Daniel Franta, Ivan Ohlídal, Petr Klapetek, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter
Optical properties of ZnTe films prepared by molecular beam epitaxy
Thin Solid Films 468 (2004) 193–202
In this paper the optical properties of ZnTe epitaxial thin films prepared by molecular beam epitaxy onto GaAs single crystal substrates are studied using the combined optical method employing a simultaneous interpretation of experimental data obtained by means of variable angle spectroscopic ellipsometry and near-normal incidence spectroscopic reflectometry. The spectral dependences of both the optical constants, i.e. the refractive index and extinction coefficient, characterizing these films are presented within the spectral region 230–850 nm. It is shown that the optical properties of the ZnTe epitaxial films depend on the values of their thickness. This conclusion was found using the model of the optical constants exhibiting a profile across these films. A roughness of the upper boundaries of the ZnTe films and the existence of a very thin native oxide layer on these boundaries are taken into account within the optical analysis.
You can also contact one of the authors: franta@physics.muni.cz, ohlidal@physics.muni.cz
Citing Articles
- Ohlídal I., Franta D., Klapetek P.,
Combination of optical methods and atomic force microscopy at characterization of thin film systems,
Acta Physica Slovaca 55 (2005) 271–294 - Franta D., Ohlídal I.,
Comparison of effective medium approximation and Rayleigh–Rice theory concerning ellipsometric characterization of rough surfaces,
Optics Communications 248 (2005) 459–467 - Šiler M., Ohlídal I., Franta D., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Optical characterization of double layers containing epitaxial ZnSe and ZnTe films,
Journal of Modern Optics 52 (2005) 583–602 - Heo P., Ichino R., Okido M.,
ZnTe electrodeposition from organic solvents,
Electrochimica Acta 51 (2006) 6325–6330 - Kotlyarchuk B., Savchuk V.,
Investigation of ZnTe thin films grown by Pulsed Laser Deposition method,
Physica Status Solidi B 244 (2007) 1714–1719 - Ohlídal I., Nečas D., Franta D.,
Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies,
Physica Status Solidi C 5 (2008) 1399–1402 - Ahmed F., Naciri A. E., Grob J. J., Stchakovsky M., Johann L.,
Dielectric function of ZnTe nanocrystals by spectroscopic ellipsometry,
Nanotechnology 20 (2009) 305702 - Xu S., Wang C., Cui Y.,
Influence of ligand and solvent on characters of ZnTe clusters,
Journal of Molecular Structure 938 (2009) 133–136 - Gandhi T., Raja K. S., Misra M.,
Synthesis of ZnTe nanowires onto TiO2 nanotubular arrays by pulse-reverse electrodeposition,
Thin Solid Films 517 (2009) 4527–4533 - Mahalingam T., Dhanasekaran V., Sundaram K., Kathalingam A., Rhee J.-K.,
Characterization of electroplated ZnTe Coatings,
Ionics 18 (2012) 299-306 - Diso D. G., Fauzi F., Echendu O. K., Weerasinghe A. R., Dharmadasa I. M.,
Proc: Electrodeposition and characterisation of ZnTe layers for application in CdTe based multi-layer graded bandgap solar cells,
Condensed Matter and Materials Physics Conference (CMMP10), 14–16 December 2010, University of Warwick, UK (2011) 012040
Cited Articles
-
Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Optical constants of ZnTe and ZnSe epitaxial thin films,
Acta Physica Slovaca 53 (2003) 95–104 -
Franta D., Ohlídal I., Klapetek P., Pokorný P.,
Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods,
Surface and Interface Analysis 34 (2002) 759–762 -
Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Influence of overlayers on determination of the optical constants of ZnSe thin films,
Journal of Applied Physics 92 (2002) 1873–1880 -
Franta D., Ohlídal I., Frumar M., Jedelský J.,
Optical characterization of chalcogenide thin films,
Applied Surface Science 175–176 (2001) 555–561 -
Ohlídal I., Franta D.,
Ellipsometry of thin film systems,
Progress in Optics 41 (2000) 181-282 -
Ohlídal I., Franta D.,
Matrix formalism for imperfect thin films,
Acta Physica Slovaca 50 (2000) 489–500 -
Franta D., Ohlídal I., Klapetek P.,
Analysis of slightly rough thin films by optical methods and AFM,
Mikrochimica Acta 132 (2000) 443–447 -
Franta D., Ohlídal I.,
Analysis of thin films by optical multi-sample methods,
Acta Physica Slovaca 50 (2000) 411–421 -
Franta D., Ohlídal I.,
Ellipsometric parameters and reflectances of thin films with slightly rough boundaries,
Journal of Modern Optics 45 (1998) 903–934 -
Ohlídal I., Navrátil K., Lukeš F.,
Reflection of Light by a System of Nonabsorbing Isotropic Film-Nonabsorbing Isotropic Substrate with Randomly Rough Boundaries,
Journal of the Optical Society of America 61 (1971) 1630–1639