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Publications of Lenka Zajíčková's Research Group

Journal articles with impact factor: in print, 2016, 2015, 2014, 2013, 2012, 2011, 2010, 2009, 2008, 2007, 2006, 2005, 2004, 2003, 2002, 2001, 2000, 1999, 1998, 1996, 1995
Journal articles without impact factor: 2009, 2008, 2007, 2005, 2004, 2003, 2002, 2001, 1999, 1998

Conference proceedings available from ISI Web of Science: 2015, 2011, 2010, 2009
Conference proceedings not available from ISI Web of Science: 2014, 2010, 2009, 2008, 2007, 2006, 2005, 2004, 2003, 2001, 2000, 1999, 1998, 1997, 1996, 1995

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Articles in journals with impact factor

in print

214. Manakhov A., Michlíček M., Nečas D., Polčák J., Makhneva E., Eliáš M., Zajíčková L.,
Carboxyl-rich coatings deposited by atmospheric plasma co-polymerization of maleic anhydride and acetylene,
Surface and Coatings Technology (in print)

213. Schäfer J., Hnilica J., Šperka J., Quade A., Kudrle V., Foest R., Vodák J., Zajíčková L.,
Tetrakis(trimethylsilyloxy)silane for nanostructured SiO2-like films deposited by PECVD at atmospheric pressure,
Surface and Coatings Technology (in print)

212. Štrbková L., Manakhov A., Zajíčková L., Stoica A., Veselý P., Chmelík R.,
The adhesion of normal human dermal fibroblasts to the cyclopropylamine plasma polymers studied by holographic microscopy,
Surface and Coatings Technology (in print)

2016

211. Nečas D., Ohlídal I., Franta D., Ohlídal M., Vodák J.,
Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry,
Journal of Optics 18 (2016) 015401

210. Makhneva E., Manakhov A., Skládal P., Zajíčková L.,
Development of effective QCM biosensors by cyclopropylamine plasma polymerization and antibody immobilization using cross-linking reactions ,
Surface and Coatings Technology 290 (2016) 116-123

209. Manakhov A., Makhneva E., Skládal P., Nečas D., Čechal J., Kalina L., Eliáš M., Zajíčková L.,
The robust bio-immobilization based on pulsed plasma polymerization of cyclopropylamine and glutaraldehyde coupling chemistry,
Applied Surface Science 360(Part A) (2016) 28-36

208. Hegemann D., Michlíček M., Blanchard N., Schuetz U., Lohmann D., Vandenbossche M., Zajíčková L., Drábik M.,
Deposition of Functional Plasma Polymers Influenced by Reactor Geometry in Capacitively Coupled Discharges,
Plasma Processes and Polymers 13 (2016) 279–286

2015

207. Obrusník A., Bonaventura Z.,
Studying a low-pressure microwave coaxial discharge in hydrogen using a mixed 2D/3D model,
Journal of Physics D 48 (2015) 065201

206. Synek P., Obrusník A., Zajíčková L., Hübner S., Nijdam S.,
On the interplay of gas dynamics and the electromagnetic field in an atmospheric Ar/H2 microwave plasma torch,
Plasma Sources Science and Technology 24 (2015) 025030

205. Manakhov A., Nečas D., Čechal J., Pavliňák D., Eliáš M., Zajíčková L.,
Deposition of stable amine coating onto polycaprolactone nanofibers by low pressure cyclopropylamine plasma polymerization,
Thin Solid Films 581 (2015) 7-13

204. Nečas D., Vodák J., Ohlídal I., Ohlídal M., Majumdar A., Zajíčková L.,
Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry,
Applied Surface Science 350 (2015) 149-155

203. Pekárek J., Vrba R., Prášek J., Jašek O., Majzlíková P., Pekárková J., Zajíčková L.,
MEMS Carbon Nanotubes Field Emission Pressure Sensor With Simplified Design: Performance and Field Emission Properties Study,
IEEE Sensors J. 15(3) (2015) 1430-1436

202. Majzlíková P., Sedláček J., Prášek J., Pekárek J., Svatoš V., Bannov A., Jašek O., Synek P., Eliáš M., Zajíčková L., Hubálek J.,
Sensing Properties of Multiwalled Carbon Nanotubes Grown in MW Plasma Torch: Electronic and Electrochemical Behavior, Gas Sensing, Field Emission, IR Absorption,
Sensors 15(2) (2015) 2644--2661

201. Eliáš M., Kloc P., Jašek O., Mazánková V., Trunec D., Hrdý R., Zajíčková L.,
Atmospheric pressure barrier discharge at high temperature: Diagnostics and carbon nanotubes deposition,
Journal of Applied Physics 117(10) (2015) 103301

200. Muresan M., Charvátová-Campbell A., Ondračka P., Buršíková V., Peřina V., Polcar T., Reuter S., Hammer M., Valtr M., Zajíčková L.,
Protective double-layer coatings prepared by plasma enhanced chemical vapor deposition on tool steel,
Surface and Coatings Technology 272 (2015) 229-238

199. Stoica A., Manakhov A., Polčák J., Ondračka P., Buršíková V., Zajíčková R., Medalová J., Zajíčková L.,
Cell proliferation on modified DLC thin films prepared by plasma enhanced chemical vapor deposition,
Biointerphases 10 (2015) 029520

198. Kedroňová E., Zajíčková L., Hegemann D., Klíma M., Michlíček M., Manakhov A.,
Plasma Enhanced CVD of Organosilicon Thin Films on Electrospun Polymer Nanofibers,
Plasma Processes and Polymers 12 (2015) 1231–1243

197. Franta D., Nečas D., Ohlídal I.,
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia,
Applied Optics 54 (2015) 9108-9119

2014

196. Franta D., Nečas D., Zajíčková L., Ohlídal I.,
Broadening of dielectric response and sum rule conservation,
Thin Solid Films 571 (2014) 496-501

195. Nečas D., Ohlídal I., Franta D., Čudek V., Ohlídal M., Vodák J., Sládková L., Zajíčková L., Eliáš M., Vižďa F.,
Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry,
Thin Solid Films 571 (2014) 573-578

194. Klapetek P., Nečas D.,
Independent analysis of mechanical data from atomic force microscopy,
Measurement Science and Technology 25 (2014) 044009

193. Nečas D., Ohlídal I.,
Consolidated series for efficient calculation of the reflection and transmission in rough multilayers,
Optics Express 22(4) (2014) 4499-4515

192. Franta D., Nečas D., Zajíčková L., Ohlídal I.,
Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen,
Thin Solid Films 571 (2014) 490-495

191. Manakhov A., Zajíčková L., Eliáš M., Čechal J., Polčák J., Hnilica J., Bittnerová Š., Nečas D.,
Optimization of Cyclopropylamine Plasma Polymerization Toward Enhanced Layer Stability in Contact with Water,
Plasma Processes and Polymers 11 (2014) 532-544 (1× cited)

190. Ohlídal I., Franta D., Nečas D.,
Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces,
Thin Solid Films 571 (2014) 695-700

189. Synek P., Jašek O., Zajíčková L.,
Study of Microwave Torch Plasmachemical Synthesis of Iron Oxide Nanoparticles Focused on the Analysis of Phase Composition,
Plasma Chem. Plasma Process. 34(2) (2014) 327-341

188. David B., Pizurova N., Synek P., Kudrle V., Jašek O., Schneeweiss O.,
epsilon-Fe2O3 nanoparticles synthesized in atmospheric-pressure microwave torch,
Materials Letters 116(AA3WI) (2014) 370-373

187. Voráč J., Obrusník A., Procházka V., Dvořák P., Talába M.,
Spatially resolved measurement of hydroxyl radical (OH) concentration in an argon RF plasma jet by planar laser-induced fluorescence,
Plasma Sources Science and Technology 23(2) (2014) 025011

186. Šperka J., Souček P., Loon J., Dowson A., Schwarz C., Krause J., Butenko Y., Kroesen G., Kudrle V.,
Hypergravity synthesis of graphitic carbon nanomaterial in glide arc plasma,
Materials Research Bulletin 54 (2014) 61-65

185. Schäfer J., Šperka J., Gött G., Zajíčková L., Foest R.,
High-Speed Visualization of Filament Instabilities and Self-Organization Effect in RF Argon Plasma Jet at Atmospheric Pressure,
IEEE Transactions on Plasma Science 42 (2014) 2454-2455

184. Potočňáková L., Šperka J., Zikán P., Loon J., Beckers J., Kudrle V.,
Gliding Arc in Noble Gases Under Normal and Hypergravity Conditions,
IEEE Transactions on Plasma Science 42 (2014) 2724-2725

183. Nečas D., Čudek V., Vodák J., Ohlídal M., Klapetek P., Benedikt J., Rügner K., Zajíčková L.,
Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry,
Measurement Science and Technology 25 (2014) 115201

