Notice: Undefined variable: jid in /home/publications/web/journal.php on line 140 Publications in Applied Surface Science
Main page | Journal list | Log-in

Publications in Applied Surface Science

This journal was preceded by


This journal was succeeded by

Astronomy and Astrophysics
Applied Optics
Applied Physics A: Materials Science and Processing
Acta Physica Polonica A
Review of Scientific Instruments
Acta Physica Slovaca
Diamond and Related Materials
Journal of Applied Physics
Journal of Optics A: Pure and Applied Optics
Journal of Physics and Chemistry of Solids
Journal of Physics D: Applied Physics
Optics Communications
Optics Express
Plasma Chemistry and Plasma Processing
Plasma Physics and Controlled Fusion
Physical Review B
Spectrochimica Acta Part B: Atomic Spectroscopy
Surface Science
Thin Solid Films
Journal of the Optical Society of America A
Advanced Materials Research
Nuclear Instruments and Methods in Physics Research Section B - Beam Interactions Materials and Atoms
Journal of Ceramic Processing Research
Journal of Alloys and Compounds
Materials Letters
International Journal of Hydrogen Energy
Tekstil ve Konfeksiyon
Materials & Design
Polimeri: Plastics and Rubber Journal
Progress in organic coatings
Revista Mexicana de Fisica
Nanoscale Research Letters
Journal Of Electrical Engineering-Elektrotechnicky Casopis
Journal of Applied Polymer Science
Materials Chemistry and Physics
Solar Energy
Materials Research Bulletin
Journal of Nano Research
Journal of Colloid and Interface Science
Ceramics International
Journal of the Electrochemical Society
European Physical Journal-Applied Physics
IEEE Transactions on Plasma Science
Journal of Micromechanics and Microengineering
Indian Journal of Pure & Applied Physics
Metallurgical and Materials Transactions A-Physical Metallurgy and Materials Science
Tribology International
Tribology Letters
Journal of Physical Chemistry A
Journal of Luminescence
Materials Science-Medziagotyra
Rapid Communications in Mass Spectrometry
Nuclear Instruments & Methods in Physics Reserch Section A-Accelerators Spectrometers Detectors and Associated Equipment
Materials Characterization
International Materials Reviews
International Journal of Surface Science and Engineering
Journal of Tribology-Transactions of the ASME
Brazilian Journal of Physics
High Temperature Material Processes
ACS Applied Materials & Interfaces
Optical Materials
Przemysl Chemiczny
European Physical Journal D
Physics of Plasmas
Collection of Czechoslovak Chemical Communications
Bulletin of Materials Science
Journal of Vacuum Science & Technology B
Thermochimica Acta
Journal of Biomedical Materials Research Part A
Korean Journal of Chemical Engineering
Radiation Physics and Chemistry
Advances in Polymer Technology
Contribution to Plasma Physics
Surface Engineering
Journal of Physics: Conference Series
Central European Journal of Physics
Colloid and Polymer Science
Science of Sintering
Computational Materials Science
Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy
International Journal of Electrochemical Science
Journal of Materials Chemistry
Progress in Optics
Optical Materials Express
IEEE Sensors Journal
An Official Journal of the American Association of Pharmaceutical Scientists
Advanced Optical Materials
AAPS PharmSciTech
RSC Advances
Plasma Science & Technology
ECS Journal of Solid State Science and Technology
Optics Letters


Ohlídal I., Franta D., Nečas D.,
Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness,
Applied Surface Science Vol. 421 (2017) 687-696

Vodák J, Nečas D., Pavliňák D, Macák J, Řičica T, Jambor R, Ohlídal M,
Application of imaging spectroscopic reflectometry for characterization of Au reduction from organometallic compound by means of plasma jet technology,
Applied Surface Science Vol. 396 (2017) 284-290

Ohlídal I., Vohánka J., Čermák M., Franta D.,
Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory,
Applied Surface Science Vol. 419 (2017) 942-956

Franta D., Dubroka A, Wang C, Giglia A, Vohánka J., Franta P, Ohlídal I.,
Temperature-dependent dispersion model of float zone crystalline silicon,
Applied Surface Science Vol. 421 (2017) 405-419

Manakhov A., Michlíček M., Felten A, Pireaux J, Nečas D., Zajíčková L.,
XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach,
Applied Surface Science Vol. 394 (2017) 578-585

Franta D., Kotilainen M, Krumpolec R, Ohlídal I.,
Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry,
Applied Surface Science Vol. 421 (2017) 420-423

Franta D., Nečas D., Giglia A, Franta P, Ohlídal I.,
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride,
Applied Surface Science Vol. 421 (2017) 424-429


Manakhov A., Makhneva E., Skládal P, Nečas D., Čechal J, Kalina L, Eliáš M., Zajíčková L.,
The robust bio-immobilization based on pulsed plasma polymerization of cyclopropylamine and glutaraldehyde coupling chemistry,
Applied Surface Science Vol. 360 Part A (2016) 28-36


