Publications of David Nečas
Journal articles with impact factor: 2017, 2016, 2015, 2014, 2013, 2012, 2011, 2010, 2009, 2008, 2007, 2006
Journal articles without impact factor: 2009, 2008
Conference proceedings available from ISI Web of Science: 2016, 2015, 2010
Conference proceedings not available from ISI Web of Science: 2009, 2006
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Articles in journals with impact factor
2017
63. Ohlídal I., Franta D., Nečas D.,Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness,
Applied Surface Science 421 (2017) 687-696
62. Vodák J., Nečas D., Pavliňák D., Macák J., Řičica T., Jambor R., Ohlídal M.,
Application of imaging spectroscopic reflectometry for characterization of Au reduction from organometallic compound by means of plasma jet technology,
Applied Surface Science 396 (2017) 284-290
61. Nečas D., Klapetek P.,
Study of user influence in routine SPM data processing,
Measurement Science and Technology 28(3) (2017) 034014
60. Klapetek P., Yacoot A., Grolich P., Valtr M., Nečas D.,
Gwyscan: a library to support non-equidistant Scanning Probe Microscope measurements,
Measurement Science and Technology 28(3) (2017) 034015
59. Manakhov A., Landová M., Medalová J., Michlíček M., Polčák J., Nečas D., Zajíčková L.,
Cyclopropylamine plasma polymers for increased cell adhesion and growth,
Plasma Processes and Polymers 14 (2017) e1600123
58. Franta D., Nečas D., Giglia A., Franta P., Ohlídal I.,
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride,
Applied Surface Science 421 (2017) 424-429
57. Zajíčková L., Jelínek P., Obrusník A., Vodák J., Nečas D.,
Plasma Enhanced CVD of Functional Coatings in Ar/Maleic Anhydride/C2H2 Homogeneous Dielectric Barrier Discharges at Atmospheric Pressure,
Plasma Phys. Control. Fusion 59(3) (2017) 034003
56. Vodák J., Nečas D., Ohlídal M., Ohlídal I.,
Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution,
Measurement Science and Technology 28 (2017) 025205
55. Ondračka P., Holec D., Nečas D., Kedroňová E., Elisabeth S., Goullet A., Zajíčková L.,
Optical properties of TixSi1−xO2 solid solutions,
Physical Review B 95 (2017) 195163
54. Manakhov A., Michlíček M., Felten A., Pireaux J., Nečas D., Zajíčková L.,
XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach,
Applied Surface Science 394 (2017) 578-585
53. Bannov A., Jašek O., Manakhov A., Márik M., Nečas D., Zajíčková L.,
High performance ammonia gas sensors based on plasma treated carbon nanostructures,
IEEE Sensors J. 17(7) (2017) 1964-1970
2016
52. Nečas D., Ohlídal I., Franta D., Ohlídal M., Vodák J.,Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry,
Journal of Optics 18 (2016) 015401
51. Ondračka P., Holec D., Nečas D., Zajíčková L.,
Accurate prediction of band gaps and optical properties of HfO2,
Journal of Physics D 49 (2016) 395301
50. Manakhov A., Makhneva E., Skládal P., Nečas D., Čechal J., Kalina L., Eliáš M., Zajíčková L.,
The robust bio-immobilization based on pulsed plasma polymerization of cyclopropylamine and glutaraldehyde coupling chemistry,
Applied Surface Science 360(Part A) (2016) 28-36
49. Manakhov A., Michlíček M., Nečas D., Polčák J., Makhneva E., Eliáš M., Zajíčková L.,
Carboxyl-rich coatings deposited by atmospheric plasma co-polymerization of maleic anhydride and acetylene,
Surface and Coatings Technology 295 (2016) 37-45
2015
48. Manakhov A., Nečas D., Čechal J., Pavliňák D., Eliáš M., Zajíčková L.,Deposition of stable amine coating onto polycaprolactone nanofibers by low pressure cyclopropylamine plasma polymerization,
Thin Solid Films 581 (2015) 7-13
47. Nečas D., Vodák J., Ohlídal I., Ohlídal M., Majumdar A., Zajíčková L.,
Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry,
Applied Surface Science 350 (2015) 149-155
46. Franta D., Nečas D., Ohlídal I.,