182. Nečas D., Ohlídal I., Franta D., Ohlídal M., Čudek V., Vodák J.,
Measurement of thickness distribution, optical constants and roughness parameters of rough non-uniform ZnSe thin films,
Applied Optics 53 (2014) 5606-5614

181. Franta D., Nečas D., Zajíčková L., Ohlídal I.,
Dispersion model of two-phonon absorption: application to c-Si,
Optical Materials Express 4 (2014) 1641-1656

180. David B., Schneeweiss O., Pizurova N., Rek A., Kudrle V., Jašek O.,
Nanocrystalline alpha-Fe Layer Examined by Mossbauer Spectrometry,
Acta Physica Polonica A 126(1) (2014) 94-95

179. Manakhov A., Skládal P., Nečas D., Čechal J., Polčák J., Eliáš M., Zajíčková L.,
Cyclopropylamine plasma polymers deposited onto quartz crystal microbalance for biosensing application,
Physica Status Solidi A 211(12) (2014) 2801-2808

178. Majzlíková P., Prášek J., Eliáš M., Jašek O., Pekárek J., Hubálek J., Zajíčková L.,
Comparison of different modifications of screen-printed working electrodes of electrochemical sensors using carbon nanotubes and plasma treatment,
Physica Status Solidi A 211(12) (2014) 2756–2764

2013

177. Nečas D., Klapetek P.,
One-dimensional autocorrelation and power spectrum density functions of irregular regions,
Ultramicroscopy 124 (2013) 13-19

176. Zajíčková L., Eliáš M., Buršíková V., Studýnková Z., Mazánková V., Michlíček M., Houdková J.,
Low Pressure Plasmachemical Processing of Multi-Walled Carbon Nanotubes for the Production of Polyurethane Composite Films with Improved Mechanical Properties,
Thin Solid Films 538 (2013) 7-15

175. Franta D., Nečas D., Zajíčková L.,
Application of Thomas–Reiche–Kuhn sum rule to construction of advanced dispersion models,
Thin Solid Films 534 (2013) 432-441 (2× cited)

174. Franta D., Nečas D., Zajíčková L., Ohlídal I., Stuchlík J., Chvostová D.,
Application of sum rule to the dispersion model of hydrogenated amorphous silicon,
Thin Solid Films 539 (2013) 233-244 (1× cited)

173. Franta D., Nečas D., Zajíčková L., Ohlídal I., Stuchlík J.,
Advanced modeling for optical characterization of amorphous hydrogenated silicon films,
Thin Solid Films 541 (2013) 12-16

172. Nečas D., Franta D., Ohlídal I., Poruba A., Wostrý P.,
Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films,
Surface and Interface Analysis 45 (2013) 1188-1192

171. Hnilica J., Schaefer J., Foest R., Zajíčková L., Kudrle V.,
PECVD of nanostructured SiO2 in a modulated microwave plasma jet at atmospheric pressure,
Journal of Physics D 46(33) (2013) 8

170. Šperka J., Souček P., Loon J., Dowson A., Schwarz C., Krause J., Kroesen G., Kudrle V.,
Hypergravity effects on glide arc plasma,
European Physical Journal D 67(12) (2013) 1-9

2012

169. Nečas D., Klapetek P.,
Gwyddion: an open-source software for SPM data analysis,
Central European Journal of Physics 10(1) (2012) 181-188

168. David B., Schneeweiss O., Santava E., Jašek O.,
Magnetic Properties of gamma-Fe2O3 Nanopowder Synthesized by Atmospheric Microwave Torch Discharge,
Acta Physica Polonica A 122(1) (2012) 9-11

167. David B., Pizurova N., Schneeweiss O., Santava E., Kudrle V., Jašek O.,
gamma-Fe2O3 Nanopowders Synthesized in Microwave Plasma and Extraordinarily Strong Temperature Influence on Their Mossbauer Spectra,
Journal of Nanoscience and Nanotechnology 12(12) (2012) 9277-9285

166. Mocanu V., Stoica A., Kelar L., Franta D., Buršíková V., Mikšová R., Peřina V.,
Multifunctional transparent protective coatings on polycarbonates prepared using PECVD,
Chemické listy 106 (2012) S1460-S1464

165. Schäfer J., Foest R., Reuter S., Kewitz T., Šperka J., Weltmann D.,
Laser schlieren deflectometry for temperature analysis of filamentary non-thermal atmospheric pressure plasma,
Review of Scientific Instruments 83(10) (2012) 103506

2011

164. Franta D., Nečas D., Zajíčková L., Buršíková V., Cobet C.,
Combination of synchrotron ellipsometry and table-top optical measurements for determination of band structure of DLC films,
Thin Solid Films 519 (2011) 2694-2697 (2× cited)

163. Franta D., Nečas D., Ohlídal I.,
Anisotropy-enhanced depolarization on transparent film/substrate system,
Thin Solid Films 519 (2011) 2637-2640

162. Ohlídal I., Ohlídal M., Nečas D., Franta D., Buršíková V.,
Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry,
Thin Solid Films 519 (2011) 2874-2876 (1× cited)

161. Nečas D., Franta D., Buršíková V., Ohlídal I.,
Ellipsometric characterisation of thin films non-uniform in thickness,
Thin Solid Films 519 (2011) 2715-2717 (1× cited)

160. Zajíčková L., Franta D., Nečas D., Buršíková V., Muresan M., Peřina V., Cobet C.,
Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture,
Thin Solid Films 519 (2011) 4299-4308 (2× cited)

159. Franta D., Ohlídal I., Nečas D., Vižďa F., Caha O., Hasoň M., Pokorný P.,
Optical characterization of HfO2 thin films,
Thin Solid Films 519 (2011) 6085-6091 (1× cited)

158. Nečas D., Ohlídal I., Franta D.,
Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films,
Journal of Optics 13(8) (2011) 085705 (2× cited)

157. Ohlídal M., Ohlídal I., Klapetek P., Nečas D., Majumdar A.,
Measurement of the thickness distribution and optical constants of non-uniform thin films ,
Measurement Science and Technology 22(8) (2011) 085104

156. Klapetek P., Nečas D., Campbellová A., Yacoot A., Koenders L.,
Methods for determining and processing 3D errors and uncertainties for AFM data analysis,
Measurement Science and Technology 22(2) (2011) 025501

155. Klapetek P., Valtr M., Nečas D., Salyk O., Dzik P.,
Atomic force microscopy analysis of nanoparticles in non-ideal conditions,
Nanoscale Research Letters 6 (2011) 514

154. Prášek J., Húska D., Jašek O., Zajíčková L., Trnková L., Adam V., Kizek R., Hubálek J.,
Carbon composite micro- and nano-tubes-based electrodes for detection of nucleic acids,
Nanoscale Research Letters 6 (2011) 385 (2× cited)

153. Synek P., Jašek O., Zajíčková L., David B., Kudrle V., Pizurova N.,
Plasmachemical synthesis of maghemite nanoparticles in atmospheric pressure microwave torch,
Materials Letters 65(6) (2011) 982-984 (4× cited)

152. Sobota J., Grossman J., Buršíková V., Dupak L., Vyskocil J.,
Evaluation of hardness, tribological behaviour and impact load of carbon-based hard composite coatings exposed to the influence of humidity,
Diamond and Related Materials 20(4) (2011) 596-599

151. Vasina P., Souček P., Schmidtova T., Eliáš M., Buršíková V., Jilek M., Jilek J., Schaefer J., Buršík J.,
Depth profile analyses of nc-TiC/a-C:H coating prepared by balanced magnetron sputtering,
Surface and Coatings Technology 205(2) (2011) S53-S56

150. Mikula M., Grancic B., Roch T., Plecenik T., Vavra I., Dobrocka E., Satka A., er e., Buršíková V., Drzik M., Zahoran M., Plecenik A., Kus P.,
The influence of low-energy ion bombardment on the microstructure development and mechanical properties of TiB(x) coatings,
Vacuum 85(9) (2011) 866-870

149. Sopousek J., Buršík J., Zalesak J., Buršíková V., Broz P.,
Interaction of Silver Nanopowder with Copper Substrate,
Science of Sintering 43(1) (2011) 33-38

148. Buršík J., Sopousek J., Buršíková V., Styskalik A., Skoda D.,
Characterization of Sintered Ag Nanopowder Joints using Nanoindentation Tests,
Chemické listy 105(S) (2011) S777-S778

147. Buršíková V., Bláhová O., Karásková M., Zajíčková L., Jašek O., Franta D., Klapetek P., Buršík J.,
Mechanical properties of ultrananocrystalline thin films deposited using dual frequency discharges,
Chemické listy 105(2, SI) (2011) S98-S101

146. Prášek J., Drbohlavova J., Chomoucka J., Hubálek J., Jašek O., Adam V., Kizek R.,
Methods for carbon nanotubes synthesis-review,
Journal of Materials Chemistry 21(40) (2011) 15872-15884

