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Publications in Applied Surface Science

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2022

Gómez J., Sulleiro M, Pizúrová N, Bednařík A, Lepcio P, Holec D, Preisler J, Zajíčková L.,
Spontaneous formation of carbon dots helps to distinguish molecular fluorophores species,
Applied Surface Science Vol. 610 (2022) 155536

Kovač J, Ekar J, Čekada M, Zajíčková L., Nečas D., Blahová L., Yong Wang J, Mozetič M,
Depth profiling of thin plasma-polymerized amine films using GDOES in an Ar-O2 plasma,
Applied Surface Science Vol. 581 (2022) 152292

2021

Michlíček M., Blahová L., Dvořáková E, Nečas D., Zajíčková L.,
Deposition Penetration Depth and Sticking Probability in Plasma Polymerization of Cyclopropylamine,
Applied Surface Science Vol. 540 (2021) 147979

2020

Ondračka P., Nečas D., Carette M, Elisabeth S, Holec D, Granier A, Goullet A, Zajíčková L., Richard-Plouet M,
Unravelling local environments in mixed TiO2–SiO2 thin films by XPS and ab initio calculations,
Applied Surface Science Vol. 510 (2020) 145056

Vohánka J., Šustek , Buršíková V., Šklíbová V, Šulc V, Homola V, Franta D., Čermák M., Ohlídal M, Ohlídal I.,
Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry,
Applied Surface Science Vol. 534 (2020) 147625

2019

Manakhov A., Permyakova E, Ershov S, Sheveyko A, Kovalskii A, Polčák J, Zhitnyak I, Gloushankova N, Zajíčková L., Shtansky D,
Bioactive TiCaPCON-coated PCL nanofibers as a promising material for bone tissue engineering,
Applied Surface Science Vol. 479 (2019) 796-802

Michlíček M., Manakhov A., Dvořáková E, Zajíčková L.,
Homogeneity and Penetration Depth of Atmospheric Pressure Plasma Polymerization onto Electrospun Nanofibrous Mats,
Applied Surface Science Vol. 471 (2019) 835–841

2018

Manakhov A., Kiryukhantsev-Korneev P, Michlíček M., Permyakova E, Dvořáková E, Polčák J, Popov Z, Visotin M, Shtansky D,
Grafting of carboxyl groups using CO2/C2H4/Ar pulsed plasma: Theoretical modeling and XPS derivatization,
Applied Surface Science Vol. 435 (2018) 1220-1227

2017

Ohlídal I., Franta D., Nečas D.,
Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness,
Applied Surface Science Vol. 421 (2017) 687-696

Vodák J, Nečas D., Pavliňák D, Macák J, Řičica T, Jambor R, Ohlídal M,
Application of imaging spectroscopic reflectometry for characterization of Au reduction from organometallic compound by means of plasma jet technology,
Applied Surface Science Vol. 396 (2017) 284-290

Manakhov A., Čechal J, Michlíček M., Shtansky D,
Determination of NH2 concentration on 3-aminopropyl tri-ethoxy silane layers and cyclopropylamine plasma polymers by liquid-phase derivatization with 5-iodo 2-furaldehyde,
Applied Surface Science Vol. 414 (2017) 390-397

Manakhov A., Michlíček M., Felten A, Pireaux J, Nečas D., Zajíčková L.,
XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach,
Applied Surface Science Vol. 394 (2017) 578-585

Ohlídal I., Vohánka J., Čermák M., Franta D.,
Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory,
Applied Surface Science Vol. 419 (2017) 942-956

Franta D., Dubroka A, Wang C, Giglia A, Vohánka J., Franta P, Ohlídal I.,
Temperature-dependent dispersion model of float zone crystalline silicon,
Applied Surface Science Vol. 421 (2017) 405-419

Manakhov A., Michlíček M., Felten A, Pireaux J, Nečas D., Zajíčková L.,
XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach,
Applied Surface Science Vol. 394 (2017) 578-585

Franta D., Kotilainen M, Krumpolec R, Ohlídal I.,
Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry,
Applied Surface Science Vol. 421 (2017) 420-423

Franta D., Nečas D., Giglia A, Franta P, Ohlídal I.,
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride,
Applied Surface Science Vol. 421 (2017) 424-429

2016

Manakhov A., Makhneva E., Skládal P, Nečas D., Čechal J, Kalina L, Eliáš M., Zajíčková L.,
The robust bio-immobilization based on pulsed plasma polymerization of cyclopropylamine and glutaraldehyde coupling chemistry,
Applied Surface Science Vol. 360 Part A (2016) 28-36

2015

Nečas D., Vodák J, Ohlídal I., Ohlídal M, Majumdar A, Zajíčková L.,
Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry,
Applied Surface Science Vol. 350 (2015) 149-155

