Zdeněk Remeš, Jakub Holovský, Adam Purkrt, Tibor Ižák, Aleš Poruba, Milan Vaněček, Űmit Dagkaldiran, Heather M. Yates, Philip Evans, David W. Sheel
Optical absorption losses in metal layers used in thin film solar cells
Physica Status Solidi A 207 (2010) 2170–2173
We apply optical transmittance and reflectance spectroscopy, photothermal deflection spectroscopy (PDS) and laser calorimetry (LC) to evaluate optical absorption losses at rough interface between thin conductive oxide (TCO) and metal films used as backreflectors and electrical contacts in thin film solar cells. The paper proposes a simple method how to model the dielectric function of rough metal layers used in thin film solar cells. We show that the rough metal layer optically behaves as a semi-infinite layer with modified dielectric function calculated by the Landau-Lifshitz-Looyenga (LLL) model from the dielectric function of a smooth metal, the dielectric function of TCO and just one free parameter that needs to be found by fitting the total optical absorptance. This approach can be used to simplify the modelling of the optical properties of thin film solar cells.
Cited Articles
-
Franta D., Ohlídal I.,
Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces,
Journal of Optics A: Pure and Applied Optics 8 (2006) 763–774