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Publications in Surface and Interface Analysis

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2018

Vohánka J., Ohlídal I., Ženíšek J, Vasina P, Čermák M., Franta D.,
Use of the Richardson extrapolation in optics of inhomogeneous layers: application to optical characterization,
Surface and Interface Analysis Vol. 50 7 (2018) 757-765

Ohlídal I., Vohánka J., Mistrík J, Čermák M., Franta D.,
Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers,
Surface and Interface Analysis Vol. 50 (2018) 1230-1233

2013

Nečas D., Franta D., Ohlídal I., Poruba A, Wostrý P,
Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films,
Surface and Interface Analysis Vol. 45 (2013) 1188-1192

2010

Campbellová A, Klapetek P, Buršíková V., Valtr M, Buršík J,
Small-load nanoindentation experiments on metals,
Surface and Interface Analysis Vol. 42 6-7, SI (2010) 766-769

2006

Klapetek P, Ohlídal I., Buršík J,
Applications of scanning thermal microscopy in the analysis of the geometry of patterned structures,
Surface and Interface Analysis Vol. 38 (2006) 383–387

Franta D., Ohlídal I., Klapetek P, Nepustilová R, Bajer S,
Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy,
Surface and Interface Analysis Vol. 38 (2006) 842–846

2004

Franta D., Ohlídal I., Klapetek P, Ohlídal M,
Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy,
Surface and Interface Analysis Vol. 36 (2004) 1203–1206

2002

Franta D., Ohlídal I., Klapetek P, Pokorný P,
Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods,
Surface and Interface Analysis Vol. 34 (2002) 759–762

Ohlídal M, Ohlídal I., Franta D., Králík T, Jákl M, Eliáš M.,
Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method,
Surface and Interface Analysis Vol. 34 (2002) 660–663

Klapetek P, Ohlídal I., Franta D., Pokorný P,
Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method,
Surface and Interface Analysis Vol. 33 (2002) 559–564

2001

Franta D., Ohlídal I., Klapetek P, Pokorný P, Ohlídal M,
Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy,
Surface and Interface Analysis Vol. 32 (2001) 91–94

2000

Franta D., Ohlídal I.,
Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry,
Surface and Interface Analysis Vol. 30 (2000) 574–579

1999

Ohlídal I., Franta D., Pinčík E, Ohlídal M,
Complete optical characterization of the SiO2/Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy,
Surface and Interface Analysis Vol. 28 (1999) 240–244

1991

Ohlídal I., Líbezný M,
Ellipsometric analysis of gallium arsenide surfaces,
Surface and Interface Analysis Vol. 17 (1991) 171–176

1990

Ohlídal I., Líbezný M,
Immersion ellipsometry of semiconductor surfaces,
Surface and Interface Analysis Vol. 16 (1990) 46–53