2011

Galca A, Stancu V, Husanu M, Dragoi C, Gheorghe N, Trupina L, Enculescu M, Vasile E,
Substrate-target distance dependence of structural and optical properties in case of Pb(Zr,Ti)O-3 films obtained by pulsed laser deposition,
Applied Surface Science Vol. 257 14 (2011) 5938-5943

Peng T, Xiao X, Han X, Zhou X, Wu W, Ren F, Jiang C,
Characterization of DC reactive magnetron sputtered NiO films using spectroscopic ellipsometry,
Applied Surface Science Vol. 257 13 (2011) 5908-5912

Choudhury A, Barve S, Chutia J, Pal A, Kishore R, Jagannath J, Pande M, Patil D,
RF-PACVD of water repellent and protective HMDSO coatings on bell metal surfaces: Correlation between discharge parameters and film properties,
Applied Surface Science Vol. 257 20 (2011) 8469-8477

2010

Shearer J, Fisher M, Hoogel H, Fisher E,
Composite SiO2/TiO2 and amine polymer/TiO2 nanoparticles produced using plasma-enhanced chemical vapor deposition,
Applied Surface Science Vol. 256 7 (2010) 2081-2091

Fukaya Y, Yanase T, Kubota Y, Imai S, Matsumoto T, Kobayashi H,
Low temperature fabrication of 5-10 nm SiO2/Si structure using advanced nitric acid oxidation of silicon (NAOS) method,
Applied Surface Science Vol. 256 18 (2010) 5610-5613

Klapetek P, Valtr M, Poruba A, Nečas D., Ohlídal M,
Rough surface scattering simulations using graphics cards,
Applied Surface Science Vol. 256 18 (2010) 5640-5643

Shearer J, Fisher M, Hoogeland D, Fisher E,
Composite SiO2/TiO2 and amine polymer/TiO2 nanoparticles produced using plasma-enhanced chemical vapor deposition,
Applied Surface Science Vol. 256 (2010) 2081–2091

2009

Zajíčková L., Synek P., Jašek O., Eliáš M., David B, Buršík J, Pizúrová N, Hanzlíková R, Lazar L,
Synthesis of Carbon Nanotubes and Iron Oxide Nanoparticles in MW Plasma Torch with Fe(CO)5 in Gas Feed,
Applied Surface Science Vol. 255 (2009) 5421–5424

Fang Z, Hao L, Yang H, Xie X, Qiu Y, Edmund K,
Polytetrafluoroethylene surface modification by filamentary and homogeneous dielectric barrier discharges in air,
Applied Surface Science Vol. 255 16 (2009) 7279-7285

2005

Mistrík J, Ohlídal I., Antoš R, Aoyama M, Yamaguchi T,
Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films,
Applied Surface Science Vol. 244 (2005) 51–54

Mistrík J, Yamaguchi T, Franta D., Ohlídal I., Hu G, Dai N,
Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry,
Applied Surface Science Vol. 244 (2005) 431–434

Franta D., Negulescu B, Thomas L, Dahoo P, Guyot M, Ohlídal I., Mistrík J, Yamaguchi T,
Optical properties of NiO thin films prepared by pulsed laser deposition technique,
Applied Surface Science Vol. 244 (2005) 426–430

Franta D., Ohlídal I., Mistrík J, Yamaguchi T, Hu G, Dai N,
Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions,
Applied Surface Science Vol. 244 (2005) 338–342

Antoš R, Ohlídal I., Mistrík J, Murakami K, Yamaguchi T, Pištora J, Horie M, Višňovský ,
Spectroscopic ellipsometry on lamellar gratings,
Applied Surface Science Vol. 244 (2005) 225–229

Antoš R, Ohlídal I., Franta D., Klapetek P, Mistrík J, Yamaguchi T, Višňovský ,
Spectroscopic ellipsometry of sinusoidal surface-relief gratings,
Applied Surface Science Vol. 244 (2005) 221–224

2003

Franta D., Ohlídal I., Frumar M, Jedelský J,
Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model,
Applied Surface Science Vol. 212–213 (2003) 116–121

2001

Franta D., Ohlídal I., Frumar M, Jedelský J,
Optical characterization of chalcogenide thin films,
Applied Surface Science Vol. 175–176 (2001) 555–561

Postava K, Sueki H, Aoyama M, Yamaguchi T, Murakami K, Igasaki Y,
Doping effects on optical properties of epitaxial ZnO layers determined by spectroscopic ellipsometry,
Applied Surface Science Vol. 175 (2001) 543–548

1988

Ohlídal I., Lukeš F,
Analysis of semiconductor surfaces with very thin native oxide layers by combined immersion and multiple angle of incidence ellipsometry,
Applied Surface Science Vol. 35 (1988) 259–273