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Petr Klapetek, Ivan Ohlídal

Applications of the wavelet transform in AFM data analysis

Acta Physica Slovaca 55 (2005) 295–303

In this article the possibilities of the wavelet transform use within atomic force microscopy data processing are presented. Both discrete and continuous wavelet transform is used for different processing and analytical purposes including denoising, AFM scan error detection, background removal and multifractal analysis. It is shown that the use of wavelet transform can be very effective within AFM data analysis, namely for highly irregular data.

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