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Publications of Daniel Franta

Journal articles with impact factor: 2017, 2016, 2015, 2014, 2013, 2012, 2011, 2010, 2009, 2008, 2007, 2006, 2005, 2004, 2003, 2002, 2001, 2000, 1999, 1998, 1995
Journal articles without impact factor: 2009, 2008, 2007, 2005, 2004, 2003, 2002, 2001, 1999, 1998

Conference proceedings available from ISI Web of Science: 2016, 2015, 2010
Conference proceedings not available from ISI Web of Science: 2009, 2008, 2007, 2006, 2005, 2004, 2003, 2001, 2000, 1999, 1998, 1997, 1996, 1995

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Articles in journals with impact factor

2017

98. Ohlídal I., Franta D., Nečas D.,
Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness,
Applied Surface Science 421 (2017) 687-696

97. Franta D., Nečas D., Giglia A., Franta P., Ohlídal I.,
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride,
Applied Surface Science 421 (2017) 424-429

96. Franta D., Kotilainen M., Krumpolec R., Ohlídal I.,
Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry,
Applied Surface Science 421 (2017) 420-423

95. Franta D., Dubroka A., Wang C., Giglia A., Vohánka J., Franta P., Ohlídal I.,
Temperature-dependent dispersion model of float zone crystalline silicon,
Applied Surface Science 421 (2017) 405-419

94. Kotilainen M., Krumpolec R., Franta D., Souček P., Homola T., Cameron D., Vuoristo P.,
Hafnium oxide thin films as a barrier against copper diffusion in solar absorbers,
Solar Energy Materials and Solar Cells 166 (2017) 140-146

93. Franta D., Čermák M., Vohánka J., Ohlídal I.,
Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model,
Thin Solid Films 631 (2017) 12-22

92. Ohlídal I., Vohánka J., Čermák M., Franta D.,
Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory,
Applied Surface Science 419 (2017) 942-956

2016

91. Nečas D., Ohlídal I., Franta D., Ohlídal M., Vodák J.,
Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry,
Journal of Optics 18 (2016) 015401

90. Siefke T., Kroker S., Pfeiffer K., Puffky O., Dietrich K., Franta D., Ohlídal I., Szeghalmi A., Kley E., Tünnermann A.,
Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range,
Advanced Optical Materials 4 (2016) 1780-1786

2015

89. Franta D., Nečas D., Ohlídal I.,
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia,
Applied Optics 54 (2015) 9108-9119 (1× cited)

2014

88. Franta D., Nečas D., Zajíčková L., Ohlídal I.,
Broadening of dielectric response and sum rule conservation,
Thin Solid Films 571 (2014) 496-501

87. Nečas D., Ohlídal I., Franta D., Čudek V., Ohlídal M., Vodák J., Sládková L., Zajíčková L., Eliáš M., Vižďa F.,
Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry,
Thin Solid Films 571 (2014) 573-578

86. Franta D., Nečas D., Zajíčková L., Ohlídal I.,
Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen,
Thin Solid Films 571 (2014) 490-495

85. Ohlídal I., Franta D., Nečas D.,
Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces,
Thin Solid Films 571 (2014) 695-700

84. Nečas D., Ohlídal I., Franta D., Ohlídal M., Čudek V., Vodák J.,
Measurement of thickness distribution, optical constants and roughness parameters of rough non-uniform ZnSe thin films,
Applied Optics 53 (2014) 5606-5614

83. Franta D., Nečas D., Zajíčková L., Ohlídal I.,
Dispersion model of two-phonon absorption: application to c-Si,
Optical Materials Express 4 (2014) 1641-1656

2013

82. Franta D., Nečas D., Zajíčková L.,
Application of Thomas–Reiche–Kuhn sum rule to construction of advanced dispersion models,
Thin Solid Films 534 (2013) 432-441 (2× cited)

81. Franta D., Nečas D., Zajíčková L., Ohlídal I., Stuchlík J., Chvostová D.,
Application of sum rule to the dispersion model of hydrogenated amorphous silicon,
Thin Solid Films 539 (2013) 233-244 (1× cited)

