Main page | Journal list | Log-in

Daniel Franta, Ivan Ohlídal

Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces

Journal of Optics A: Pure and Applied Optics 8 (2006) 763–774

In this paper the influence of lateral dimensions of the irregularities on the optical quantities, i.e. on reflectance, transmittance, scattering losses and ellipsometric ratio of randomly rough surfaces, is discussed in detail. This discussion is based on theoretical (simulated) data calculated using the Rayleigh–Rice theory (RRT). It is shown that the optical quantities mentioned are strongly dependent on the quantities characterising the lateral dimensions of the irregularities, e.g. on the autocorrelation length. The simulated data are also used to investigate the possibilities and limitations of the scalar diffraction theory (SDT) and effective medium approximation (EMA) at treating the experimental data in practice. On the basis of these theoretical studies it is, moreover, shown that a combination of the SDT and EMA can be employed as a reasonable approximation for describing the interaction of light with randomly rough surfaces. Thus, from the results presented in this paper, it is evident that this combination could be a promissing treatment for experimental data corresponding to the optical quantities of randomly rough surfaces.

Download PDF (470 kB)

This article may also be available to you online

You can also contact one of the authors: franta@physics.muni.cz, ohlidal@physics.muni.cz

Citing Articles

  1. Franta D., Ohlídal I., Nečas D.,
    Influence of cross-correlation effects on the optical quantities of rough films,
    Optics Express 16 (2008) 7789–7803
  2. Nečas D., Peřina V., Franta D., Ohlídal I., Zemek J.,
    Optical characterization of non-stoichiometric silicon nitride films,
    Physica Status Solidi C 5 (2008) 1320–1323
  3. Franta D., Hrdlička M., Nečas D., Frumar M., Ohlídal I., Pavlišta M.,
    Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films,
    Physica Status Solidi C 5 (2008) 1324–1327
  4. Franta D., Zajíčková L., Karásková M., Jašek O., Nečas D., Klapetek P., Valtr M.,
    Optical characterization of ultrananocrystalline diamond films,
    Diamond and Related Materials 17 (2008) 1278–1282
  5. Franta D., Ohlídal I., Nečas D.,
    Optical quantities of rough films calculated by Rayleigh-Rice theory,
    Physica Status Solidi C 5 (2008) 1395–1398
  6. Franta D., Nečas D., Ohlídal I., Hrdlička M., Pavlišta M., Frumar M., Ohlídal M.,
    Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films,
    Journal of Optoelectronics and Advanced Materials 11 (2009) 1891–1898
  7. Remeš Z., Kromka A., Vaněček M.,
    Towards optical-quality nanocrystalline diamond with reduced non-diamond content,
    Physica Status Solidi A 206 (2009) 2004–2008
  8. Holovský J., Dagkaldiran Ű., Remeš Z., Purkrt A., Ižák T., Poruba A., Vaněček M.,
    Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates,
    Physica Status Solidi A 207 (2010) 578–581
  9. Remeš Z., Holovský J., Purkrt A., Ižák T., Poruba A., Vaněček M., Dagkaldiran Ű., Yates H. M., Evans P., Sheel D. W.,
    Optical absorption losses in metal layers used in thin film solar cells,
    Physica Status Solidi A 207 (2010) 2170–2173
  10. Remeš Z., Kromka A., Vaněček M., Babcenko O., Stuchlíková T. H., Červenka J., Hruška K., Trung T. Q.,
    The optical absorption of metal nanoparticles deposited on ZnO films,
    Physica Status Solidi A 207 (2010) 1722–1725
  11. Niu Y.-F. , Guin J.-P., Abdelouas A., Rouxel T. , Troles J. ,
    Durability of an As2S3 chalcogenide glass: Optical properties and dissolution kinetics,
    Journal of Non-Crystalline Solids 357 (2011) 932-938
  12. Pop-Georgievski O., Štěpán P., Houska M., Chvostová D., Proks V., Rypáček F.,
    Poly(ethylene oxide) Layers Grafted to Dopamine-melanin Anchoring Layer: Stability and Resistance to Protein Adsorption,
    Biomacromolecules 12 (2011) 3232-3242
  13. Nečas D., Franta D., Ohlídal I., Poruba A., Wostrý P.,
    Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films,
    Surface and Interface Analysis 45 (2013) 1188-1192

Cited Articles

  1. Franta D., Ohlídal I.,
    Comparison of effective medium approximation and Rayleigh–Rice theory concerning ellipsometric characterization of rough surfaces,
    Optics Communications 248 (2005) 459–467
  2. Ohlídal I., Franta D.,
    Ellipsometry of thin film systems,
    Progress in Optics 41 (2000) 181-282
  3. Franta D., Ohlídal I., Klapetek P.,
    Analysis of slightly rough thin films by optical methods and AFM,
    Mikrochimica Acta 132 (2000) 443–447
  4. Franta D., Ohlídal I.,
    Analysis of thin films by optical multi-sample methods,
    Acta Physica Slovaca 50 (2000) 411–421
  5. Franta D., Ohlídal I.,
    Ellipsometric parameters and reflectances of thin films with slightly rough boundaries,
    Journal of Modern Optics 45 (1998) 903–934
  6. Ohlídal I., Vižďa F., Ohlídal M.,
    Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries,
    Optical Engineering 34 (1995) 1761–1768
  7. Ohlídal I., Lukeš F.,
    Ellipsometric parameters of randomly rough surfaces,
    Optics Communications 5 (1972) 323-326
  8. Ohlídal I., Lukeš F.,
    Ellipsometric Parameters of Rough Surfaces and of a System Substrate-Thin Film with Rough Boundaries,
    Optica Acta 19 (1972) 817–843
  9. Ohlídal I., Navrátil K., Lukeš F.,
    Reflection of Light by a System of Nonabsorbing Isotropic Film-Nonabsorbing Isotropic Substrate with Randomly Rough Boundaries,
    Journal of the Optical Society of America 61 (1971) 1630–1639
  10. Ohlídal I., Navrátil K., Lukeš F.,
    Reflection of light on a system of non-absorbing isotropic film - non-absorbing isotropic substrate with rough boundaries,
    Optics Communications 3 (1971) 40–44