Ivan Ohlídal, Karel Navrátil
Optical analysis of non-absorbing double layers by means of immersion reflectometry I: Liquid immersion method
Thin Solid Films 67 (1980) 245–251
A non-destructive method is described for the determination of all the optical parameters which characterize a non-absorbing double layer on a non-absorbing substrate by measuring the reflectance at normal incidence in various immersion ambients.
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