80. Franta D., Nečas D., Zajíčková L., Ohlídal I., Stuchlík J.,
Advanced modeling for optical characterization of amorphous hydrogenated silicon films,
Thin Solid Films 541 (2013) 12-16

79. Nečas D., Franta D., Ohlídal I., Poruba A., Wostrý P.,
Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films,
Surface and Interface Analysis 45 (2013) 1188-1192

2012

78. Mocanu V., Stoica A., Kelar L., Franta D., Buršíková V., Mikšová R., Peřina V.,
Multifunctional transparent protective coatings on polycarbonates prepared using PECVD,
Chemické listy 106 (2012) S1460-S1464

2011

77. Franta D., Nečas D., Zajíčková L., Buršíková V., Cobet C.,
Combination of synchrotron ellipsometry and table-top optical measurements for determination of band structure of DLC films,
Thin Solid Films 519 (2011) 2694-2697 (2× cited)

76. Franta D., Nečas D., Ohlídal I.,
Anisotropy-enhanced depolarization on transparent film/substrate system,
Thin Solid Films 519 (2011) 2637-2640

75. Ohlídal I., Ohlídal M., Nečas D., Franta D., Buršíková V.,
Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry,
Thin Solid Films 519 (2011) 2874-2876 (1× cited)

74. Nečas D., Franta D., Buršíková V., Ohlídal I.,
Ellipsometric characterisation of thin films non-uniform in thickness,
Thin Solid Films 519 (2011) 2715-2717 (1× cited)

73. Zajíčková L., Franta D., Nečas D., Buršíková V., Muresan M., Peřina V., Cobet C.,
Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture,
Thin Solid Films 519 (2011) 4299-4308 (2× cited)

72. Franta D., Ohlídal I., Nečas D., Vižďa F., Caha O., Hasoň M., Pokorný P.,
Optical characterization of HfO2 thin films,
Thin Solid Films 519 (2011) 6085-6091 (1× cited)

71. Nečas D., Ohlídal I., Franta D.,
Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films,
Journal of Optics 13(8) (2011) 085705 (2× cited)

70. Buršíková V., Bláhová O., Karásková M., Zajíčková L., Jašek O., Franta D., Klapetek P., Buršík J.,
Mechanical properties of ultrananocrystalline thin films deposited using dual frequency discharges,
Chemické listy 105(2, SI) (2011) S98-S101

2010

69. Franta D., Nečas D., Zajíčková L., Buršíková V., Cobet C.,
Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range,
Diamond and Related Materials 19 (2010) 114–122 (9× cited)

68. Trunec D., Zajíčková L., Buršíková V., Studnička F., Sťahel P., Prysiazhnyi V., Peřina V., Houdková J., Navrátil Z., Franta D.,
Deposition of hard thin films from HMDSO in atmospheric pressure dielectric barrier discharge,
Journal of Physics D 43 (2010) 225403 (7× cited)

67. Karásková M., Zajíčková L., Buršíková V., Franta D., Nečas D., Bláhová O., Šperka J.,
Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges,
Surface and Coatings Technology 204 (2010) 1997–2001 (1× cited)

2009

66. Ohlídal I., Nečas D., Franta D., Buršíková V.,
Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry,
Diamond and Related Materials 18 (2009) 364–367 (5× cited)

65. Franta D., Nečas D., Zajíčková L., Buršíková V.,
Limitations and possible improvements of DLC dielectric response model based on parameterization of density of states,
Diamond and Related Materials 18 (2009) 413–418 (4× cited)

64. Franta D., Nečas D., Ohlídal I., Hrdlička M., Pavlišta M., Frumar M., Ohlídal M.,
Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films,
Journal of Optoelectronics and Advanced Materials 11 (2009) 1891–1898 (1× cited)

63. Nečas D., Ohlídal I., Franta D.,
The reflectance of non-uniform thin films,
Journal of Optics A: Pure and Applied Optics 11 (2009) 045202 (6× cited)

2008

62. Franta D., Zajíčková L., Karásková M., Jašek O., Nečas D., Klapetek P., Valtr M.,
Optical characterization of ultrananocrystalline diamond films,
Diamond and Related Materials 17 (2008) 1278–1282 (11× cited)

