Daniel Franta, Ivan Ohlídal, Dominik Munzar
Parameterisation of the model of dispersion dependences of solid state optical constants
Acta Physica Slovaca 48 (1998) 451–458
In this paper the new model of dispersion of the optical constants of the amorphous solids is presented. This model adds to the Lorentz model of the classical oscillator the quantum-mechanical concept of the gap. Moreover, this model respects the existence of the tail in absorption of the amorphous material. It is necessary to point out that this new model is acceptable from all the point of physics. It can be employed for solving the inversion problem within the fields of both optics of thin films and optics of solids. The results obtained for a thin film of hydrogenated amorphous silicon using our new model are introduced as well.
You can also contact one of the authors: franta@physics.muni.cz, ohlidal@physics.muni.cz
Citing Articles
- Franta D., Ohlídal I., Munzar D., Hora J., Navrátil K., Manfredotti C., Fizzotti F., Vittone E.,
Complete optical characterization of imperfect hydrogenated amorphous silicon layers by spectroscopic ellipsometry and spectroscopic reflectometry,
Thin Solid Films 343–344 (1999) 295–298 - Ohlídal I., Franta D., Pinčík E., Ohlídal M.,
Complete optical characterization of the SiO2/Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy,
Surface and Interface Analysis 28 (1999) 240–244 - Franta D., Ohlídal I.,
Analysis of thin films by optical multi-sample methods,
Acta Physica Slovaca 50 (2000) 411–421 - Ohlídal I., Franta D., Frumar M., Jedelský J., Navrátil K.,
Complete optical analysis of amorphous As–S chalcogenide thin films by the combined spectrophotometric method,
Journal of Optoelectronics and Advanced Materials 3 (2001) 873–878 - Franta D., Ohlídal I., Frumar M., Jedelský J.,
Optical characterization of chalcogenide thin films,
Applied Surface Science 175–176 (2001) 555–561 - Franta D., Zajíčková L., Ohlídal I., Janča J., Veltruská K.,
Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry,
Diamond and Related Materials 11 (2002) 105–117 - Bianchi R.F., Balogh D.T., Tinani M., Faria R.M., Irene E.A.,
Ellipsometry study of the photo-oxidation of poly[(2-methoxy–5-hexyloxy)-p-phenylenevinylene],
Journal of Polymer Science B 42 (2004) 1033–1041 - Franta D., Ohlídal I.,
Comparison of effective medium approximation and Rayleigh–Rice theory concerning ellipsometric characterization of rough surfaces,
Optics Communications 248 (2005) 459–467 - Franta D., Čermák M., Vohánka J., Ohlídal I.,
Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model,
Thin Solid Films 631 (2017) 12-22 - Foldyna M, Postava K, Bouchala J, Pistora J, Yamaguchi T,
Proc: Model dielectric function of amorphous materials including Urbach tail,
MICROWAVE AND OPTICAL TECHNOLOGY 2003, 9th International Symposim on Microwave and Optical Technology (ISMOT 2003) (2003) 301-305