Nečas D., Vodák J, Ohlídal I., Ohlídal M, Majumdar A, Zajíčková L.,
Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry,
Applied Surface Science Vol. 350 (2015) 149-155


Galca A, Stancu V, Husanu M, Dragoi C, Gheorghe N, Trupina L, Enculescu M, Vasile E,
Substrate-target distance dependence of structural and optical properties in case of Pb(Zr,Ti)O-3 films obtained by pulsed laser deposition,
Applied Surface Science Vol. 257 14 (2011) 5938-5943

Peng T, Xiao X, Han X, Zhou X, Wu W, Ren F, Jiang C,
Characterization of DC reactive magnetron sputtered NiO films using spectroscopic ellipsometry,
Applied Surface Science Vol. 257 13 (2011) 5908-5912

Choudhury A, Barve S, Chutia J, Pal A, Kishore R, Jagannath J, Pande M, Patil D,
RF-PACVD of water repellent and protective HMDSO coatings on bell metal surfaces: Correlation between discharge parameters and film properties,
Applied Surface Science Vol. 257 20 (2011) 8469-8477


Klapetek P, Valtr M, Poruba A, Nečas D., Ohlídal M,
Rough surface scattering simulations using graphics cards,
Applied Surface Science Vol. 256 18 (2010) 5640-5643

Shearer J, Fisher M, Hoogeland D, Fisher E,
Composite SiO2/TiO2 and amine polymer/TiO2 nanoparticles produced using plasma-enhanced chemical vapor deposition,
Applied Surface Science Vol. 256 (2010) 2081–2091

Shearer J, Fisher M, Hoogel H, Fisher E,
Composite SiO2/TiO2 and amine polymer/TiO2 nanoparticles produced using plasma-enhanced chemical vapor deposition,
Applied Surface Science Vol. 256 7 (2010) 2081-2091

Fukaya Y, Yanase T, Kubota Y, Imai S, Matsumoto T, Kobayashi H,
Low temperature fabrication of 5-10 nm SiO2/Si structure using advanced nitric acid oxidation of silicon (NAOS) method,
Applied Surface Science Vol. 256 18 (2010) 5610-5613


Zajíčková L., Synek P., Jašek O., Eliáš M., David B, Buršík J, Pizurova N, Hanzlíková R, Lazar L,
Synthesis of Carbon Nanotubes and Iron Oxide Nanoparticles in MW Plasma Torch with Fe(CO)5 in Gas Feed,
Applied Surface Science Vol. 255 (2009) 5421–5424

Fang Z, Hao L, Yang H, Xie X, Qiu Y, Edmund K,
Polytetrafluoroethylene surface modification by filamentary and homogeneous dielectric barrier discharges in air,
Applied Surface Science Vol. 255 16 (2009) 7279-7285


Mistrík J, Ohlídal I., Antoš R, Aoyama M, Yamaguchi T,
Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films,
Applied Surface Science Vol. 244 (2005) 51–54

Mistrík J, Yamaguchi T, Franta D., Ohlídal I., Hu G, Dai N,
Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry,
Applied Surface Science Vol. 244 (2005) 431–434

Franta D., Negulescu B, Thomas L, Dahoo P, Guyot M, Ohlídal I., Mistrík J, Yamaguchi T,
Optical properties of NiO thin films prepared by pulsed laser deposition technique,
Applied Surface Science Vol. 244 (2005) 426–430

Franta D., Ohlídal I., Mistrík J, Yamaguchi T, Hu G, Dai N,
Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions,
Applied Surface Science Vol. 244 (2005) 338–342

Antoš R, Ohlídal I., Mistrík J, Murakami K, Yamaguchi T, Pištora J, Horie M, Višňovský ,
Spectroscopic ellipsometry on lamellar gratings,
Applied Surface Science Vol. 244 (2005) 225–229

Antoš R, Ohlídal I., Franta D., Klapetek P, Mistrík J, Yamaguchi T, Višňovský ,
Spectroscopic ellipsometry of sinusoidal surface-relief gratings,
Applied Surface Science Vol. 244 (2005) 221–224


Franta D., Ohlídal I., Frumar M, Jedelský J,
Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model,
Applied Surface Science Vol. 212–213 (2003) 116–121


Franta D., Ohlídal I., Frumar M, Jedelský J,
Optical characterization of chalcogenide thin films,
Applied Surface Science Vol. 175–176 (2001) 555–561

Postava K, Sueki H, Aoyama M, Yamaguchi T, Murakami K, Igasaki Y,
Doping effects on optical properties of epitaxial ZnO layers determined by spectroscopic ellipsometry,
Applied Surface Science Vol. 175 (2001) 543–548


Ohlídal I., Lukeš F,
Analysis of semiconductor surfaces with very thin native oxide layers by combined immersion and multiple angle of incidence ellipsometry,
Applied Surface Science Vol. 35 (1988) 259–273