145. David B., Pizurova N., Schneeweiss O., Kudrle V., Jašek O., Synek P.,
Iron-Based Nanopowders Containing alpha-Fe, Fe3C, and gamma-Fe Particles Synthesised in Microwave Torch Plasma and Investigated with Mossbauer Spectroscopy,
Japanese Journal of Applied Physics 50(8) (2011) 08JF11

144. Buršíková V., Kučerová Z., Zajíčková L., Jašek O., Kudrle V., Matějková J., Synek P.,
MEASUREMENT OF MECHANICAL PROPERTIES OF COMPOSITE MATERIALS,
Chemické listy 105(2) (2011) S171-S174

2010

143. Franta D., Nečas D., Zajíčková L., Buršíková V., Cobet C.,
Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range,
Diamond and Related Materials 19 (2010) 114–122 (9× cited)

142. Trunec D., Zajíčková L., Buršíková V., Studnička F., Sťahel P., Prysiazhnyi V., Peřina V., Houdková J., Navrátil Z., Franta D.,
Deposition of hard thin films from HMDSO in atmospheric pressure dielectric barrier discharge,
Journal of Physics D 43 (2010) 225403 (7× cited)

141. Zajíčková L., Jašek O., Eliáš M., Synek P., Lazar L., Schneeweiss O., Hanzlíková R.,
Synthesis of carbon nanotubes by plasma- enhanced chemical vapor deposition in an atmospheric-pressure microwave torch,
Pure and Applied Chemistry 82 (2010) 1259–1272 (2× cited)

140. Karásková M., Zajíčková L., Buršíková V., Franta D., Nečas D., Bláhová O., Šperka J.,
Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges,
Surface and Coatings Technology 204 (2010) 1997–2001 (1× cited)

139. Klapetek P., Valtr M., Poruba A., Nečas D., Ohlídal M.,
Rough surface scattering simulations using graphics cards,
Applied Surface Science 256(18) (2010) 5640-5643

138. Jašek O., Synek P., Zajíčková L., Eliáš M., Kudrle V.,
Synthesis of Carbon Nanostructures by Plasma Enhanced Chemical Vapour Deposition at Atmospheric Pressure,
Journal Of Electrical Engineering 61(5) (2010) 311-313 (1× cited)

137. Dvořák P., Vasina P., Buršíková V., Zemlicka R.,
Monitoring of PVD, PECVD and etching plasmas using Fourier components of RF voltage,
Plasma Physics and Controlled Fusion 52(12, Part 2) (2010) 124011-124022

136. Campbellová A., Klapetek P., Buršíková V., Valtr M., Buršík J.,
Small-load nanoindentation experiments on metals,
Surface and Interface Analysis 42(6-7, SI) (2010) 766-769

2009

135. Zajíčková L., Synek P., Jašek O., Eliáš M., David B., Buršík J., Pizurova N., Hanzlíková R., Lazar L.,
Synthesis of Carbon Nanotubes and Iron Oxide Nanoparticles in MW Plasma Torch with Fe(CO)5 in Gas Feed,
Applied Surface Science 255 (2009) 5421–5424 (5× cited)

134. Ohlídal I., Nečas D., Franta D., Buršíková V.,
Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry,
Diamond and Related Materials 18 (2009) 364–367 (5× cited)

133. Ohlídal M., Ohlídal I., Klapetek P., Nečas D., Buršíková V.,
Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films,
Diamond and Related Materials 18 (2009) 384–387

132. Franta D., Nečas D., Zajíčková L., Buršíková V.,
Limitations and possible improvements of DLC dielectric response model based on parameterization of density of states,
Diamond and Related Materials 18 (2009) 413–418 (4× cited)

131. Franta D., Nečas D., Ohlídal I., Hrdlička M., Pavlišta M., Frumar M., Ohlídal M.,
Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films,
Journal of Optoelectronics and Advanced Materials 11 (2009) 1891–1898 (1× cited)

130. Nečas D., Ohlídal I., Franta D.,
The reflectance of non-uniform thin films,
Journal of Optics A: Pure and Applied Optics 11 (2009) 045202 (6× cited)

129. Kučerová Z., Zajíčková L., Buršíková V., Kudrle V., Eliáš M., Jašek O., Synek P., Matějková J., Buršík J.,
Mechanical and Microwave Absorbing Properties of Carbon-Filled Polyurethane,
Micron 40 (2009) 70–73 (7× cited)

128. Zajíčková L., Kučerová Z., Buršíková V., Eliáš M., Houdková J., Synek P., Maršíková H., Jašek O.,
Carbon Nanotubes Functionalized in Oxygen and Water Low Pressure Discharges used as Reinforcement of Polyurethane Composites,
Plasma Processes and Polymers 6 (2009) S864–S869 (1× cited)

127. Kolmacka M., Kadlečíková M., Breza J., Lazist\'an F., Zajíčková L., Eliáš M., Jesenak K., Pastorkova K.,
Wireless temperature measurement in the hot filament CVD reactor for deposition of carbon nanotubes,
Journal Of Electrical Engineering 60(6) (2009) 346-349

126. Hartmanova M., Lomonova E., Kubel F., Schneider J., Buršíková V., Jergel M., Navrátil V., Kundracik F.,
Relationship between effective ionic radii, structure and electro-mechanical properties of zirconia stabilized with rare earth oxides M(2)O(3) (M = Yb, Y, Sm),
Journal of Materials Science 44(1) (2009) 234-243

125. Hazdra P., Komarnitskyy V., Buršíková V.,
Hydrogenation of platinum introduced in silicon by radiation enhanced diffusion,
Materials Science and Engineering B 159-60(466BM) (2009) 342-345

2008

124. Franta D., Zajíčková L., Karásková M., Jašek O., Nečas D., Klapetek P., Valtr M.,
Optical characterization of ultrananocrystalline diamond films,
Diamond and Related Materials 17 (2008) 1278–1282 (11× cited)

123. Franta D., Buršíková V., Nečas D., Zajíčková L.,
Modeling of optical constants of diamond-like carbon,
Diamond and Related Materials 17 (2008) 705–708 (9× cited)

122. Ohlídal I., Nečas D., Buršíková V., Franta D., Ohlídal M.,
Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry,
Diamond and Related Materials 17 (2008) 709–712 (1× cited)

121. Lazar L., Synek P., Karásková M., Eliáš M., Jašek O., Kelar L., Konupčík P., Zajíčková L.,
Comparison of Various Plasmachemical Processes with Respect to the Gas Temperature,
Chemické listy 102 (2008) 1158–1161

120. Valtr M., Klapetek P., Buršíková V., Ohlídal I., Franta D.,
Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge,
Chemické listy 102 (2008) s1529–s1532

119. Ohlídal I., Nečas D.,
Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films,
Journal of Modern Optics 55 (2008) 1077–1099

118. Brzobohatý O., Buršíková V., Nečas D., Valtr M., Trunec D.,
Influence of substrate material on plasma in deposition/sputtering reactor: experiment and computer simulation,
Journal of Physics D 41 (2008) 035213

117. Franta D., Ohlídal I., Nečas D.,
Influence of cross-correlation effects on the optical quantities of rough films,
Optics Express 16 (2008) 7789–7803 (6× cited)

116. Sťahel P., Buršíková V., Buršík J., Čech J., Janča J., Cernak M.,
Hydrophylisation of non-woven polypropylene textiles using atmospheric pressure surface barrier discharge,
Journal of Optoelectronics and Advanced Materials 10(1) (2008) 213-218

115. Šíra M., Trunec D., Sťahel P., Buršíková V., Navrátil Z.,
Surface modification of polycarbonate in homogeneous atmospheric pressure discharge,
Journal of Physics D 41(1) (2008) 015205

114. Hartmanova M., Kubel F., Buršíková V., Lomonova E., Holgado J., Navrátil V., Navrátil K., Kundracik F.,
Phase composition-dependent physical and mechanical properties of YbxZr1-xO2-x/2 solid solutions,
Journal of Physics and Chemistry of Solids 69(4) (2008) 805-814

113. Buršíková V., Sobota J., Fort T., Grossman J., Stoica A., Buršík J., Klapetek P., Peřina V.,
Optimisation of mechanical properties of plasma deposited graded multilayer diamond-like carbon coatings,
Journal of Optoelectronics and Advanced Materials 10(12) (2008) 3229-3232

2007

112. Franta D., Buršíková V., Ohlídal I., Sťahel P., Ohlídal M., Nečas D.,
Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films,
Diamond and Related Materials 16 (2007) 1331–1335 (6× cited)

111. Zajíčková L., Buršíková V., Kučerová Z., Franclová J., Sťahel P., Peřina V., Macková A.,
Organosilicon Thin Films Deposited by Plasma Enhanced CVD: Thermal Changes of Chemical Structure and Mechanical Properties,
Journal of Physics and Chemistry of Solids 68 (2007) 1255–1259 (13× cited)

