VI , Photonics Europe 2016: Optical Micro- and Nanometrology VI, Brussels, Belgium 3 - 7 April 2016 (2016) 989014

2015

9. Ohlídal M., Ohlídal I., Nečas D., Vodák J., Franta D., Nádaský P., Vižďa F.,
Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96280R

8. Franta D., Nečas D., Ohlídal I., Jankuj J.,
Wide spectral range characterization of antireflective coatings and their optimization,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96280F

7. Nečas D., Ohlídal I., Vodák J., Ohlídal M., Franta D.,
Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96280C

6. Franta D., Nečas D., Ohlídal I., Giglia A.,
Dispersion model for optical thin films applicable in wide spectral range,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96281U

2011

5. David B., Pizúrová N., Schneeweiss O., Santava E., Jašek O., Kudrle V.,
alpha-Fe nanopowder synthesised in low-pressure microwave plasma and studied by Mossbauer spectroscopy,
JOINT EUROPEAN MAGNETIC SYMPOSIA (JEMS) (2011) 384

2010

4. Muresan M., Zajíčková L., Buršíková V., Franta D., Nečas D.,
Preparation and Characterization of DLC:N Films,
NANOCON 2010, 2ND INTERNATIONAL CONFERENCE , 2nd NANOCON International Conference, Olomouc, Czech Republic, 12-14 October 2010 (2010) 434-440

3. Schneeweiss O., David B., Jašek O., Zajíčková L., Vondracek M., Zboril R., Maslan M.,
Mossbauer Effect Study of Iron Thin Films on Si/SiO(x) Substrate and Iron Phases at Deposited Carbon Nanotubes,
MOSSBAUER SPECTROSCOPY IN MATERIALS SCIENCE - 2010 (2010) 90-95

2009

2. Zajíčková L., Jašek O., Synek P., Eliáš M., Kudrle V., Kadlečíková M., Breza J., Hanzlíková R.,
SYNTHESIS OF CARBON NANOTUBES IN MW PLASMA TORCH WITH DIFFERENT METHODS OF CATALYST LAYER PREPARATION AND THEIR APPLICATIONS,
NANOCON 2009, CONFERENCE PROCEEDINGS (2009) 149-155

1. Hubálek J., Prášek J., Prášek J., Húska D., Hruška D., Prášek J., Húska D., Adamek M., Jašek O., Adam V., Jašek O., Trnková L., Adam V., Horna A., Trnková L., Kizek R., Horna A., Kizek R.,
Modification of Working Electrode Surface with Carbon Nanotubes as an Electrochemical Sensor for Estimation of Melting Points of DNA,
PROCEEDINGS OF THE EUROSENSORS XXIII CONFERENCE (2009) 1011-1014

Proceedings not available from ISI Web of Science

2014

48. Hnilica J., Kudrle V., Jašek O.,
Electrode-less plasma jet synthesis of core-shell iron/iron oxide nanoparticles,
Frontiers in Material and Life Sciences , Nanocon 2013 (2014) 6

2010

47. Buršíková V., Dvořák P., Zajíčková L., Franta D., Janča J., Buršík J., Bláhová O., Peřina V., Klapetek P.,
Mossbauer Effect Study of Iron Thin Films on Si/SiO(x) Substrate and Iron Phases at Deposited Carbon Nanotubes,
MOSSBAUER SPECTROSCOPY IN MATERIALS SCIENCE - 2010 (2010) 90-95

46. Sládek P., Buršíková V., Sťahel P.,
Structural and defect changes of hydrogenated SiGe films due to annealing up to 600 degrees C,
PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7 NO 3-4 (2010) 820-823

45. Buršík J., Sopousek J., Zalesak J., Buršíková V.,
ANALYTICAL ELECTRON MICROSCOPY OF LEAD-FREE NANOPOWDER SOLDERS,
NANOCON 2010, 2ND INTERNATIONAL CONFERENCE (2010) 336-339