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia,
Applied Optics 54 (2015) 9108-9119 (1× cited)
2014
45. Franta D., Nečas D., Zajíčková L., Ohlídal I.,Broadening of dielectric response and sum rule conservation,
Thin Solid Films 571 (2014) 496-501
44. Nečas D., Ohlídal I., Franta D., Čudek V., Ohlídal M., Vodák J., Sládková L., Zajíčková L., Eliáš M., Vižďa F.,
Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry,
Thin Solid Films 571 (2014) 573-578
43. Klapetek P., Nečas D.,
Independent analysis of mechanical data from atomic force microscopy,
Measurement Science and Technology 25 (2014) 044009
42. Nečas D., Ohlídal I.,
Consolidated series for efficient calculation of the reflection and transmission in rough multilayers,
Optics Express 22(4) (2014) 4499-4515
41. Franta D., Nečas D., Zajíčková L., Ohlídal I.,
Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen,
Thin Solid Films 571 (2014) 490-495
40. Manakhov A., Zajíčková L., Eliáš M., Čechal J., Polčák J., Hnilica J., Bittnerová Š., Nečas D.,
Optimization of Cyclopropylamine Plasma Polymerization Toward Enhanced Layer Stability in Contact with Water,
Plasma Processes and Polymers 11 (2014) 532-544 (1× cited)
39. Ohlídal I., Franta D., Nečas D.,
Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces,
Thin Solid Films 571 (2014) 695-700
38. Nečas D., Čudek V., Vodák J., Ohlídal M., Klapetek P., Benedikt J., Rügner K., Zajíčková L.,
Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry,
Measurement Science and Technology 25 (2014) 115201
37. Nečas D., Ohlídal I., Franta D., Ohlídal M., Čudek V., Vodák J.,
Measurement of thickness distribution, optical constants and roughness parameters of rough non-uniform ZnSe thin films,
Applied Optics 53 (2014) 5606-5614
36. Franta D., Nečas D., Zajíčková L., Ohlídal I.,
Dispersion model of two-phonon absorption: application to c-Si,
Optical Materials Express 4 (2014) 1641-1656
35. Manakhov A., Skládal P., Nečas D., Čechal J., Polčák J., Eliáš M., Zajíčková L.,
Cyclopropylamine plasma polymers deposited onto quartz crystal microbalance for biosensing application,
Physica Status Solidi A 211(12) (2014) 2801-2808
2013
34. Nečas D., Klapetek P.,One-dimensional autocorrelation and power spectrum density functions of irregular regions,
Ultramicroscopy 124 (2013) 13-19
33. Franta D., Nečas D., Zajíčková L.,
Application of Thomas–Reiche–Kuhn sum rule to construction of advanced dispersion models,
Thin Solid Films 534 (2013) 432-441 (2× cited)
32. Franta D., Nečas D., Zajíčková L., Ohlídal I., Stuchlík J., Chvostová D.,
Application of sum rule to the dispersion model of hydrogenated amorphous silicon,
Thin Solid Films 539 (2013) 233-244 (1× cited)
31. Franta D., Nečas D., Zajíčková L., Ohlídal I., Stuchlík J.,
Advanced modeling for optical characterization of amorphous hydrogenated silicon films,
Thin Solid Films 541 (2013) 12-16
30. Nečas D., Franta D., Ohlídal I., Poruba A., Wostrý P.,
Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films,
Surface and Interface Analysis 45 (2013) 1188-1192
2012
29. Nečas D., Klapetek P.,Gwyddion: an open-source software for SPM data analysis,
Central European Journal of Physics 10(1) (2012) 181-188
2011
28. Franta D., Nečas D., Zajíčková L., Buršíková V., Cobet C.,Combination of synchrotron ellipsometry and table-top optical measurements for determination of band structure of DLC films,
Thin Solid Films 519 (2011) 2694-2697 (2× cited)
27. Franta D., Nečas D., Ohlídal I.,
Anisotropy-enhanced depolarization on transparent film/substrate system,
Thin Solid Films 519 (2011) 2637-2640
26. Ohlídal I., Ohlídal M., Nečas D., Franta D., Buršíková V.,
Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry,
Thin Solid Films 519 (2011) 2874-2876 (1× cited)
25. Nečas D., Franta D., Buršíková V., Ohlídal I.,