110. Jašek O., Eliáš M., Zajíčková L., Kučerová Z., Matějková J., Rek A., Buršík J.,
Discussion of Important Factors in Deposition of Carbon Nanotubes by Atmospheric Pressure Microwave Plasma Torch,
Journal of Physics and Chemistry of Solids 68 (2007) 738–743 (6× cited)

109. Franta D., Nečas D., Zajíčková L.,
Models of dielectric response in disordered solids,
Optics Express 15 (2007) 16230–16244 (30× cited)

108. Zajíčková L., Eliáš M., Jašek O., Kučerová Z., Synek P., Matějková J., Kadlečíková M., Klementová M., Buršík J., Vojačková A.,
Characterization of Carbon Nanotubes Deposited in Microwave Torch at Atmospheric Pressure,
Plasma Processes and Polymers 4 (2007) S245–S249 (7× cited)

107. Zajíčková L., Buršíková V., Franta D., Bousquet A., Granier A., Goullet A., Buršík J.,
Comparative study of films deposited from HMDSO/O2 in continuous wave and pulsed rf discharges,
Plasma Processes and Polymers 4 (2007) S287–S293 (3× cited)

106. Zajíčková L., Buršíková V., Kučerová Z., Franta D., Dvořák P., Šmíd R., Peřina V., Macková A.,
Deposition of protective coatings in RF organosilicon discharges,
Plasma Sources Science and Technology 16 (2007) S123–S132 (20× cited)

105. Vladoiu R., Lungu C., Mustata I., Buršíková V., Buršík J.,
Characterization by nanoindentation and Scanning Electron Microscopy of the spin valves structures prepared by Thermionic Vacuum Arc (TVA) method,
Journal of Optoelectronics and Advanced Materials 9(4) (2007) 1087-1090

104. Vladoiu R., Ciupina V., Surdu-Bob C., Lungu C., Janik J., Skalny J., Buršíková V., Buršík J., Musa G.,
Properties of the carbon thin films deposited by thermionic vacuum arc,
Journal of Optoelectronics and Advanced Materials 9(4) (2007) 862-866

103. Buršíková V., Rehulka P., Chmelik J., Alberti M., Spalt Z., Janča J., Havel J.,
Laser ablation time-of-flight mass spectrometry (LA-TOF-MS) of "nitrogen doped diamond-like carbon (DLN) nano-layers",
Journal of Physics and Chemistry of Solids 68(5-6, SI) (2007) 701-706

102. Mikula M., Grancic B., Buršíková V., Csuba A., Drzik M., Kavecky S., Plecenik A., Kus P.,
Mechanical properties of superhard TiB2 coatings prepared by DC magnetron sputtering,
Vacuum 82(2) (2007) 278-281

2006

101. Polcar J., Topinka M., Nečas D., Hudec R., Hudcová V., Hroch F., Masetti N., Pizzichini G., Palazzi E.,
Search for correlations between BATSE gamma-ray bursts and supernovae,
Astronomy and Astrophysics 452 (2006) 439–449 (1× cited)

100. Šmíd R., Granier A., Bousquet A., Cartry G., Zajíčková L.,
Study of Magnetic Field Influence on Charged Species in a Low Pressure Helicon Reactor,
Czechoslovak Journal of Physics 56 (2006) B1091–B1096

99. Valtr M., Ohlídal I., Franta D.,
Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry,
Czechoslovak Journal of Physics 56 (2006) B1103–B1109

98. Frgala Z., Jašek O., Karásková M., Zajíčková L., Buršíková V., Franta D., Matějková J., Rek A., Klapetek P., Buršík J.,
Microwave PECVD of nanocrystalline diamond with RF induced bias nucleation,
Czechoslovak Journal of Physics 56 (2006) B1218–B1223 (3× cited)

97. Kučerová Z., Zajíčková L., Jašek O., Eliáš M., Ficek R., Vrba R., Matějka F., Matějková J., Buršík J.,
Carbon Nanotubes Synthesized by Plasma Enhanced CVD: Preparation for Measurements of Their Electrical Properties,
Czechoslovak Journal of Physics 56 (2006) B1244–B1249 (1× cited)

96. Šíra M., Trunec D., Sťahel P., Buršíková V., Franta D.,
Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge,
Czechoslovak Journal of Physics 56 (2006) B1377–B1382

95. Buršíková V., Zajíčková L., Dvořák P., Valtr M., Buršík J., Bláhová O., Peřina V., Janča J.,
Influence of Silicon, Oxygen and Nitrogen Admixtures Upon the Properties of Plasma Deposited Amorphous Diamond-Like Carbon Coatings,
Journal of Advanced Oxidation Technologies 9 (2006) 232–236 (3× cited)

94. Ohlídal I., Franta D., Šiler M., Vižďa F., Frumar M., Jedelský J., Omasta J.,
Comparison of dispersion models in the optical characterization of As–S chalcogenide thin films,
Journal of Non-Crystalline Solids 352 (2006) 5633–5641 (4× cited)

93. Franta D., Ohlídal I.,
Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces,
Journal of Optics A: Pure and Applied Optics 8 (2006) 763–774 (13× cited)

92. Trunec D., Bonaventura Z., Nečas D.,
Solution of time-dependent Boltzmann equation for electrons in non-thermal plasma,
Journal of Physics D 39 (2006) 2544–2552 (1× cited)

91. Jašek O., Eliáš M., Zajíčková L., Kudrle V., Bublan M., Matějková J., Rek A., Buršík J., Kadlečíková M.,
Carbon Nanotubes Synthesis in Microwave Plasma Torch at Atmospheric Pressure,
Materials Science and Engineering C 26 (2006) 1189–1193 (9× cited)

90. Bousquet A., Buršíková V., Goullet A., Djouadi A., Zajíčková L., Granier A.,
Comparison of Structure and Mechanical Properties of SiO2-Like Films Deposited in O-2/HMDSO Pulsed and Continuous Plasmas,
Surface and Coatings Technology 200 (2006) 6517–6521 (14× cited)

89. Franta D., Ohlídal I., Klapetek P., Nepustilová R., Bajer S.,
Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy,
Surface and Interface Analysis 38 (2006) 842–846 (1× cited)

88. Vladoiu R., Ciupina V., Lungu C., Buršíková V., Musa G.,
Thermoionic vacuum arc (TVA) deposited tungsten thin film characterization,
Journal of Optoelectronics and Advanced Materials 8(1) (2006) 71-73

87. Buršíková V., Sládek P., Sťahel P., Buršík J.,
Complex study of mechanical properties of a-Si : H and a-SiC : H boron doped films,
Journal of Non-Crystalline Solids 352(9-20) (2006) 1238-1241

86. Buršíková V., Sládek P., Sťahel P., Buršík J.,
Mechanical properties of thin silicon films deposited on glass and plastic substrates studied by depth sensing indentation technique,
Journal of Non-Crystalline Solids 352(9-20) (2006) 1242-1245

85. Sťahel P., Buršíková V., Šíra M., Navrátil Z., Kloc P., Janča J.,
Modification of polymer surfaces using atmospheric pressure barrier discharges,
Journal of Advanced Oxidation Technologies 9(2) (2006) 228-231

84. Kloc P., Sťahel P., Buršíková V., Brablec A., Navrátil Z., Šíra M., Janča J.,
Deposition of teflon-like protective layers in surface discharge at atmospheric pressure,
Czechoslovak Journal of Physics 56(Part 7, B) (2006) B1345-B1350

83. Franclová J., Buršíková V.,
Poole-Frenkel conductivity in SiOxHyCz coatings prepared by PECVD,
Czechoslovak Journal of Physics 56(Part 6, B) (2006) B1146-BA1149

82. Hajkova P., Louda P., Spatenka P., Kolouch A., Spatenka P., Bláhová O., Buršíková V.,
Comparison of evaluating methods of thin films nanohardness,
Czechoslovak Journal of Physics 56(Part 6, B) (2006) B1162-B1168

2005

81. Ohlídal I., Franta D., Klapetek P.,
Combination of optical methods and atomic force microscopy at characterization of thin film systems,
Acta Physica Slovaca 55 (2005) 271–294 (1× cited)

80. Dvořák P., Jánský J., Zajíčková L., Janča J.,
Energy Distribution of Hydrogen Ions in Capacitively Coupled Low Pressure Discharge,
Acta Physica Slovaca 55 (2005) 441–446

79. Antoš R., Ohlídal I., Franta D., Klapetek P., Mistrík J., Yamaguchi T., Višňovský Š.,
Spectroscopic ellipsometry of sinusoidal surface-relief gratings,
Applied Surface Science 244 (2005) 221–224 (2× cited)

78. Franta D., Ohlídal I., Mistrík J., Yamaguchi T., Hu G., Dai N.,
Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions,
Applied Surface Science 244 (2005) 338–342 (3× cited)

77. Franta D., Negulescu B., Thomas L., Dahoo P., Guyot M., Ohlídal I., Mistrík J., Yamaguchi T.,
Optical properties of NiO thin films prepared by pulsed laser deposition technique,
Applied Surface Science 244 (2005) 426–430 (19× cited)