61. Franta D., Buršíková V., Nečas D., Zajíčková L.,
Modeling of optical constants of diamond-like carbon,
Diamond and Related Materials 17 (2008) 705–708 (9× cited)

60. Ohlídal I., Nečas D., Buršíková V., Franta D., Ohlídal M.,
Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry,
Diamond and Related Materials 17 (2008) 709–712 (1× cited)

59. Valtr M., Klapetek P., Buršíková V., Ohlídal I., Franta D.,
Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge,
Chemické listy 102 (2008) s1529–s1532

58. Franta D., Ohlídal I., Nečas D.,
Influence of cross-correlation effects on the optical quantities of rough films,
Optics Express 16 (2008) 7789–7803 (6× cited)

2007

57. Franta D., Buršíková V., Ohlídal I., Sťahel P., Ohlídal M., Nečas D.,
Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films,
Diamond and Related Materials 16 (2007) 1331–1335 (6× cited)

56. Franta D., Nečas D., Zajíčková L.,
Models of dielectric response in disordered solids,
Optics Express 15 (2007) 16230–16244 (30× cited)

55. Zajíčková L., Buršíková V., Franta D., Bousquet A., Granier A., Goullet A., Buršík J.,
Comparative study of films deposited from HMDSO/O2 in continuous wave and pulsed rf discharges,
Plasma Processes and Polymers 4 (2007) S287–S293 (3× cited)

54. Zajíčková L., Buršíková V., Kučerová Z., Franta D., Dvořák P., Šmíd R., Peřina V., Macková A.,
Deposition of protective coatings in RF organosilicon discharges,
Plasma Sources Science and Technology 16 (2007) S123–S132 (20× cited)

2006

53. Valtr M., Ohlídal I., Franta D.,
Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry,
Czechoslovak Journal of Physics 56 (2006) B1103–B1109

52. Frgala Z., Jašek O., Karásková M., Zajíčková L., Buršíková V., Franta D., Matějková J., Rek A., Klapetek P., Buršík J.,
Microwave PECVD of nanocrystalline diamond with RF induced bias nucleation,
Czechoslovak Journal of Physics 56 (2006) B1218–B1223 (3× cited)

51. Šíra M., Trunec D., Sťahel P., Buršíková V., Franta D.,
Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge,
Czechoslovak Journal of Physics 56 (2006) B1377–B1382

50. Ohlídal I., Franta D., Šiler M., Vižďa F., Frumar M., Jedelský J., Omasta J.,
Comparison of dispersion models in the optical characterization of As–S chalcogenide thin films,
Journal of Non-Crystalline Solids 352 (2006) 5633–5641 (4× cited)

49. Franta D., Ohlídal I.,
Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces,
Journal of Optics A: Pure and Applied Optics 8 (2006) 763–774 (13× cited)

48. Franta D., Ohlídal I., Klapetek P., Nepustilová R., Bajer S.,
Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy,
Surface and Interface Analysis 38 (2006) 842–846 (1× cited)

2005

47. Ohlídal I., Franta D., Klapetek P.,
Combination of optical methods and atomic force microscopy at characterization of thin film systems,
Acta Physica Slovaca 55 (2005) 271–294 (1× cited)

46. Antoš R., Ohlídal I., Franta D., Klapetek P., Mistrík J., Yamaguchi T., Višňovský Š.,
Spectroscopic ellipsometry of sinusoidal surface-relief gratings,
Applied Surface Science 244 (2005) 221–224 (2× cited)

45. Franta D., Ohlídal I., Mistrík J., Yamaguchi T., Hu G., Dai N.,
Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions,
Applied Surface Science 244 (2005) 338–342 (3× cited)

44. Franta D., Negulescu B., Thomas L., Dahoo P., Guyot M., Ohlídal I., Mistrík J., Yamaguchi T.,
Optical properties of NiO thin films prepared by pulsed laser deposition technique,
Applied Surface Science 244 (2005) 426–430 (19× cited)

