Publications in Applied Surface Science
2024
Navascués P, Buchtelová M, Zajíčková L., Rupper P, Hegemann D,Polymerization mechanisms of hexamethyldisiloxane in low-pressure plasmas involving complex geometries,
Applied Surface Science Vol. 645 (2024) 158824
2023
Gómez J., Sulleiro M, Pizúrová N, Bednařík A, Lepcio P, Holec D, Preisler J, Zajíčková L.,Spontaneous formation of carbon dots helps to distinguish molecular fluorophores species,
Applied Surface Science Vol. 610 (2023) 155536
2022
Kovač J, Ekar J, Čekada M, Zajíčková L., Nečas D., Blahová L., Yong Wang J, Mozetič M,Depth profiling of thin plasma-polymerized amine films using GDOES in an Ar-O2 plasma,
Applied Surface Science Vol. 581 (2022) 152292
2021
Michlíček M., Blahová L., Dvořáková E, Nečas D., Zajíčková L.,Deposition Penetration Depth and Sticking Probability in Plasma Polymerization of Cyclopropylamine,
Applied Surface Science Vol. 540 (2021) 147979
2020
Vohánka J., Šustek , Buršíková V., Šklíbová V, Šulc V, Homola V, Franta D., Čermák M., Ohlídal M, Ohlídal I.,Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry,
Applied Surface Science Vol. 534 (2020) 147625
Ondračka P., Nečas D., Carette M, Elisabeth S, Holec D, Granier A, Goullet A, Zajíčková L., Richard-Plouet M,
Unravelling local environments in mixed TiO2–SiO2 thin films by XPS and ab initio calculations,
Applied Surface Science Vol. 510 (2020) 145056
2019
Manakhov A., Permyakova E, Ershov S, Sheveyko A, Kovalskii A, Polčák J, Zhitnyak I, Gloushankova N, Zajíčková L., Shtansky D,Bioactive TiCaPCON-coated PCL nanofibers as a promising material for bone tissue engineering,
Applied Surface Science Vol. 479 (2019) 796-802
Michlíček M., Manakhov A., Dvořáková E, Zajíčková L.,
Homogeneity and Penetration Depth of Atmospheric Pressure Plasma Polymerization onto Electrospun Nanofibrous Mats,
Applied Surface Science Vol. 471 (2019) 835–841
2018
Manakhov A., Kiryukhantsev-Korneev P, Michlíček M., Permyakova E, Dvořáková E, Polčák J, Popov Z, Visotin M, Shtansky D,Grafting of carboxyl groups using CO2/C2H4/Ar pulsed plasma: Theoretical modeling and XPS derivatization,
Applied Surface Science Vol. 435 (2018) 1220-1227
2017
Franta D., Nečas D., Giglia A, Franta P, Ohlídal I.,Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride,
Applied Surface Science Vol. 421 (2017) 424-429
Ohlídal I., Franta D., Nečas D.,
Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness,
Applied Surface Science Vol. 421 (2017) 687-696
Vodák J, Nečas D., Pavliňák D, Macák J, Řičica T, Jambor R, Ohlídal M,
Application of imaging spectroscopic reflectometry for characterization of Au reduction from organometallic compound by means of plasma jet technology,
Applied Surface Science Vol. 396 (2017) 284-290
Manakhov A., Čechal J, Michlíček M., Shtansky D,
Determination of NH2 concentration on 3-aminopropyl tri-ethoxy silane layers and cyclopropylamine plasma polymers by liquid-phase derivatization with 5-iodo 2-furaldehyde,
Applied Surface Science Vol. 414 (2017) 390-397
Manakhov A., Michlíček M., Felten A, Pireaux J, Nečas D., Zajíčková L.,
XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach,
Applied Surface Science Vol. 394 (2017) 578-585
Ohlídal I., Vohánka J., Čermák M., Franta D.,
Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory,
Applied Surface Science Vol. 419 (2017) 942-956
Franta D., Dubroka A, Wang C, Giglia A, Vohánka J., Franta P, Ohlídal I.,
Temperature-dependent dispersion model of float zone crystalline silicon,
Applied Surface Science Vol. 421 (2017) 405-419
Manakhov A., Michlíček M., Felten A, Pireaux J, Nečas D., Zajíčková L.,
XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach,
Applied Surface Science Vol. 394 (2017) 578-585
Franta D., Kotilainen M, Krumpolec R, Ohlídal I.,
Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry,
Applied Surface Science Vol. 421 (2017) 420-423
2016
Manakhov A., Makhneva E., Skládal P, Nečas D., Čechal J, Kalina L, Eliáš M., Zajíčková L.,The robust bio-immobilization based on pulsed plasma polymerization of cyclopropylamine and glutaraldehyde coupling chemistry,
