Main page | Journal list | Log-in

Petr Klapetek, Ivan Ohlídal, Daniel Franta, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter

Atomic force microscopy characterization of ZnTe epitaxial films

Acta Physica Slovaca 53 (2003) 223–230

In this paper results of a characterization of the surfaces of ZnTe epitaxial thin films exhibiting the different thicknesses are presented. The results mentioned are obtained using the procedures enabling us to determine the values of the following quantities: mean grain size, grain size distribution, root-mean square values of the heights of the irregularities and the diagram describing the distribution of the directions of the normals. For the analysis of the grain structure a watershed algorithm is used. It is shown that the values of these quantities can describe the morphology of the ZnTe film surfaces in a sufficient way. Further, it is shown that the structure of the surfaces of the ZnTe films exhibit facets forming a grain structure. Moreover, it is presented that the ZnTe film surfaces exhibit a strong slope anisotropy and that the linear dimensions of the grains increase with increasing values of the thicknesses of the ZnTe films.

Download PDF (734 kB)

This article may also be available to you online

You can also contact one of the authors:,

Citing Articles

  1. Ohlídal I., Franta D., Klapetek P.,
    Combination of optical methods and atomic force microscopy at characterization of thin film systems,
    Acta Physica Slovaca 55 (2005) 271–294
  2. Antoš R., Mistrík J., Yamaguchi T., Višňovský Š., Demokritov S. O., Hillebrands B.,
    Evaluation of the quality of Permalloy gratings by diffracted magneto-optical spectroscopy,
    Optics Express 13 (2005) 4651–4656
  3. Haško D., Bruncko J.,
    AFM surface analysis of ZnO layers prepared by pulsed laser deposition at different oxygen pressures,
    Vacuum 84 (2009) 166–16
  4. Gentry K. P., Gredig T., Schuller I. K.,
    Asymmetric grain distribution in phthalocyanine thin films,
    Physical Review B 80 (2009) 174118
  5. Koestenbauer H., Fontalvo G. A., Mitterer C., Hlawacek G., Teichert C., Keckes J.,
    Structure, Stresses and Stress Relaxation of TiN/Ag Nanocomposite Films,
    Journal of Nanoscience and Nanotechnology 9 (2009) 3606–3610

Cited Articles

  1. Franta D., Ohlídal I., Klapetek P., Pokorný P.,
    Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods,
    Surface and Interface Analysis 34 (2002) 759–762
  2. Franta D., Ohlídal I., Klapetek P.,
    Analysis of slightly rough thin films by optical methods and AFM,
    Mikrochimica Acta 132 (2000) 443–447