43. Mistrík J., Yamaguchi T., Franta D., Ohlídal I., Hu G., Dai N.,
Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry,
Applied Surface Science 244 (2005) 431–434 (10× cited)

42. Franta D., Buršíková V., Ohlídal I., Zajíčková L., Sťahel P.,
Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films,
Diamond and Related Materials 14 (2005) 1795–1798 (10× cited)

41. Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Klapetek P., Páleníková K.,
Influence of technological conditions on mechanical stresses inside diamond-like carbon films,
Diamond and Related Materials 14 (2005) 1835–1838 (5× cited)

40. Šiler M., Ohlídal I., Franta D., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Optical characterization of double layers containing epitaxial ZnSe and ZnTe films,
Journal of Modern Optics 52 (2005) 583–602 (1× cited)

39. Franta D., Ohlídal I.,
Comparison of effective medium approximation and Rayleigh–Rice theory concerning ellipsometric characterization of rough surfaces,
Optics Communications 248 (2005) 459–467 (31× cited)

38. Franta D., Ohlídal I., Petrýdes D.,
Optical characterization of TiO2 thin films by the combined method of spectroscopic ellipsometry and spectroscopic photometry,
Vacuum 80 (2005) 159–162 (12× cited)

2004

37. Franta D., Ohlídal I., Klapetek P., Ohlídal M.,
Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy,
Surface and Interface Analysis 36 (2004) 1203–1206 (3× cited)

36. Franta D., Ohlídal I., Buršíková V., Zajíčková L.,
Optical properties of diamond-like carbon films containing SiOx studied by the combined method of spectroscopic ellipsometry and spectroscopic reflectometry,
Thin Solid Films 455–456 (2004) 393–398 (20× cited)

35. Franta D., Ohlídal I., Klapetek P., Roca i Cabarrocas P.,
Complete characterization of rough polymorphous silicon films by atomic force microscopy and the combined method of spectroscopic ellipsometry and spectroscopic reflectometry,
Thin Solid Films 455–456 (2004) 399–403 (12× cited)

34. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Optical properties of ZnTe films prepared by molecular beam epitaxy,
Thin Solid Films 468 (2004) 193–202 (11× cited)

2003

33. Klapetek P., Ohlídal I., Franta D., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Atomic force microscopy characterization of ZnTe epitaxial films,
Acta Physica Slovaca 53 (2003) 223–230 (5× cited)

32. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Optical constants of ZnTe and ZnSe epitaxial thin films,
Acta Physica Slovaca 53 (2003) 95–104 (2× cited)

31. Franta D., Ohlídal I., Frumar M., Jedelský J.,
Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model,
Applied Surface Science 212–213 (2003) 116–121 (23× cited)

30. Franta D., Ohlídal I., Buršíková V., Zajíčková L.,
Optical properties of diamond-like carbon films containing SiOx,
Diamond and Related Materials 12 (2003) 1532–1538 (16× cited)

29. Franta D., Zajíčková L., Buršíková V., Ohlídal I.,
New dispersion model of the optical constants of the DLC films,
Acta Physica Slovaca 53 (2003) 373–384 (13× cited)

2002

28. Franta D., Zajíčková L., Ohlídal I., Janča J., Veltruská K.,
Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry,
Diamond and Related Materials 11 (2002) 105–117 (21× cited)

27. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Influence of overlayers on determination of the optical constants of ZnSe thin films,
Journal of Applied Physics 92 (2002) 1873–1880 (7× cited)

26. Klapetek P., Ohlídal I., Franta D., Pokorný P.,
Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method,
Surface and Interface Analysis 33 (2002) 559–564 (2× cited)

25. Ohlídal M., Ohlídal I., Franta D., Králík T., Jákl M., Eliáš M.,
Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method,
Surface and Interface Analysis 34 (2002) 660–663 (2× cited)

24. Franta D., Ohlídal I., Klapetek P., Pokorný P.,
Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods,
Surface and Interface Analysis 34 (2002) 759–762 (11× cited)

2001

23. Ohlídal I., Franta D., Ohlídal M., Navrátil K.,
Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances,
Applied Optics 40 (2001) 5711–5717 (4× cited)