2009

44. Vižďa F., Ohlídal I., Hrubý V.,
Influence of Cross-Correlation of Rough Boundaries on Reflectance of Thin Films on GaAs and Si Substrates,
Physics of Semiconductors , 29th International Conference on Physics of Semiconductors, Rio de Janeiro, Brazil, July 27 - August 1, 2008 (2009) 19-20

43. Ohlídal M., Ohlídal I., Klapetek P., Nečas D.,
PRECISE MEASUREMENT OF THICKNESS DISTRIBUTION OF NONUNIFORM THIN FILMS BY IMAGING SPECTROSCOPIC REFLECTOMETRY,
XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS (2009) 100-105

42. Franta D., Nečas D., Frumar M.,
Modeling of dielectric response of Ge(x)Sb(y)Te(z) (GST) materials,
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 6, SUPPL 1 (2009) S59-S62

2008

41. Buršíková V., Peřina V., Sobota J., Klapetek P., Dvořák P., Buršík J., Franta D.,
Deposition of Nanostructured Diamond-Like Carbon Films in Dual Frequency Capacitive Discharge,
Proceedings of 19th Europhysics Conference on the Atomic and Molecular Physics of Ionized Gases (2008)

40. Zajíčková L., Kučerová Z., Franta D., Buršíková V., Peřina V., Macková A.,
Composition and functional properties of organosilicon plasma polymers from hexamethyldisiloxane and octamethylcyclotetrasiloxane,
Proceedings of Organic/Inorganic Hybrid Materials, MRS (2008) 159-164

2007

39. Kučerová Z., Zajíčková L., Eliáš M., Jašek O., Matějková J., Buršík J.,
Treatment of Catalytic Iron Layer for Carbon Nanotube Growth in Microwave Plasma Torch,
Proceedings of 16th Symposium on Applicaction of Plasma Processes (2007) 209-210

38. Šmíd R., Zajíčková L., Granier A.,
Comparison of Planar and Cylindrical Langmuir Probe Measurements in Low Pressure RF Helicon Reactor,
Proceedings of 16th Symposium on Applicaction of Plasma Processes (2007) 259-260

37. Šíra M., Buršíková V., Franta D., Trunec D.,
Deposition and analysis of thin films produced in atmospheric pressure glow discharge,
Proceedings of XXVIII International Conference on Phenomena in Ionized Gases (2007) 713-716

36. Klapetek P., Buršíková V., Valtr M.,
Scanning probe microscopy analysis of delaminated thin films,
PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY (2007) 576-581

2006

35. Ficek R., Vrba R., Kim B., Goodnick S., Milicic S., Kučerová Z., Zajíčková L., Eliáš M.,
Carbon nanotubes synthesized by plasma enhanced CVD: Preparation for measurements of their electrical properties for application in pressure sensor,
2006 International Symposium on Communications and Information Technologies,Vols 1-3 (2006) 42-45

34. Buršíková V., Ray N., Bláhová O., Jašek O., Frgala Z., Zajíčková L., Franta D., Buršík J., Klapetek P.,
Study of Mechnical Properties of Diamon-like Carbon and Nanocomposite Diamond Coatings Prepared by Several Different Deposition Techniques,
Proceedings of International Workshop on the Application of Nanocrystalline Diamond and Diamond Like Carbon Materials (2006) 27-37

33. Buršíková V., Dvořák P., Zajíčková L., Franta D., Janča J., Buršík J., Bláhová O., Peřina V., Klapetek P.,
Silicon-oxide Containing Diamond-like Carbon Coatings Prepared Using Plasma Enhanced Chemical Vapor Deposition,
Proceedings of International Workshop on the Application of Nanocrystalline Diamond and Diamond Like Carbon Materials (2006) 311-315

32. Franta D., Nečas D., Zajíčková L., Buršíková V.,
Modeling of DLC Optical Properties Based on Parameterization of Density of States,
Proceedings of International Workshop on the Application of Nanocrystalline Diamond and Diamond Like Carbon Materials (2006) 39-50

