Ivan Ohlídal, Karel Navrátil, Eduard Schmidt
Simple Method for the Complete Optical Analysis of Very Thick and Weakly Absorbing Films
Applied Physics A 29 (1982) 157–162
In this paper a method for the determination of the thickness and spectral dependences of the optical constants characterizing very thick and weakly absorbing thin films located on nonabsorbing substrate is presented. Within the framework of this method the positions and values of the extrema in the spectral dependences of the reflectance and transmittance are utilized for evaluation the values of the optical parameters mentioned above. The main advantage of the method is that the values of the optical parameters can be determined by means of explicite formulae with relatively high accuracy. The method is utilized for the complete optical analysis of magnetic garnet films.
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