22. Franta D., Ohlídal I., Frumar M., Jedelský J.,
Optical characterization of chalcogenide thin films,
Applied Surface Science 175–176 (2001) 555–561 (15× cited)

21. Ohlídal I., Franta D., Frumar M., Jedelský J., Navrátil K.,
Complete optical analysis of amorphous As–S chalcogenide thin films by the combined spectrophotometric method,
Journal of Optoelectronics and Advanced Materials 3 (2001) 873–878 (4× cited)

20. Franta D., Ohlídal I., Klapetek P., Pokorný P., Ohlídal M.,
Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy,
Surface and Interface Analysis 32 (2001) 91–94 (3× cited)

19. Zajíčková L., Veltruská K., Tsud N., Franta D.,
XPS and ellipsometric study of DLC/silicon Interface,
Vacuum 61 (2001) 269–273 (12× cited)

18. Franta D., Zajíčková L., Ohlídal I., Janča J.,
Optical characterization of diamond-like carbon films,
Vacuum 61 (2001) 279–283 (3× cited)

17. Ohlídal I., Franta D., Ohlídal M., Navrátil K.,
Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances,
Vacuum 61 (2001) 285–289

2000

16. Franta D., Ohlídal I.,
Analysis of thin films by optical multi-sample methods,
Acta Physica Slovaca 50 (2000) 411–421 (15× cited)

15. Ohlídal I., Franta D.,
Matrix formalism for imperfect thin films,
Acta Physica Slovaca 50 (2000) 489–500 (18× cited)

14. Franta D., Ohlídal I., Klapetek P.,
Analysis of slightly rough thin films by optical methods and AFM,
Mikrochimica Acta 132 (2000) 443–447 (30× cited)

13. Franta D., Ohlídal I.,
Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry,
Surface and Interface Analysis 30 (2000) 574–579 (17× cited)

12. Pavelka R., Ohlídal I., Hlávka J., Franta D., Sitter H.,
Optical characterization of thin films with randomly rough boundaries using the photovoltage method,
Thin Solid Films 366 (2000) 43–50

11. Ohlídal I., Franta D.,
Ellipsometry of thin film systems,
Progress in Optics 41 (2000) 181-282 (44× cited)

1999

10. Zajíčková L., Buršíková V., Franta D.,
The influence of substrate emissivity on plasma enhanced CVD of diamond-like carbon films,
Czechoslovak Journal of Physics 49 (1999) 1213–1228 (20× cited)

9. Ohlídal M., Unčovský M., Ohlídal I., Franta D.,
Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering,
Journal of Modern Optics 46 (1999) 279–293 (2× cited)

8. Ohlídal I., Franta D., Pinčík E., Ohlídal M.,
Complete optical characterization of the SiO2/Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy,
Surface and Interface Analysis 28 (1999) 240–244 (19× cited)

7. Franta D., Ohlídal I., Munzar D., Hora J., Navrátil K., Manfredotti C., Fizzotti F., Vittone E.,
Complete optical characterization of imperfect hydrogenated amorphous silicon layers by spectroscopic ellipsometry and spectroscopic reflectometry,
Thin Solid Films 343–344 (1999) 295–298 (6× cited)

1998

6. Franta D., Ohlídal I., Munzar D.,
Parameterisation of the model of dispersion dependences of solid state optical constants,
Acta Physica Slovaca 48 (1998) 451–458 (10× cited)

5. Ohlídal I., Franta D.,
Ellipsometry of Thin Films,
Acta Physica Slovaca 48 (1998) 459–468 (2× cited)

4. Franta D., Ohlídal I.,
Ellipsometric parameters and reflectances of thin films with slightly rough boundaries,
Journal of Modern Optics 45 (1998) 903–934 (53× cited)

3. Ohlídal I., Franta D., Hora J., Navrátil K., Weber J., Janda P.,
Analysis of thin films with slightly rough boundaries,
Mikrochimica Acta 15 (1998) 177–180 (1× cited)

2. Franta D., Ohlídal I.,
Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries,
Optics Communications 147 (1998) 349–358 (4× cited)