2005

31. Jašek O., Eliáš M., Bublan M., Kudrle V., Zajíčková L., Matějková J., Rek A., Buršík J.,
Plasma Enhanced CVD of Carbon Nanotubes in Atmospheric Pressure Microwave Torch,
Proceedings of 15th Symposium on Application of Plasma Processes and 3rd EU–Japan Joint Symposium on Plasma Processing (2005) 187-188

30. Kučerová Z., Buršíková V., Peřina V., Franta D., Zajíčková L., Čech J., Franclová J.,
Influence of the Temperature on Properties of Plasma Polymerized Organosilicon Coatings,
Proceedings of 15th Symposium on Application of Plasma Processes and 3rd EU–Japan Joint Symposium on Plasma Processing (2005) 197-198

29. Zajíčková L., Ptasinska S., Cingel M., Matejčík Š.,
Study of Electron Impact Ionization and Electron Attachment to HMDSO,
Proceedings of 15th Symposium on Application of Plasma Processes and 3rd EU–Japan Joint Symposium on Plasma Processing (2005) 263-264

28. Zajíčková L., Wagner N., Cordill M., Heberlein J., Peřina V., Macková A., Gerberich W.,
Thermal Plasma Enhanced Chemical Vapor Deposition of Silicon Nitride Based Hard Coatings,
Proceedings of 15th Symposium on Application of Plasma Processes and 3rd EU–Japan Joint Symposium on Plasma Processing (2005) 265-266

27. Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Klapetek P., Jákl M.,
Optical measurement of mechanical stresses in diamond-like carbon films,
Proceedings of 8-th International Symposium on Laser Metrology, SPIE (2005) 717-728

26. Ohlídal M., Čudek V., Ohlídal I., Klapetek P.,
Optical characterization of non-uniform thin films using imaging spectrophotometry,
Proceedings of Advances in Optical Thin Films II, SPIE (2005) 596329

25. Franta D., Ohlídal I.,
Characterization of optical thin films exhibiting defects,
Proceedings of Advances in Optical Thin Films II, SPIE (2005) 59632H

24. Ohlídal I., Franta D., Klapetek P.,
Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly,
Proceedings of Kvalita a GPS 2005 (2005) 131-139

23. Ohlídal I., Franta D., Klapetek P.,
Ellipsometry in characterization of thin films,
Proceedings of Solar Renewable Energy News (2005) 81-111

22. Wagner N., Cordill M., Zajíčková L., Gerberich W., Heberlein J.,
Thermal plasma chemical vapor deposition of superhard nanostructured Si-C-N coatings,
Thin Films Stresses and Mechanical Properties XI (2005) 69-74

2004

21. Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Šiler M.,
Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O,
Proceedings of Advances in Thin Film Coatings for Optical Applications, SPIE (2004) 139-147 (2× cited)

2003

20. Eliáš M., Janča J., Žíla J., Brožek V.,
Optical Diagnostics of ICP Discharge During Synthesis of Tungsten Carbide,
Proceedings of 14th Symposium on Application of Plasma Processes , 14th Symposium on Application of Plasma Processes (2003) 116-117

19. Zajíčková L., Buršíková V., Deepak P., Veltruská K., Janča J.,
Study of Plasma Treatment of Polycarbonate Substrate and Its Effect on Film Deposition,
Proceedings of 14th Symposium on Application of Plasma Processes , 14th Symposium on Application of Plasma Processes (2003) 136-139

18. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Stifter H.,
Optical characterization of ZnSe thin films,
Proceedings of 19th Congress of the International Commission for Optics: Optics for the Quality of Life, SPIE , 19th Congress of the International Commission for Optics: Optics for the Quality of Life, SPIE (2003) 831-832

17. Ohlídal I., Ohlídal M., Klapetek P., Čudek V., Jákl M.,
Characterization of thin films nonuniform in optical parameters by spectroscopic digital reflectometry,
Proceedings of Wave-Optical Systems Engineering II, SPIE (2003) 260-271

16. Ohlídal I., Ohlídal M., Klapetek P., Čudek V., Jákl M.,
Characterization of thin films non-uniform in optical parameters by spectroscopic digital reflectometry,
WAVE-OPTICAL SYSTEMS ENGINEERING II (2003) 260-271

