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Publications of Jiří Vohánka

Journal articles with impact factor: 2021, 2020, 2019, 2018, 2017, 2004
Journal articles without impact factor: 2018

Conference proceedings available from ISI Web of Science:
Conference proceedings not available from ISI Web of Science:

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Articles in journals with impact factor

2021

24. Franta D., Vohánka J.,
Constitutive equations describing optical activity in theory of dispersion,
Journal of the Optical Society of America B 38 (2021) 553-561

23. Ohlídal I., Vohánka J., Čermák M.,
Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization,
Coatings 11(22) (2021) 31

2020

22. Ohlídal I., Vohánka J., Buršíková V., Franta D., Čermák M.,
Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers,
Optics Express 28 (2020) 160-174

21. Vohánka J., Franta D., Čermák M., Homola V., Buršíková V., Ohlídal I.,
Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials,
Optics Express 28 (2020) 5492-5506

20. Čermák M., Vohánka J., Franta D., Ohlídal I.,
Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh–Rice theory and Yeh matrix formalism,
Physica Scripta 95 (2020) 095503

19. Vohánka J., Šustek Š., Buršíková V., Šklíbová V., Šulc V., Homola V., Franta D., Čermák M., Ohlídal M., Ohlídal I.,
Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry,
Applied Surface Science 534 (2020) 147625

18. Ohlídal I., Vohánka J., Buršíková V., Šulc V., Šustek Š., Ohlídal M.,
Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films,
Optics Express 28 (2020) 36796-36811

2019

17. Franta D., Vohánka J., Čermák M., Franta P., Ohlídal I.,
Temperature dependent dispersion models applicable in solid state physics,
Journal Of Electrical Engineering 70 (2019) 1-15

16. Ohlídal I., Vohánka J., Franta D., Čermák M., Ženíšek J., Vasina P.,
Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films,
Journal Of Electrical Engineering 70 (2019) 16-26

15. Vohánka J., Čermák M., Franta D., Ohlídal I.,
Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh–Rice theory,
Physica Scripta 94 (2019) 045502

14. Vohánka J., Ohlídal I., Ohlídal M., Šustek Š., Čermák M., Šulc V., Vasina P., Ženíšek J., Franta D.,
Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects,
Coatings 9(7) (2019) 416

13. Franta D., Vohánka J., Bránecký M., Franta P., Čermák M., Ohlídal I., Čech V.,
Optical Properties of the Crystalline Silicon Wafers Described Using the Universal Dispersion Model,
Journal of Vacuum Science & Technology B 37 (2019) 062907

12. Vohánka J., Nečas D., Franta D.,
Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions,
Journal of Vacuum Science & Technology B 37 (2019) 062909

11. Ohlídal I., Vohánka J., Čermák M., Franta D.,
Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers,
Surface Topography: Metrology and Properties 7(4) (2019) 045004

10. Ohlídal I., Vohánka J., Buršíková V., Ženíšek J., Vasina P., Čermák M., Franta D.,
Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model,
Journal of Vacuum Science & Technology B 37(6) (2019) 062921

9. Ohlídal I., Vohánka J., Mistrík J., Čermák M., Vižďa F., Franta D.,
Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model,
Thin Solid Films 692 (2019) 137189

2018

8. Franta D., Franta P., Vohánka J., Čermák M., Ohlídal I.,
Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region,
Journal of Applied Physics 123 (2018) 185707

7. Čermák M., Vohánka J., Ohlídal I., Franta D.,
Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory,
Journal of Modern Optics 65(14) (2018) 1720-1736

6. Ohlídal I., Vohánka J., Mistrík J., Čermák M., Franta D.,
Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers,
Surface and Interface Analysis 50 (2018) 1230-1233

5. Vohánka J., Ohlídal I., Ženíšek J., Vasina P., Čermák M., Franta D.,
Use of the Richardson extrapolation in optics of inhomogeneous layers: application to optical characterization,
Surface and Interface Analysis 50(7) (2018) 757-765

2017

4. Franta D., Dubroka A., Wang C., Giglia A., Vohánka J., Franta P., Ohlídal I.,
Temperature-dependent dispersion model of float zone crystalline silicon,
Applied Surface Science 421 (2017) 405-419

3. Franta D., Čermák M., Vohánka J., Ohlídal I.,
Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model,
Thin Solid Films 631 (2017) 12-22

2. Ohlídal I., Vohánka J., Čermák M., Franta D.,
Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory,
Applied Surface Science 419 (2017) 942-956

2004

1. Šíra M., Sťahel P., Buršíková V., Vohánka J., Trunec D.,
Activation of polyethylene and polypropylene in atmospheric pressure glow discharge,
Czechoslovak Journal of Physics 54(Part 5) (2004) C835-C839

Articles in journals without impact factor

2018

1. Franta D., Vohánka J., Čermák M.,
Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range: in Optical Characterization of Thin Solid Films,
Springer Series in Surface Sciences 64 (2018) 31-82