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Ivan Ohlídal, Karel Navrátil

Optical analysis of non-absorbing double layers by means of immersion reflectometry I: Liquid immersion method

Thin Solid Films 67 (1980) 245–251

A non-destructive method is described for the determination of all the optical parameters which characterize a non-absorbing double layer on a non-absorbing substrate by measuring the reflectance at normal incidence in various immersion ambients.

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