1995

1. Ohlídal M., Ohlídal I., Druckmüller M., Franta D.,
A method of shearing interferometry for determining the statistical quantities of randomly rough surfaces of solids,
Pure and Applied Optics 4 (1995) 599–616

Articles in journals without impact factor

2009

16. Nečas D., Zajíčková L., Franta D., Sťahel P., Mikulík P., Meduňa M., Valtr M.,
Optical characterization of ultra-thin iron and iron oxide films,
e-Journal of Surface Science and Nanotechnology 7 (2009) 486–490

15. Franta D., Ohlídal I., Buršíková V., Zajíčková L.,
Modeling of dielectric response of GexSbyTez (GST) materials,
Physica Status Solidi C 6 (2009) S59–S62 (2× cited)

2008

14. Nečas D., Peřina V., Franta D., Ohlídal I., Zemek J.,
Optical characterization of non-stoichiometric silicon nitride films,
Physica Status Solidi C 5 (2008) 1320–1323

13. Franta D., Hrdlička M., Nečas D., Frumar M., Ohlídal I., Pavlišta M.,
Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films,
Physica Status Solidi C 5 (2008) 1324–1327 (4× cited)

12. Franta D., Ohlídal I., Nečas D.,
Optical quantities of rough films calculated by Rayleigh-Rice theory,
Physica Status Solidi C 5 (2008) 1395–1398 (2× cited)

11. Ohlídal I., Nečas D., Franta D.,
Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies,
Physica Status Solidi C 5 (2008) 1399–1402

2007

10. Buršíková V., Dvořák P., Zajíčková L., Franta D., Janča J., Buršík J., Sobota J., Klapetek P., Bláhová O., Peřina V.,
Deposition and characterisation of nanostructured silicon-oxide containing diamond-like carbon coatings,
Optoelectronics and Advanced Materials - Rapid Communications 1 (2007) 491–495

9. Valtr M., Klapetek P., Ohlídal I., Franta D.,
UV light enhanced oxidation of a-C:H thin film in air. A study of thickness reduction,
Optoelectronics and Advanced Materials - Rapid Communications 1 (2007) 620–624

2005

8. Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Šiler M.,
Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody,
Jemná mechanika a optika 50 (2005) 72–75

2004

7. Ohlídal I., Franta D., Frumar M., Jedelský J., Omasta J.,
Influence of composition, exposure and thermal annealing on optical properties of As–S chalcogenide thin films,
Chalcogenide Letters 1 (2004) 1–10 (18× cited)

2003

6. Ohlídal I., Klapetek P., Franta D.,
Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe,
Československý časopis pro fyziku 53 (2003) 97–100

2002

5. Klapetek P., Ohlídal I., Franta D.,
Applications of atomic force microscopy for thin film boundary measurements,
Jemná mechanika a optika 47 (2002) 195–199

2001

4. Klapetek P., Ohlídal I., Franta D.,
Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly,
Československý časopis pro fyziku 51 (2001) 16–21

3. Klapetek P., Ohlídal I., Franta D.,
Vliv diskrétní Fourierovy transformace na zpracování AFM dat,
Československý časopis pro fyziku 51 (2001) 49–51

1999

2. Ohlídal I., Franta D., Klapetek P., Vičar M.,
Relationship between AFM and optical measurements at analyzing surface roughness,
Jemná mechanika a optika 44 (1999) 307–311

1998

1. Ohlídal I., Ohlídal M., Franta D., Tykal M., Pražák D., Michálek A.,
Srovnání výsledků měření drsnosti povrchu dosažených vybranými optickými metodami a metodou profilometrickou,
Jemná mechanika a optika 43 (1998) 130–136

Proceedings available from ISI Web of Science

2016

6. Franta D., Nečas D., Ohlídal I., Giglia A.,
Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range,
Photonics Europe 2016: Optical Micro- and Nanometrology VI , Photonics Europe 2016: Optical Micro- and Nanometrology VI, Brussels, Belgium 3 - 7 April 2016 (2016) 989014