76. Mistrík J., Yamaguchi T., Franta D., Ohlídal I., Hu G., Dai N.,
Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry,
Applied Surface Science 244 (2005) 431–434 (10× cited)

75. Franta D., Buršíková V., Ohlídal I., Zajíčková L., Sťahel P.,
Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films,
Diamond and Related Materials 14 (2005) 1795–1798 (10× cited)

74. Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Klapetek P., Páleníková K.,
Influence of technological conditions on mechanical stresses inside diamond-like carbon films,
Diamond and Related Materials 14 (2005) 1835–1838 (5× cited)

73. Kučerová Z., Buršíková V., Zajíčková L., Franclová J., Peřina V.,
Thermal Stability of SiOxCyHz Films Prepared by PECVD,
Chemické listy 99 (2005) 465–467

72. Šiler M., Ohlídal I., Franta D., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Optical characterization of double layers containing epitaxial ZnSe and ZnTe films,
Journal of Modern Optics 52 (2005) 583–602 (1× cited)

71. Franta D., Ohlídal I.,
Comparison of effective medium approximation and Rayleigh–Rice theory concerning ellipsometric characterization of rough surfaces,
Optics Communications 248 (2005) 459–467 (31× cited)

70. Zajíčková L., Eliáš M., Jašek O., Kudrle V., Frgala Z., Matějková J., Buršík J., Kadlečíková M.,
Atmospheric Pressure Microwave Torch for Synthesis of Carbon Nanotubes,
Plasma Physics and Controlled Fusion 47 (2005) B655–B666 (14× cited)

69. Přikryl R., Čech V., Zajíčková L., Vaněk J., Behzadi S., Jones R.,
Mechanical and Optical Properties of Plasma-Polymerized Vinyltriethoxysilane,
Surface and Coatings Technology 200 (2005) 468–471 (11× cited)

68. Franta D., Ohlídal I., Petrýdes D.,
Optical characterization of TiO2 thin films by the combined method of spectroscopic ellipsometry and spectroscopic photometry,
Vacuum 80 (2005) 159–162 (12× cited)

67. Šíra M., Trunec D., Sťahel P., Buršíková V., Navrátil Z., Buršík J.,
Surface modification of polyethylene and polypropylene in atmospheric pressure glow discharge,
Journal of Physics D 38(4) (2005) 621-627

2004

66. Šmíd R., Zajíčková L., Janča J.,
Spatially Resolved Measurements in RF Capacitive Discharges in Argon and Nitrogen,
Czechoslovak Journal of Physics 54 (2004) C592–C598

65. Franclová J., Kučerová Z., Buršíková V., Zajíčková L., Peřina V.,
Structural Changes of Plasma Deposited SiOxCyHz Thin Films Attained by Thermal Annealing,
Czechoslovak Journal of Physics 54 (2004) C847–C852

64. Trunec D., Navrátil Z., Sťahel P., Zajíčková L., Buršíková V.,
Deposition of Thin Organosilicon Polymer Films in Atmospheric Pressure Glow Discharge,
Journal of Physics D 37 (2004) 2112–2120 (65× cited)

63. Franta D., Ohlídal I., Klapetek P., Ohlídal M.,
Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy,
Surface and Interface Analysis 36 (2004) 1203–1206 (3× cited)

62. Franta D., Ohlídal I., Buršíková V., Zajíčková L.,
Optical properties of diamond-like carbon films containing SiOx studied by the combined method of spectroscopic ellipsometry and spectroscopic reflectometry,
Thin Solid Films 455–456 (2004) 393–398 (20× cited)

61. Franta D., Ohlídal I., Klapetek P., Roca i Cabarrocas P.,
Complete characterization of rough polymorphous silicon films by atomic force microscopy and the combined method of spectroscopic ellipsometry and spectroscopic reflectometry,
Thin Solid Films 455–456 (2004) 399–403 (12× cited)

60. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Optical properties of ZnTe films prepared by molecular beam epitaxy,
Thin Solid Films 468 (2004) 193–202 (11× cited)

59. Čech J., Sťahel P., Šíra M., Buršíková V., Navrátil Z., Trunec D., Brablec A.,
Thermal stability of coatings prepared in atmospheric pressure glow discharge,
Czechoslovak Journal of Physics 54(Part 5) (2004) C872-C876

58. Brzobohatý O., Buršíková V., Trunec D.,
Mirror effect in PECVD reactor and its explanation via MC-PIC computer simulation,
Czechoslovak Journal of Physics 54(Part 4) (2004) C527-C532

57. Slavíček P., Buršíková V., Brablec A., Kapicka V., Klíma M.,
Deposition of polymer films by rf discharge at atmospheric pressure,
Czechoslovak Journal of Physics 54(Part 4) (2004) C586-C591

56. Navrátil Z., Buršíková V., Sťahel P., Šíra M., Zverina P.,
On the analysis of surface free energy of DLC coatings deposited in low pressure RF discharge,
Czechoslovak Journal of Physics 54(Part 5) (2004) C877-C882

55. Sťahel P., Buršíková V., Šíra M., Navrátil Z., Delgado M., Janča J.,
Deposition of teflon like coatings in surface barrier discharge,
Czechoslovak Journal of Physics 54(Part 5) (2004) C866-C871

54. Šíra M., Sťahel P., Buršíková V., Vohanka J., Trunec D.,
Activation of polyethylene and polypropylene in atmospheric pressure glow discharge,
Czechoslovak Journal of Physics 54(Part 5) (2004) C835-C839

2003

53. Klapetek P., Ohlídal I., Franta D., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Atomic force microscopy characterization of ZnTe epitaxial films,
Acta Physica Slovaca 53 (2003) 223–230 (5× cited)

52. Franta D., Zajíčková L., Buršíková V., Ohlídal I.,
New dispersion model of the optical constants of the DLC films,
Acta Physica Slovaca 53 (2003) 373–384 (13× cited)

51. Zajíčková L., Subedi D., Buršíková V., Veltruská K.,
Study of Argon Plasma Treatment of Polycarbonate Substrate and its Effect on Film Deposition,
Acta Physica Slovaca 53 (2003) 489–504 (11× cited)

50. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Optical constants of ZnTe and ZnSe epitaxial thin films,
Acta Physica Slovaca 53 (2003) 95–104 (2× cited)

49. Franta D., Ohlídal I., Frumar M., Jedelský J.,
Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model,
Applied Surface Science 212–213 (2003) 116–121 (23× cited)

48. Franta D., Ohlídal I., Buršíková V., Zajíčková L.,
Optical properties of diamond-like carbon films containing SiOx,
Diamond and Related Materials 12 (2003) 1532–1538 (16× cited)

47. Ohlídal M., Ohlídal I., Klapetek P., Jákl M., Čudek V., Eliáš M.,
New method for the complete optical analysis of thin films nonuniform in optical parameters,
Japanese Journal of Applied Physics 42 (2003) 4760–4763 (1× cited)

46. Zajíčková L., Buršíková V., Peřina V., Macková A., Janča J.,
Correlation Between SiOx Content and Properties of DLC : SiOx Films Prepared by PECVD,
Surface and Coatings Technology 174 (2003) 281–285 (22× cited)

45. Zajíčková L., Rudakowski S., Becker H., Meyer D., Valtr M., Wiesemann K.,
Study of Plasma Polymerization from Acetylene in Pulsed RF Discharges,
Thin Solid Films 425 (2003) 72–84 (12× cited)

44. Drnovska H., Lapcik L., Buršíková V., Zemek J., Barros-Timmons A.,
Surface properties of polyethylene after low-temperature plasma treatment,
Colloid and Polymer Science 281(11) (2003) 1025-1033

2002

43. Zajíčková L., Dvořák P., Kudrle V., Šmíd R.,
Study of Mode Transition in Low Pressure Capacitive RF Discharges in Nitrogen,
Czechoslovak Journal of Physics 52 (2002) 427–432

42. Franta D., Zajíčková L., Ohlídal I., Janča J., Veltruská K.,
Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry,
Diamond and Related Materials 11 (2002) 105–117 (21× cited)

41. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
Influence of overlayers on determination of the optical constants of ZnSe thin films,
Journal of Applied Physics 92 (2002) 1873–1880 (7× cited)

40. Buršíková V., Sládek P., Sťahel P., Zajíčková L.,
Improvement of the Efficiency of the Silicon Solar Cells by Silicon Incorporated Diamond-Like Carbon Antireflective Coatings,
Journal of Non-Crystalline Solids 299 (2002) 1147–1151 (12× cited)

39. Buršíková V., Navrátil V., Zajíčková L., Janča J.,
Temperature Dependence of Mechanical Properties of DLC/Si Protective Coatings Prepared by PECVD,
Materials Science and Engineering A 324 (2002) 251–254 (35× cited)