Applied Surface Science Vol. 360 Part A (2016) 28-36
2015
Nečas D., Vodák J, Ohlídal I., Ohlídal M, Majumdar A, Zajíčková L.,Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry,
Applied Surface Science Vol. 350 (2015) 149-155
2011
Choudhury A, Barve S, Chutia J, Pal A, Kishore R, Jagannath J, Pande M, Patil D,RF-PACVD of water repellent and protective HMDSO coatings on bell metal surfaces: Correlation between discharge parameters and film properties,
Applied Surface Science Vol. 257 20 (2011) 8469-8477
Galca A, Stancu V, Husanu M, Dragoi C, Gheorghe N, Trupina L, Enculescu M, Vasile E,
Substrate-target distance dependence of structural and optical properties in case of Pb(Zr,Ti)O-3 films obtained by pulsed laser deposition,
Applied Surface Science Vol. 257 14 (2011) 5938-5943
Peng T, Xiao X, Han X, Zhou X, Wu W, Ren F, Jiang C,
Characterization of DC reactive magnetron sputtered NiO films using spectroscopic ellipsometry,
Applied Surface Science Vol. 257 13 (2011) 5908-5912
2010
Shearer J, Fisher M, Hoogel H, Fisher E,Composite SiO2/TiO2 and amine polymer/TiO2 nanoparticles produced using plasma-enhanced chemical vapor deposition,
Applied Surface Science Vol. 256 7 (2010) 2081-2091
Fukaya Y, Yanase T, Kubota Y, Imai S, Matsumoto T, Kobayashi H,
Low temperature fabrication of 5-10 nm SiO2/Si structure using advanced nitric acid oxidation of silicon (NAOS) method,
Applied Surface Science Vol. 256 18 (2010) 5610-5613
Klapetek P, Valtr M, Poruba A, Nečas D., Ohlídal M,
Rough surface scattering simulations using graphics cards,
Applied Surface Science Vol. 256 18 (2010) 5640-5643
Shearer J, Fisher M, Hoogeland D, Fisher E,
Composite SiO2/TiO2 and amine polymer/TiO2 nanoparticles produced using plasma-enhanced chemical vapor deposition,
Applied Surface Science Vol. 256 (2010) 2081–2091
2009
Fang Z, Hao L, Yang H, Xie X, Qiu Y, Edmund K,Polytetrafluoroethylene surface modification by filamentary and homogeneous dielectric barrier discharges in air,
Applied Surface Science Vol. 255 16 (2009) 7279-7285
Zajíčková L., Synek P., Jašek O., Eliáš M., David B, Buršík J, Pizúrová N, Hanzlíková R, Lazar L,
Synthesis of Carbon Nanotubes and Iron Oxide Nanoparticles in MW Plasma Torch with Fe(CO)5 in Gas Feed,
Applied Surface Science Vol. 255 (2009) 5421–5424
2005
Franta D., Negulescu B, Thomas L, Dahoo P, Guyot M, Ohlídal I., Mistrík J, Yamaguchi T,Optical properties of NiO thin films prepared by pulsed laser deposition technique,
Applied Surface Science Vol. 244 (2005) 426–430
Franta D., Ohlídal I., Mistrík J, Yamaguchi T, Hu G, Dai N,
Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions,
Applied Surface Science Vol. 244 (2005) 338–342
Antoš R, Ohlídal I., Mistrík J, Murakami K, Yamaguchi T, Pištora J, Horie M, Višňovský ,
Spectroscopic ellipsometry on lamellar gratings,
Applied Surface Science Vol. 244 (2005) 225–229
Antoš R, Ohlídal I., Franta D., Klapetek P, Mistrík J, Yamaguchi T, Višňovský ,
Spectroscopic ellipsometry of sinusoidal surface-relief gratings,
Applied Surface Science Vol. 244 (2005) 221–224
Mistrík J, Ohlídal I., Antoš R, Aoyama M, Yamaguchi T,
Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films,
Applied Surface Science Vol. 244 (2005) 51–54
Mistrík J, Yamaguchi T, Franta D., Ohlídal I., Hu G, Dai N,
Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry,
Applied Surface Science Vol. 244 (2005) 431–434
2003
Franta D., Ohlídal I., Frumar M, Jedelský J,Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model,
Applied Surface Science Vol. 212–213 (2003) 116–121
2001
Franta D., Ohlídal I., Frumar M, Jedelský J,Optical characterization of chalcogenide thin films,
Applied Surface Science Vol. 175–176 (2001) 555–561
Postava K, Sueki H, Aoyama M, Yamaguchi T, Murakami K, Igasaki Y,
Doping effects on optical properties of epitaxial ZnO layers determined by spectroscopic ellipsometry,
Applied Surface Science Vol. 175 (2001) 543–548
1988
Ohlídal I., Lukeš F,Analysis of semiconductor surfaces with very thin native oxide layers by combined immersion and multiple angle of incidence ellipsometry,
Applied Surface Science Vol. 35 (1988) 259–273