2015

5. Franta D., Nečas D., Ohlídal I., Giglia A.,
Dispersion model for optical thin films applicable in wide spectral range,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96281U

4. Ohlídal M., Ohlídal I., Nečas D., Vodák J., Franta D., Nádaský P., Vižďa F.,
Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96280R

3. Franta D., Nečas D., Ohlídal I., Jankuj J.,
Wide spectral range characterization of antireflective coatings and their optimization,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96280F

2. Nečas D., Ohlídal I., Vodák J., Ohlídal M., Franta D.,
Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96280C

2010

1. Muresan M., Zajíčková L., Buršíková V., Franta D., Nečas D.,
Preparation and Characterization of DLC:N Films,
NANOCON 2010, 2ND INTERNATIONAL CONFERENCE , 2nd NANOCON International Conference, Olomouc, Czech Republic, 12-14 October 2010 (2010) 434-440

Proceedings not available from ISI Web of Science

27. Buršíková V., Dvořák P., Zajíčková L., Franta D., Janča J., Buršík J., Bláhová O., Peřina V., Klapetek P.,
Mossbauer Effect Study of Iron Thin Films on Si/SiO(x) Substrate and Iron Phases at Deposited Carbon Nanotubes,
MOSSBAUER SPECTROSCOPY IN MATERIALS SCIENCE - 2010 (2010) 90-95

2009

26. Franta D., Nečas D., Frumar M.,
Modeling of dielectric response of Ge(x)Sb(y)Te(z) (GST) materials,
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 6, SUPPL 1 (2009) S59-S62

2008

25. Buršíková V., Peřina V., Sobota J., Klapetek P., Dvořák P., Buršík J., Franta D.,
Deposition of Nanostructured Diamond-Like Carbon Films in Dual Frequency Capacitive Discharge,
Proceedings of 19th Europhysics Conference on the Atomic and Molecular Physics of Ionized Gases (2008)

24. Zajíčková L., Kučerová Z., Franta D., Buršíková V., Peřina V., Macková A.,
Composition and functional properties of organosilicon plasma polymers from hexamethyldisiloxane and octamethylcyclotetrasiloxane,
Proceedings of Organic/Inorganic Hybrid Materials, MRS (2008) 159-164

2007

23. Šíra M., Buršíková V., Franta D., Trunec D.,
Deposition and analysis of thin films produced in atmospheric pressure glow discharge,
Proceedings of XXVIII International Conference on Phenomena in Ionized Gases (2007) 713-716

2006

22. Buršíková V., Ray N., Bláhová O., Jašek O., Frgala Z., Zajíčková L., Franta D., Buršík J., Klapetek P.,
Study of Mechnical Properties of Diamon-like Carbon and Nanocomposite Diamond Coatings Prepared by Several Different Deposition Techniques,
Proceedings of International Workshop on the Application of Nanocrystalline Diamond and Diamond Like Carbon Materials (2006) 27-37

21. Buršíková V., Dvořák P., Zajíčková L., Franta D., Janča J., Buršík J., Bláhová O., Peřina V., Klapetek P.,
Silicon-oxide Containing Diamond-like Carbon Coatings Prepared Using Plasma Enhanced Chemical Vapor Deposition,
Proceedings of International Workshop on the Application of Nanocrystalline Diamond and Diamond Like Carbon Materials (2006) 311-315

20. Franta D., Nečas D., Zajíčková L., Buršíková V.,
Modeling of DLC Optical Properties Based on Parameterization of Density of States,
Proceedings of International Workshop on the Application of Nanocrystalline Diamond and Diamond Like Carbon Materials (2006) 39-50

2005

19. Kučerová Z., Buršíková V., Peřina V., Franta D., Zajíčková L., Čech J., Franclová J.,
Influence of the Temperature on Properties of Plasma Polymerized Organosilicon Coatings,
Proceedings of 15th Symposium on Application of Plasma Processes and 3rd EU–Japan Joint Symposium on Plasma Processing (2005) 197-198

18. Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Klapetek P., Jákl M.,
Optical measurement of mechanical stresses in diamond-like carbon films,
Proceedings of 8-th International Symposium on Laser Metrology, SPIE (2005) 717-728

