Roman Antoš, Ivan Ohlídal, Jan Mistrík, K. Murakami, Tomuo Yamaguchi, Jaromír Pištora, M. Horie, Štefan Višňovský
Spectroscopic ellipsometry on lamellar gratings
Applied Surface Science 244 (2005) 225–229
Deep lamellar diffraction gratings fabricated by etching a transparent quartz plate are studied using spectroscopic ellipsometry. The rigorous coupled-wave analysis is used to calculate the optical response of the gratings. Three parameters of the rectangular profile are determined by utilizing the least-square method. Detailed investigation of the spectral dependences demonstrates the uniqueness of the solution. Observing the spectral dependences of Wood anomalies suggests that even complicated profiles can be fitted with high authenticity.
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