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Daniel Franta, Ivan Ohlídal, Petr Klapetek, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter

Optical constants of ZnTe and ZnSe epitaxial thin films

Acta Physica Slovaca 53 (2003) 95–104

In this paper the spectral dependences of the optical constants, i.e. refractive index and extinction coefficient, are presented within the spectral region 220–850 nm. For determining these spectral dependences a multi-sample modification of the combined optical method based on a simultaneous interpretation of experimental data corresponding to variable angle spectro-scopic ellipsometry and near-normal spectroscopic reflectometry is used. Further, physical models and an iterative procedure enabling us to determine the spectral dependences of the optical constants of both the epitaxial films are described in detail. The spectral dependences of the optical constants are introduced in the forms of curves and tables.

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You can also contact one of the authors: franta@physics.muni.cz, ohlidal@physics.muni.cz

Citing Articles

  1. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
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  2. Šiler M., Ohlídal I., Franta D., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
    Optical characterization of double layers containing epitaxial ZnSe and ZnTe films,
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Cited Articles

  1. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
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    Journal of Applied Physics 92 (2002) 1873–1880
  2. Franta D., Zajíčková L., Ohlídal I., Janča J., Veltruská K.,
    Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry,
    Diamond and Related Materials 11 (2002) 105–117
  3. Franta D., Zajíčková L., Ohlídal I., Janča J.,
    Optical characterization of diamond-like carbon films,
    Vacuum 61 (2001) 279–283
  4. Franta D., Ohlídal I.,
    Analysis of thin films by optical multi-sample methods,
    Acta Physica Slovaca 50 (2000) 411–421
  5. Ohlídal I., Franta D.,
    Ellipsometry of thin film systems,
    Progress in Optics 41 (2000) 181-282
  6. Ohlídal I., Franta D.,
    Matrix formalism for imperfect thin films,
    Acta Physica Slovaca 50 (2000) 489–500
  7. Franta D., Ohlídal I.,
    Ellipsometric parameters and reflectances of thin films with slightly rough boundaries,
    Journal of Modern Optics 45 (1998) 903–934
  8. Ohlídal I., Navrátil K., Lukeš F.,
    Reflection of Light by a System of Nonabsorbing Isotropic Film-Nonabsorbing Isotropic Substrate with Randomly Rough Boundaries,
    Journal of the Optical Society of America 61 (1971) 1630–1639
  9. Franta D., Ohlídal I.,
    Proc: Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation,
    Proceedings of 12th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE, 12th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE (2001) 207-212