38. Choukourov A., Pihosh Y., Stelmashuk V., Biederman H., Slavínská D., Kormunda M., Zajíčková L.,
RF Sputtering of Composite SiOx/Plasma Polymer Films and Their Basic Properties,
Surface and Coatings Technology 151 (2002) 214–217 (16× cited)

37. Klapetek P., Ohlídal I., Franta D., Pokorný P.,
Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method,
Surface and Interface Analysis 33 (2002) 559–564 (2× cited)

36. Ohlídal M., Ohlídal I., Franta D., Králík T., Jákl M., Eliáš M.,
Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method,
Surface and Interface Analysis 34 (2002) 660–663 (2× cited)

35. Franta D., Ohlídal I., Klapetek P., Pokorný P.,
Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods,
Surface and Interface Analysis 34 (2002) 759–762 (11× cited)

34. Buršíková V., Buršík J., Navrátil V., Milicka K.,
Creep behaviour of leaded brass,
Materials Science and Engineering A 324(1-2, SI) (2002) 235-238

33. Buršíková V., Janča J., Sťahel P.,
Enhancement of the material surface properties by plasma deposition of thin films at atmospheric pressure,
Czechoslovak Journal of Physics 52(D) (2002) 866-871

2001

32. Ohlídal I., Franta D., Ohlídal M., Navrátil K.,
Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances,
Applied Optics 40 (2001) 5711–5717 (4× cited)

31. Franta D., Ohlídal I., Frumar M., Jedelský J.,
Optical characterization of chalcogenide thin films,
Applied Surface Science 175–176 (2001) 555–561 (15× cited)

30. Ohlídal I., Franta D., Frumar M., Jedelský J., Navrátil K.,
Complete optical analysis of amorphous As–S chalcogenide thin films by the combined spectrophotometric method,
Journal of Optoelectronics and Advanced Materials 3 (2001) 873–878 (4× cited)

29. Janča J., Zajíčková L., Klíma M., Slavíček P.,
Diagnostics and Application of the High Frequency Plasma Pencil,
Plasma Chem. Plasma Process. 21 (2001) 565–579 (10× cited)

28. Zajíčková L., Buršíková V., Peřina V., Macková A., Subedi D., Janča J.,
Plasma Modification of Polycarbonates,
Surface and Coatings Technology 142 (2001) 449–454 (36× cited)

27. Franta D., Ohlídal I., Klapetek P., Pokorný P., Ohlídal M.,
Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy,
Surface and Interface Analysis 32 (2001) 91–94 (3× cited)

26. Zajíčková L., Veltruská K., Tsud N., Franta D.,
XPS and ellipsometric study of DLC/silicon Interface,
Vacuum 61 (2001) 269–273 (12× cited)

25. Franta D., Zajíčková L., Ohlídal I., Janča J.,
Optical characterization of diamond-like carbon films,
Vacuum 61 (2001) 279–283 (3× cited)

24. Ohlídal I., Franta D., Ohlídal M., Navrátil K.,
Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances,
Vacuum 61 (2001) 285–289

2000

23. Franta D., Ohlídal I.,
Analysis of thin films by optical multi-sample methods,
Acta Physica Slovaca 50 (2000) 411–421 (15× cited)

22. Ohlídal I., Franta D.,
Matrix formalism for imperfect thin films,
Acta Physica Slovaca 50 (2000) 489–500 (18× cited)

21. Eliáš M., Zajíčková L., Buršíková V., Janča J.,
Characterization of CNx/SiOy Films Prepared by the Inductively Coupled RF Discharge,
Czechoslovak Journal of Physics 50 (2000) 453–456

20. Eliáš M., Zajíčková L., Buršíková V., Janča J., Lorenc M.,
Deposition of Nanocomposite CNx/SiO2 Films in Inductively Coupled RF Discharge,
Diamond and Related Materials 9 (2000) 552–555 (4× cited)

19. Franta D., Ohlídal I., Klapetek P.,
Analysis of slightly rough thin films by optical methods and AFM,
Mikrochimica Acta 132 (2000) 443–447 (18× cited)

18. Franta D., Ohlídal I.,
Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry,
Surface and Interface Analysis 30 (2000) 574–579 (17× cited)

17. Pavelka R., Ohlídal I., Hlávka J., Franta D., Sitter H.,
Optical characterization of thin films with randomly rough boundaries using the photovoltage method,
Thin Solid Films 366 (2000) 43–50

16. Ohlídal I., Franta D.,
Ellipsometry of thin film systems,
Progress in Optics 41 (2000) 181-282 (42× cited)

1999

15. Zajíčková L., Buršíková V., Franta D.,
The influence of substrate emissivity on plasma enhanced CVD of diamond-like carbon films,
Czechoslovak Journal of Physics 49 (1999) 1213–1228 (18× cited)

14. Klíma M., Slavíček P., Zajíčková L., Janča J., Kuzmin S., Sulovský P.,
Plasma-Liquid Technologies for Treatment of Archaeological Artifacts,
Czechoslovak Journal of Physics 49 (1999) 321–328 (4× cited)

13. Ohlídal M., Unčovský M., Ohlídal I., Franta D.,
Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering,
Journal of Modern Optics 46 (1999) 279–293 (2× cited)

12. Janča J., Klíma M., Slavíček P., Zajíčková L.,
HF Plasma Pencil - New Source for Plasma Surface Processing,
Surface and Coatings Technology 116 (1999) 547–551 (17× cited)

11. Ohlídal I., Franta D., Pinčík E., Ohlídal M.,
Complete optical characterization of the SiO2/Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy,
Surface and Interface Analysis 28 (1999) 240–244 (12× cited)

10. Zajíčková L., Janča J., Peřina V.,
Characterization of Silicon Oxide Thin Films Deposited by Plasma Enhanced Chemical Vapour Deposition from Octamethylcyclotetrasiloxane/Oxygen Feeds,
Thin Solid Films 338 (1999) 49–59 (18× cited)

9. Franta D., Ohlídal I., Munzar D., Hora J., Navrátil K., Manfredotti C., Fizzotti F., Vittone E.,
Complete optical characterization of imperfect hydrogenated amorphous silicon layers by spectroscopic ellipsometry and spectroscopic reflectometry,
Thin Solid Films 343–344 (1999) 295–298 (5× cited)

1998

8. Franta D., Ohlídal I., Munzar D.,
Parameterisation of the model of dispersion dependences of solid state optical constants,
Acta Physica Slovaca 48 (1998) 451–458 (8× cited)

7. Ohlídal I., Franta D.,
Ellipsometry of Thin Films,
Acta Physica Slovaca 48 (1998) 459–468 (2× cited)

6. Franta D., Ohlídal I.,
Ellipsometric parameters and reflectances of thin films with slightly rough boundaries,
Journal of Modern Optics 45 (1998) 903–934 (42× cited)

5. Ohlídal I., Franta D., Hora J., Navrátil K., Weber J., Janda P.,
Analysis of thin films with slightly rough boundaries,
Mikrochimica Acta 15 (1998) 177–180 (1× cited)

4. Franta D., Ohlídal I.,
Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries,
Optics Communications 147 (1998) 349–358 (4× cited)

3. Zajíčková L., Buršíková V., Janča J.,
Protection Coatings for Polycarbonates Based on PECVD from Organosilicon Feeds,
Vacuum 50 (1998) 19–21 (20× cited)

1996

2. Zajíčková L., Ohlídal I., Janča J.,
Plasma-Enhanced Chemical Vapour Deposition of Thin Films from Tetraethoxysilane and Methanol: Optical Properties and XPS Analyses,
Thin Solid Films 280 (1996) 26–36 (10× cited)

1995

1. Ohlídal M., Ohlídal I., Druckmüller M., Franta D.,
A method of shearing interferometry for determining the statistical quantities of randomly rough surfaces of solids,
Pure and Applied Optics 4 (1995) 599–616

Articles in journals without impact factor

2009

18. Ohlídal M., Ohlídal I., Nečas D., Klapetek P.,
Complete Optical Characterization of Non-Uniform SiOx Thin Films Using Imaging Spectroscopic Reflectometry,
e-Journal of Surface Science and Nanotechnology 7 (2009) 409–412

17. Nečas D., Zajíčková L., Franta D., Sťahel P., Mikulík P., Meduňa M., Valtr M.,
Optical characterization of ultra-thin iron and iron oxide films,
e-Journal of Surface Science and Nanotechnology 7 (2009) 486–490

16. Franta D., Ohlídal I., Buršíková V., Zajíčková L.,
Modeling of dielectric response of GexSbyTez (GST) materials,
Physica Status Solidi C 6 (2009) S59–S62 (2× cited)

2008

15. Nečas D., Peřina V., Franta D., Ohlídal I., Zemek J.,
Optical characterization of non-stoichiometric silicon nitride films,
Physica Status Solidi C 5 (2008) 1320–1323

