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Daniel Franta, David Nečas, Ivan Ohlídal

Anisotropy-enhanced depolarization on transparent film/substrate system

Thin Solid Films 519 (2011) 2637-2640

The combination of spectrophotometry and variable-angle spectroscopic ellipsometry is used for the optical characterization of a system consisting of transparent polymer film on a transparent polycarbonate substrate. In the region of sample transparency a relatively large depolarization is observed in ellipsometry. This can be explained by the presence of anisotropy in the film or substrate. The possibility of distinguishing between the depolarization enhanced by film and substrate anisotropy is discussed and tested using several models. It is shown that it is not possible to distinguish between these effects.

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Cited Articles

  1. Franta D., Nečas D., Zajíčková L., Buršíková V., Cobet C.,
    Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range,
    Diamond and Related Materials 19 (2010) 114–122
  2. Franta D., Nečas D., Zajíčková L.,
    Models of dielectric response in disordered solids,
    Optics Express 15 (2007) 16230–16244
  3. Ohlídal I., Franta D.,
    Ellipsometry of thin film systems,
    Progress in Optics 41 (2000) 181-282