Ellipsometric characterisation of thin films non-uniform in thickness,
Thin Solid Films 519 (2011) 2715-2717 (1× cited)
24. Zajíčková L., Franta D., Nečas D., Buršíková V., Muresan M., Peřina V., Cobet C.,
Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture,
Thin Solid Films 519 (2011) 4299-4308 (2× cited)
23. Franta D., Ohlídal I., Nečas D., Vižďa F., Caha O., Hasoň M., Pokorný P.,
Optical characterization of HfO2 thin films,
Thin Solid Films 519 (2011) 6085-6091 (1× cited)
22. Nečas D., Ohlídal I., Franta D.,
Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films,
Journal of Optics 13(8) (2011) 085705 (2× cited)
21. Ohlídal M., Ohlídal I., Klapetek P., Nečas D., Majumdar A.,
Measurement of the thickness distribution and optical constants of non-uniform thin films ,
Measurement Science and Technology 22(8) (2011) 085104
20. Klapetek P., Nečas D., Campbellová A., Yacoot A., Koenders L.,
Methods for determining and processing 3D errors and uncertainties for AFM data analysis,
Measurement Science and Technology 22(2) (2011) 025501
19. Klapetek P., Valtr M., Nečas D., Salyk O., Dzik P.,
Atomic force microscopy analysis of nanoparticles in non-ideal conditions,
Nanoscale Research Letters 6 (2011) 514
2010
18. Franta D., Nečas D., Zajíčková L., Buršíková V., Cobet C.,Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range,
Diamond and Related Materials 19 (2010) 114–122 (9× cited)
17. Karásková M., Zajíčková L., Buršíková V., Franta D., Nečas D., Bláhová O., Šperka J.,
Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges,
Surface and Coatings Technology 204 (2010) 1997–2001 (1× cited)
16. Klapetek P., Valtr M., Poruba A., Nečas D., Ohlídal M.,
Rough surface scattering simulations using graphics cards,
Applied Surface Science 256(18) (2010) 5640-5643
2009
15. Ohlídal I., Nečas D., Franta D., Buršíková V.,Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry,
Diamond and Related Materials 18 (2009) 364–367 (5× cited)
14. Ohlídal M., Ohlídal I., Klapetek P., Nečas D., Buršíková V.,
Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films,
Diamond and Related Materials 18 (2009) 384–387
13. Franta D., Nečas D., Zajíčková L., Buršíková V.,
Limitations and possible improvements of DLC dielectric response model based on parameterization of density of states,
Diamond and Related Materials 18 (2009) 413–418 (4× cited)
12. Franta D., Nečas D., Ohlídal I., Hrdlička M., Pavlišta M., Frumar M., Ohlídal M.,
Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films,
Journal of Optoelectronics and Advanced Materials 11 (2009) 1891–1898 (1× cited)
11. Nečas D., Ohlídal I., Franta D.,
The reflectance of non-uniform thin films,
Journal of Optics A: Pure and Applied Optics 11 (2009) 045202 (6× cited)
2008
10. Franta D., Zajíčková L., Karásková M., Jašek O., Nečas D., Klapetek P., Valtr M.,Optical characterization of ultrananocrystalline diamond films,
Diamond and Related Materials 17 (2008) 1278–1282 (11× cited)
9. Franta D., Buršíková V., Nečas D., Zajíčková L.,
Modeling of optical constants of diamond-like carbon,
Diamond and Related Materials 17 (2008) 705–708 (9× cited)
8. Ohlídal I., Nečas D., Buršíková V., Franta D., Ohlídal M.,
Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry,
Diamond and Related Materials 17 (2008) 709–712 (1× cited)
7. Ohlídal I., Nečas D.,
Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films,
Journal of Modern Optics 55 (2008) 1077–1099
6. Brzobohatý O., Buršíková V., Nečas D., Valtr M., Trunec D.,
Influence of substrate material on plasma in deposition/sputtering reactor: experiment and computer simulation,
Journal of Physics D 41 (2008) 035213
5. Franta D., Ohlídal I., Nečas D.,
Influence of cross-correlation effects on the optical quantities of rough films,
Optics Express 16 (2008) 7789–7803 (6× cited)
2007