14. Franta D., Hrdlička M., Nečas D., Frumar M., Ohlídal I., Pavlišta M.,
Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films,
Physica Status Solidi C 5 (2008) 1324–1327 (4× cited)

13. Franta D., Ohlídal I., Nečas D.,
Optical quantities of rough films calculated by Rayleigh-Rice theory,
Physica Status Solidi C 5 (2008) 1395–1398 (2× cited)

12. Ohlídal I., Nečas D., Franta D.,
Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies,
Physica Status Solidi C 5 (2008) 1399–1402

2007

11. Buršíková V., Dvořák P., Zajíčková L., Franta D., Janča J., Buršík J., Sobota J., Klapetek P., Bláhová O., Peřina V.,
Deposition and characterisation of nanostructured silicon-oxide containing diamond-like carbon coatings,
Optoelectronics and Advanced Materials - Rapid Communications 1 (2007) 491–495

10. Valtr M., Klapetek P., Ohlídal I., Franta D.,
UV light enhanced oxidation of a-C:H thin film in air. A study of thickness reduction,
Optoelectronics and Advanced Materials - Rapid Communications 1 (2007) 620–624

2005

9. Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Šiler M.,
Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody,
Jemná mechanika a optika 50 (2005) 72–75

2004

8. Ohlídal I., Franta D., Frumar M., Jedelský J., Omasta J.,
Influence of composition, exposure and thermal annealing on optical properties of As–S chalcogenide thin films,
Chalcogenide Letters 1 (2004) 1–10 (18× cited)

2003

7. Ohlídal I., Klapetek P., Franta D.,
Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe,
Československý časopis pro fyziku 53 (2003) 97–100

2002

6. Klapetek P., Ohlídal I., Franta D.,
Applications of atomic force microscopy for thin film boundary measurements,
Jemná mechanika a optika 47 (2002) 195–199

2001

5. Klapetek P., Ohlídal I., Franta D.,
Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly,
Československý časopis pro fyziku 51 (2001) 16–21

4. Klapetek P., Ohlídal I., Franta D.,
Vliv diskrétní Fourierovy transformace na zpracování AFM dat,
Československý časopis pro fyziku 51 (2001) 49–51

3. Sonnenfeld A., Tun T., Zajíčková L., Kozlov A., Wagner H., Behnke J., Hippler R.,
Deposition Process Based on Organosilicon Precursors in Dielectric Barrier Discharges at Atmospheric Pressure - A Comparison,
Plasmas and Polymers 6 (2001) 237-266

1999

2. Ohlídal I., Franta D., Klapetek P., Vičar M.,
Relationship between AFM and optical measurements at analyzing surface roughness,
Jemná mechanika a optika 44 (1999) 307–311

1998

1. Ohlídal I., Ohlídal M., Franta D., Tykal M., Pražák D., Michálek A.,
Srovnání výsledků měření drsnosti povrchu dosažených vybranými optickými metodami a metodou profilometrickou,
Jemná mechanika a optika 43 (1998) 130–136

Proceedings available from ISI Web of Science

2015

9. Ohlídal M., Ohlídal I., Nečas D., Vodák J., Franta D., Nádavský P., Vižďa F.,
Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96280R

8. Franta D., Nečas D., Ohlídal I., Jankuj J.,
Wide spectral range characterization of antireflective coatings and their optimization,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96280F

7. Nečas D., Ohlídal I., Vodák J., Ohlídal M., Franta D.,
Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96280C

6. Franta D., Nečas D., Ohlídal I., Giglia A.,
Dispersion model for optical thin films applicable in wide spectral range,
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V , Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, Jena, Germany, September 7-10, 2015 (2015) 96281U

2011

5. David B., Pizurova N., Schneeweiss O., Santava E., Jašek O., Kudrle V.,
alpha-Fe nanopowder synthesised in low-pressure microwave plasma and studied by Mossbauer spectroscopy,
JOINT EUROPEAN MAGNETIC SYMPOSIA (JEMS) (2011) 384

2010

4. Muresan M., Zajíčková L., Buršíková V., Franta D., Nečas D.,
Preparation and Characterization of DLC:N Films,
NANOCON 2010, 2ND INTERNATIONAL CONFERENCE , 2nd NANOCON International Conference, Olomouc, Czech Republic, 12-14 October 2010 (2010) 434-440

3. Schneeweiss O., David B., Jašek O., Zajíčková L., Vondracek M., Zboril R., Maslan M.,
Mossbauer Effect Study of Iron Thin Films on Si/SiO(x) Substrate and Iron Phases at Deposited Carbon Nanotubes,
MOSSBAUER SPECTROSCOPY IN MATERIALS SCIENCE - 2010 (2010) 90-95

2009

2. Hubálek J., Prášek J., Prášek J., Húska D., Hruška D., Prášek J., Húska D., Adamek M., Jašek O., Adam V., Jašek O., Trnková L., Adam V., Horna A., Trnková L., Kizek R., Horna A., Kizek R.,
Modification of Working Electrode Surface with Carbon Nanotubes as an Electrochemical Sensor for Estimation of Melting Points of DNA,
PROCEEDINGS OF THE EUROSENSORS XXIII CONFERENCE (2009) 1011-1014

1. Zajíčková L., Jašek O., Synek P., Eliáš M., Kudrle V., Kadlečíková M., Breza J., Hanzlíková R.,
SYNTHESIS OF CARBON NANOTUBES IN MW PLASMA TORCH WITH DIFFERENT METHODS OF CATALYST LAYER PREPARATION AND THEIR APPLICATIONS,
NANOCON 2009, CONFERENCE PROCEEDINGS (2009) 149-155

Proceedings not available from ISI Web of Science

2014

44. Hnilica J., Kudrle V., Jašek O.,
Electrode-less plasma jet synthesis of core-shell iron/iron oxide nanoparticles,
Frontiers in Material and Life Sciences , Nanocon 2013 (2014) 6

2010

43. Buršíková V., Dvořák P., Zajíčková L., Franta D., Janča J., Buršík J., Bláhová O., Peřina V., Klapetek P.,
Mossbauer Effect Study of Iron Thin Films on Si/SiO(x) Substrate and Iron Phases at Deposited Carbon Nanotubes,
MOSSBAUER SPECTROSCOPY IN MATERIALS SCIENCE - 2010 (2010) 90-95

42. Sládek P., Buršíková V., Sťahel P.,
Structural and defect changes of hydrogenated SiGe films due to annealing up to 600 degrees C,
PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7 NO 3-4 (2010) 820-823

41. Buršík J., Sopousek J., Zalesak J., Buršíková V.,
ANALYTICAL ELECTRON MICROSCOPY OF LEAD-FREE NANOPOWDER SOLDERS,
NANOCON 2010, 2ND INTERNATIONAL CONFERENCE (2010) 336-339

2009

40. Franta D., Nečas D., Frumar M.,
Modeling of dielectric response of Ge(x)Sb(y)Te(z) (GST) materials,
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 6, SUPPL 1 (2009) S59-S62

39. Ohlídal M., Ohlídal I., Klapetek P., Nečas D.,
PRECISE MEASUREMENT OF THICKNESS DISTRIBUTION OF NONUNIFORM THIN FILMS BY IMAGING SPECTROSCOPIC REFLECTOMETRY,
XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS (2009) 100-105

2008

38. Buršíková V., Peřina V., Sobota J., Klapetek P., Dvořák P., Buršík J., Franta D.,
Deposition of Nanostructured Diamond-Like Carbon Films in Dual Frequency Capacitive Discharge,
Proceedings of 19th Europhysics Conference on the Atomic and Molecular Physics of Ionized Gases (2008)

37. Zajíčková L., Kučerová Z., Franta D., Buršíková V., Peřina V., Macková A.,
Composition and functional properties of organosilicon plasma polymers from hexamethyldisiloxane and octamethylcyclotetrasiloxane,
Proceedings of Organic/Inorganic Hybrid Materials, MRS (2008) 159-164

2007

36. Kučerová Z., Zajíčková L., Eliáš M., Jašek O., Matějková J., Buršík J.,
Treatment of Catalytic Iron Layer for Carbon Nanotube Growth in Microwave Plasma Torch,
Proceedings of 16th Symposium on Applicaction of Plasma Processes (2007) 209-210

35. Šmíd R., Zajíčková L., Granier A.,
Comparison of Planar and Cylindrical Langmuir Probe Measurements in Low Pressure RF Helicon Reactor,
Proceedings of 16th Symposium on Applicaction of Plasma Processes (2007) 259-260

34. Šíra M., Buršíková V., Franta D., Trunec D.,
Deposition and analysis of thin films produced in atmospheric pressure glow discharge,
Proceedings of XXVIII International Conference on Phenomena in Ionized Gases (2007) 713-716

33. Klapetek P., Buršíková V., Valtr M.,
Scanning probe microscopy analysis of delaminated thin films,
PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY (2007) 576-581

