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Ivan Ohlídal, František Lukeš

Calculation of the Ellipsometric Parameters Characterizing a Randomly Rough Surface by Means of The Stratton-Chu-Silver Integral

Optics Communications 7 (1973) 76–79

Considering some simplifying assumptions (especially a moderately rough surface) we present a method for calculating the ellipsometric parameters Δ and Ψ characterizing a randomly rough surface. The Stratton-Chu-Silver integral has been used in our approximation. We present also a comparison of the present results with those obtained earlier by means of the Kirchhoff scalar theory.

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