17. Franta D., Ohlídal I.,
Characterization of optical thin films exhibiting defects,
Proceedings of Advances in Optical Thin Films II, SPIE (2005) 59632H

16. Ohlídal I., Franta D., Klapetek P.,
Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly,
Proceedings of Kvalita a GPS 2005 (2005) 131-139

15. Ohlídal I., Franta D., Klapetek P.,
Ellipsometry in characterization of thin films,
Proceedings of Solar Renewable Energy News (2005) 81-111

2004

14. Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Šiler M.,
Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O,
Proceedings of Advances in Thin Film Coatings for Optical Applications, SPIE (2004) 139-147 (2× cited)

2003

13. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Stifter H.,
Optical characterization of ZnSe thin films,
Proceedings of 19th Congress of the International Commission for Optics: Optics for the Quality of Life, SPIE , 19th Congress of the International Commission for Optics: Optics for the Quality of Life, SPIE (2003) 831-832

2001

12. Franta D., Ohlídal I.,
Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation,
Proceedings of 12th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE , 12th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE (2001) 207-212 (1× cited)

11. Franta D., Buršíková V., Zajíčková L.,
Optical characterization of DLC:Si films prepared by PECVD,
Proceedings of 13th Symposium on Application of Plasma Processes , 13th Symposium on Application of Plasma Processes (2001) 87-88

10. Klapetek P., Franta D., Ohlídal I.,
Study of Thin Film Defects by Atomic Force Microscopy,
Proceedings of 5th Seminar on Quantitative Microscopy, PTB-Bericht , 5th Seminar on Quantitative Microscopy, PTB-Bericht (2001) 107-117

2000

9. Ohlídal I., Franta D., Klapetek P.,
Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films,
Proceedings of 4th Seminar on Quantitative Microscopy, PTB-Bericht , 4th Seminar on Quantitative Microscopy, PTB-Bericht (2000) 124-131

1999

8. Ohlídal I., Ohlídal M., Franta D., Tykal M.,
Comparison of optical and non-optical methods for measuring surface roughness,
Proceedings of 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE , 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE (1999) 456–467

7. Franta D., Zajíčková L.,
Characterisation of DLC Films Prepared by PECVD,
Proceedings of 12th Symposium on Application of Plasma Processes , 2th Symposium on Application of Plasma Processes (1999) 158–159

1998

6. Ohlídal I., Ohlídal M., Franta D., Vičar M., Klapetek P.,
Comparison of AFM and optical methods at measuring nanometric surface roughness,
Proceedings of 3th Seminar on Quantitative Microscopy , 3th Seminar on Quantitative Microscopy (1998) 123–129

1997

5. Ohlídal I., Franta D., Rezek B., Ohlídal M.,
Analysis of single layers placed on slightly rough surfaces by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy,
Proceedings of 7th European Conference on Applications of Surface and Interface Analysis , 7th European Conference on Applications of Surface and Interface Analysis (1997) 1051–1054

1996

4. Franta D., Ohlídal I., Hora J., Navrátil K.,
Spektroskopická elipsometrie slabě drsných povrchů,
Proceedings of 12. konference českých a slovenských fyziků , Proceedings of 12. konference českých a slovenských fyziků (1996) 482-485

3. Ohlídal I., Franta D., Hora J.,
Spectroscopic Ellipsometry of Slightly Rough Surfaces Covered by Layers,
Proceedings of 6th European Conference on Applications of Surface and Interface Analysis , 6th European Conference on Applications of Surface and Interface Analysis (1996) 823-826

2. Ohlídal M., Ohlídal I., Franta D., Michálek A.,
Method of shearing interferometry for characterizing non-gaussian randomly rough surfaces,
Proceedings of Specification, Production, and Testing of Optical Components and Systems , Specification, Production, and Testing of Optical Components and Systems (1996) 442–451

1995

1. Ohlídal M., Ohlídal I., Druckmüller M., Franta D.,
Interferometry of Randomly Rough Surfaces,
Proceedings of Photonics '95 , Proceedings of Photonics '95 (1995) 109-111