2006

32. Buršíková V., Ray N., Bláhová O., Jašek O., Frgala Z., Zajíčková L., Franta D., Buršík J., Klapetek P.,
Study of Mechnical Properties of Diamon-like Carbon and Nanocomposite Diamond Coatings Prepared by Several Different Deposition Techniques,
Proceedings of International Workshop on the Application of Nanocrystalline Diamond and Diamond Like Carbon Materials (2006) 27-37

31. Buršíková V., Dvořák P., Zajíčková L., Franta D., Janča J., Buršík J., Bláhová O., Peřina V., Klapetek P.,
Silicon-oxide Containing Diamond-like Carbon Coatings Prepared Using Plasma Enhanced Chemical Vapor Deposition,
Proceedings of International Workshop on the Application of Nanocrystalline Diamond and Diamond Like Carbon Materials (2006) 311-315

30. Franta D., Nečas D., Zajíčková L., Buršíková V.,
Modeling of DLC Optical Properties Based on Parameterization of Density of States,
Proceedings of International Workshop on the Application of Nanocrystalline Diamond and Diamond Like Carbon Materials (2006) 39-50

29. Ficek R., Vrba R., Kim B., Goodnick S., Milicic S., Kučerová Z., Zajíčková L., Eliáš M.,
Carbon nanotubes synthesized by plasma enhanced CVD: Preparation for measurements of their electrical properties for application in pressure sensor,
2006 International Symposium on Communications and Information Technologies,Vols 1-3 (2006) 42-45

2005

28. Jašek O., Eliáš M., Bublan M., Kudrle V., Zajíčková L., Matějková J., Rek A., Buršík J.,
Plasma Enhanced CVD of Carbon Nanotubes in Atmospheric Pressure Microwave Torch,
Proceedings of 15th Symposium on Application of Plasma Processes and 3rd EU–Japan Joint Symposium on Plasma Processing (2005) 187-188

27. Kučerová Z., Buršíková V., Peřina V., Franta D., Zajíčková L., Čech J., Franclová J.,
Influence of the Temperature on Properties of Plasma Polymerized Organosilicon Coatings,
Proceedings of 15th Symposium on Application of Plasma Processes and 3rd EU–Japan Joint Symposium on Plasma Processing (2005) 197-198

26. Zajíčková L., Ptasinska S., Cingel M., Matejčík Š.,
Study of Electron Impact Ionization and Electron Attachment to HMDSO,
Proceedings of 15th Symposium on Application of Plasma Processes and 3rd EU–Japan Joint Symposium on Plasma Processing (2005) 263-264

25. Zajíčková L., Wagner N., Cordill M., Heberlein J., Peřina V., Macková A., Gerberich W.,
Thermal Plasma Enhanced Chemical Vapor Deposition of Silicon Nitride Based Hard Coatings,
Proceedings of 15th Symposium on Application of Plasma Processes and 3rd EU–Japan Joint Symposium on Plasma Processing (2005) 265-266

24. Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Klapetek P., Jákl M.,
Optical measurement of mechanical stresses in diamond-like carbon films,
Proceedings of 8-th International Symposium on Laser Metrology, SPIE (2005) 717-728

23. Franta D., Ohlídal I.,
Characterization of optical thin films exhibiting defects,
Proceedings of Advances in Optical Thin Films II, SPIE (2005) 59632H

22. Ohlídal I., Franta D., Klapetek P.,
Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly,
Proceedings of Kvalita a GPS 2005 (2005) 131-139

21. Ohlídal I., Franta D., Klapetek P.,
Ellipsometry in characterization of thin films,
Proceedings of Solar Renewable Energy News (2005) 81-111

20. Wagner N., Cordill M., Zajíčková L., Gerberich W., Heberlein J.,
Thermal plasma chemical vapor deposition of superhard nanostructured Si-C-N coatings,
Thin Films Stresses and Mechanical Properties XI (2005) 69-74

2004

19. Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Šiler M.,
Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O,
Proceedings of Advances in Thin Film Coatings for Optical Applications, SPIE (2004) 139-147 (2× cited)

2003

18. Eliáš M., Janča J., Žíla J., Brožek V.,
Optical Diagnostics of ICP Discharge During Synthesis of Tungsten Carbide,
Proceedings of 14th Symposium on Application of Plasma Processes , 14th Symposium on Application of Plasma Processes (2003) 116-117

17. Zajíčková L., Buršíková V., Deepak P., Veltruská K., Janča J.,
Study of Plasma Treatment of Polycarbonate Substrate and Its Effect on Film Deposition,
Proceedings of 14th Symposium on Application of Plasma Processes , 14th Symposium on Application of Plasma Processes (2003) 136-139

16. Franta D., Ohlídal I., Klapetek P., Montaigne-Ramil A., Bonanni A., Stifter D., Stifter H.,
Optical characterization of ZnSe thin films,
Proceedings of 19th Congress of the International Commission for Optics: Optics for the Quality of Life, SPIE , 19th Congress of the International Commission for Optics: Optics for the Quality of Life, SPIE (2003) 831-832

2001

15. Franta D., Buršíková V., Zajíčková L.,
Optical characterization of DLC:Si films prepared by PECVD,
Proceedings of 13th Symposium on Application of Plasma Processes , 13th Symposium on Application of Plasma Processes (2001) 87-88

14. Klapetek P., Franta D., Ohlídal I.,
Study of Thin Film Defects by Atomic Force Microscopy,
Proceedings of 5th Seminar on Quantitative Microscopy, PTB-Bericht , 5th Seminar on Quantitative Microscopy, PTB-Bericht (2001) 107-117

13. Franta D., Ohlídal I.,
Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation,
Proceedings of 12th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE , 12th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE (2001) 207-212 (1× cited)

2000

12. Ohlídal I., Franta D., Klapetek P.,
Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films,
Proceedings of 4th Seminar on Quantitative Microscopy, PTB-Bericht , 4th Seminar on Quantitative Microscopy, PTB-Bericht (2000) 124-131

1999

11. Ohlídal I., Ohlídal M., Franta D., Tykal M.,
Comparison of optical and non-optical methods for measuring surface roughness,
Proceedings of 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE , 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, SPIE (1999) 456–467

10. Franta D., Zajíčková L.,
Characterisation of DLC Films Prepared by PECVD,
Proceedings of 12th Symposium on Application of Plasma Processes , 2th Symposium on Application of Plasma Processes (1999) 158–159

9. Janča J., Klíma M., Slavíček P., Zajíčková L.,
On the hollow electrode HF plasma pencil,
Proceedings of 24th International Conference on Phenomena in Ionized Gases , 24th International Conference on Phenomena in Ionized Gases (1999) 177-178

8. Zajíčková L., Eliáš M., Buršíková V., Janča J., Lorenz M.,
Deposition of CNx films in inductively coupled RF discharge,
Proceedings of 24th International Conference on Phenomena in Ionized Gases , 24th International Conference on Phenomena in Ionized Gases (1999) 41-42

7. Klíma M., Janča J., Slavíček P., Kuzmin S., Vaculík R., Zajíčková L.,
DC, AC and HF plasma pencil - New possibilities for plasma surface and liquid treatment at atmospheric pressure,
Proceedings of 5th International Thermal Plasma Processing Conference , 5th International Thermal Plasma Processing Conference (1999) 487–492

1998

6. Ohlídal I., Ohlídal M., Franta D., Vičar M., Klapetek P.,
Comparison of AFM and optical methods at measuring nanometric surface roughness,
Proceedings of 3th Seminar on Quantitative Microscopy , 3th Seminar on Quantitative Microscopy (1998) 123–129

1997

5. Ohlídal I., Franta D., Rezek B., Ohlídal M.,
Analysis of single layers placed on slightly rough surfaces by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy,
Proceedings of 7th European Conference on Applications of Surface and Interface Analysis , 7th European Conference on Applications of Surface and Interface Analysis (1997) 1051–1054

1996

4. Franta D., Ohlídal I., Hora J., Navrátil K.,
Spektroskopická elipsometrie slabě drsných povrchů,
Proceedings of 12. konference českých a slovenských fyziků , Proceedings of 12. konference českých a slovenských fyziků (1996) 482-485

3. Ohlídal I., Franta D., Hora J.,
Spectroscopic Ellipsometry of Slightly Rough Surfaces Covered by Layers,
Proceedings of 6th European Conference on Applications of Surface and Interface Analysis , 6th European Conference on Applications of Surface and Interface Analysis (1996) 823-826

2. Ohlídal M., Ohlídal I., Franta D., Michálek A.,
Method of shearing interferometry for characterizing non-gaussian randomly rough surfaces,
Proceedings of Specification, Production, and Testing of Optical Components and Systems , Specification, Production, and Testing of Optical Components and Systems (1996) 442–451

1995

1. Ohlídal M., Ohlídal I., Druckmüller M., Franta D.,
Interferometry of Randomly Rough Surfaces,
Proceedings of Photonics '95 , Proceedings of Photonics '95 (1995) 109-111