2001

15. Franta D., Buršíková V., Zajíčková L.,
Optical characterization of DLC:Si films prepared by PECVD,
Proceedings of 13th Symposium on Application of Plasma Processes , 13th Symposium on Application of Plasma Processes (2001) 87-88

14. Klapetek P., Franta D., Ohlídal I.,
Study of Thin Film Defects by Atomic Force Microscopy,
Proceedings of 5th Seminar on Quantitative Microscopy, PTB-Bericht , 5th Seminar on Quantitative Microscopy, PTB-Bericht (2001) 107-117

13. Franta D., Ohlídal I.,
Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation,
Proceedings of 12th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE , 12th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE (2001) 207-212 (1× cited)

2000

12. Ohlídal I., Franta D., Klapetek P.,
Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films,
Proceedings of 4th Seminar on Quantitative Microscopy, PTB-Bericht , 4th Seminar on Quantitative Microscopy, PTB-Bericht (2000) 124-131

1999

11. Ohlídal I., Ohlídal M., Franta D., Tykal M.,
Comparison of optical and non-optical methods for measuring surface roughness,
Proceedings of 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE , 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE (1999) 456–467

10. Franta D., Zajíčková L.,
Characterisation of DLC Films Prepared by PECVD,
Proceedings of 12th Symposium on Application of Plasma Processes , 2th Symposium on Application of Plasma Processes (1999) 158–159

9. Janča J., Klíma M., Slavíček P., Zajíčková L.,
On the hollow electrode HF plasma pencil,
Proceedings of 24th International Conference on Phenomena in Ionized Gases , 24th International Conference on Phenomena in Ionized Gases (1999) 177-178

8. Zajíčková L., Eliáš M., Buršíková V., Janča J., Lorenz M.,
Deposition of CNx films in inductively coupled RF discharge,
Proceedings of 24th International Conference on Phenomena in Ionized Gases , 24th International Conference on Phenomena in Ionized Gases (1999) 41-42

7. Klíma M., Janča J., Slavíček P., Kuzmin S., Vaculík R., Zajíčková L.,
DC, AC and HF plasma pencil - New possibilities for plasma surface and liquid treatment at atmospheric pressure,
Proceedings of 5th International Thermal Plasma Processing Conference , 5th International Thermal Plasma Processing Conference (1999) 487–492

1998

6. Ohlídal I., Ohlídal M., Franta D., Vičar M., Klapetek P.,
Comparison of AFM and optical methods at measuring nanometric surface roughness,
Proceedings of 3th Seminar on Quantitative Microscopy , 3th Seminar on Quantitative Microscopy (1998) 123–129

1997

5. Ohlídal I., Franta D., Rezek B., Ohlídal M.,
Analysis of single layers placed on slightly rough surfaces by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy,
Proceedings of 7th European Conference on Applications of Surface and Interface Analysis , 7th European Conference on Applications of Surface and Interface Analysis (1997) 1051–1054

1996

4. Franta D., Ohlídal I., Hora J., Navrátil K.,
Spektroskopická elipsometrie slabě drsných povrchů,
Proceedings of 12. konference českých a slovenských fyziků , Proceedings of 12. konference českých a slovenských fyziků (1996) 482-485

3. Ohlídal I., Franta D., Hora J.,
Spectroscopic Ellipsometry of Slightly Rough Surfaces Covered by Layers,
Proceedings of 6th European Conference on Applications of Surface and Interface Analysis , 6th European Conference on Applications of Surface and Interface Analysis (1996) 823-826

2. Ohlídal M., Ohlídal I., Franta D., Michálek A.,
Method of shearing interferometry for characterizing non-gaussian randomly rough surfaces,
Proceedings of Specification, Production, and Testing of Optical Components and Systems , Specification, Production, and Testing of Optical Components and Systems (1996) 442–451

1995

1. Ohlídal M., Ohlídal I., Druckmüller M., Franta D.,
Interferometry of Randomly Rough Surfaces,
Proceedings of Photonics '95 , Proceedings of Photonics '95 (1995) 109-111