Ivan Ohlídal, Karel Navrátil, František Lukeš
The optical analysis of non-absorbing thin films with randomly rough boundaries by means of immersion spectrophotometry
Thin Solid Films 57 (1979) 179–184
A method is described which represents a modification of immersion spectrophotometry applied to the measurement of reflectance at normal incidence. The method enables the determination of all the parameters which characterize a non-absorbing thin film with randomly rough boundaries optically. The experimental results demonstrate its usefulness.
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