4. Franta D., Buršíková V., Ohlídal I., Sťahel P., Ohlídal M., Nečas D.,Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films,
Diamond and Related Materials 16 (2007) 1331–1335 (6× cited)
3. Franta D., Nečas D., Zajíčková L.,
Models of dielectric response in disordered solids,
Optics Express 15 (2007) 16230–16244 (30× cited)
2006
2. Polcar J., Topinka M., Nečas D., Hudec R., Hudcová V., Hroch F., Masetti N., Pizzichini G., Palazzi E.,Search for correlations between BATSE gamma-ray bursts and supernovae,
Astronomy and Astrophysics 452 (2006) 439–449 (1× cited)
1. Trunec D., Bonaventura Z., Nečas D.,
Solution of time-dependent Boltzmann equation for electrons in non-thermal plasma,
Journal of Physics D 39 (2006) 2544–2552 (1× cited)
Articles in journals without impact factor
2009
6. Ohlídal M., Ohlídal I., Nečas D., Klapetek P.,Complete Optical Characterization of Non-Uniform SiOx Thin Films Using Imaging Spectroscopic Reflectometry,
e-Journal of Surface Science and Nanotechnology 7 (2009) 409–412
5. Nečas D., Zajíčková L., Franta D., Sťahel P., Mikulík P., Meduňa M., Valtr M.,
Optical characterization of ultra-thin iron and iron oxide films,
e-Journal of Surface Science and Nanotechnology 7 (2009) 486–490
2008
4. Nečas D., Peřina V., Franta D., Ohlídal I., Zemek J.,Optical characterization of non-stoichiometric silicon nitride films,
Physica Status Solidi C 5 (2008) 1320–1323
3. Franta D., Hrdlička M., Nečas D., Frumar M., Ohlídal I., Pavlišta M.,
Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films,
Physica Status Solidi C 5 (2008) 1324–1327 (4× cited)
2. Franta D., Ohlídal I., Nečas D.,
Optical quantities of rough films calculated by Rayleigh-Rice theory,
Physica Status Solidi C 5 (2008) 1395–1398 (2× cited)
1. Ohlídal I., Nečas D., Franta D.,
Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies,
Physica Status Solidi C 5 (2008) 1399–1402
Proceedings available from ISI Web of Science
2016
6. Franta D., Nečas D., Ohlídal I., Giglia A.,Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range,
Photonics Europe 2016: Optical Micro- and Nanometrology VI , Photonics Europe 2016: Optical Micro- and Nanometrology VI, Brussels, Belgium 3 - 7 April 2016 (2016) 989014
2015
5. Ohlídal M., Ohlídal I., Nečas D., Vodák J., Franta D., Nádaský P., Vižďa F.,Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96280R
4. Franta D., Nečas D., Ohlídal I., Jankuj J.,
Wide spectral range characterization of antireflective coatings and their optimization,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96280F
3. Nečas D., Ohlídal I., Vodák J., Ohlídal M., Franta D.,
Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96280C
2. Franta D., Nečas D., Ohlídal I., Giglia A.,
Dispersion model for optical thin films applicable in wide spectral range,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96281U
2010
1. Muresan M., Zajíčková L., Buršíková V., Franta D., Nečas D.,Preparation and Characterization of DLC:N Films,
NANOCON 2010, 2ND INTERNATIONAL CONFERENCE , 2nd NANOCON International Conference, Olomouc, Czech Republic, 12-14 October 2010 (2010) 434-440
Proceedings not available from ISI Web of Science
2009
3. Franta D., Nečas D., Frumar M.,Modeling of dielectric response of Ge(x)Sb(y)Te(z) (GST) materials,
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 6, SUPPL 1 (2009) S59-S62
2. Ohlídal M., Ohlídal I., Klapetek P., Nečas D.,
PRECISE MEASUREMENT OF THICKNESS DISTRIBUTION OF NONUNIFORM THIN FILMS BY IMAGING SPECTROSCOPIC REFLECTOMETRY,
XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS (2009) 100-105
2006
1. Franta D., Nečas D., Zajíčková L., Buršíková V.,Modeling of DLC Optical Properties Based on Parameterization of Density of States,
Proceedings of International Workshop on the Application of Nanocrystalline Diamond and Diamond Like Carbon Materials (2006) 39-50