Notice: Undefined variable: jid in /home/publications/web/journal.php on line 140 Publications in Surface and Interface Analysis
Main page | Journal list | Log-in

Publications in Surface and Interface Analysis

This journal was preceded by

none

This journal was succeeded by

Astronomy and Astrophysics
Applied Optics
Applied Physics A: Materials Science and Processing
Acta Physica Polonica A
Review of Scientific Instruments
Acta Physica Slovaca
Diamond and Related Materials
Journal of Applied Physics
Journal of Optics A: Pure and Applied Optics
Journal of Physics and Chemistry of Solids
Journal of Physics D: Applied Physics
Optics Communications
Optics Express
Plasma Chemistry and Plasma Processing
Plasma Physics and Controlled Fusion
Physical Review B
Spectrochimica Acta Part B: Atomic Spectroscopy
Surface Science
Thin Solid Films
Journal of the Optical Society of America A
Advanced Materials Research
Nuclear Instruments and Methods in Physics Research Section B - Beam Interactions Materials and Atoms
Journal of Ceramic Processing Research
Journal of Alloys and Compounds
Materials Letters
International Journal of Hydrogen Energy
Tekstil ve Konfeksiyon
Materials & Design
Polimeri: Plastics and Rubber Journal
Progress in organic coatings
Revista Mexicana de Fisica
Nanoscale Research Letters
Journal Of Electrical Engineering-Elektrotechnicky Casopis
Journal of Applied Polymer Science
Materials Chemistry and Physics
Biomacromolecules
Solar Energy
Materials Research Bulletin
Journal of Nano Research
Journal of Colloid and Interface Science
Ceramics International
Wear
Journal of the Electrochemical Society
European Physical Journal-Applied Physics
IEEE Transactions on Plasma Science
Journal of Micromechanics and Microengineering
Indian Journal of Pure & Applied Physics
Metallurgical and Materials Transactions A-Physical Metallurgy and Materials Science
Tribology International
Tribology Letters
Journal of Physical Chemistry A
Journal of Luminescence
Materials Science-Medziagotyra
Rapid Communications in Mass Spectrometry
Nuclear Instruments & Methods in Physics Reserch Section A-Accelerators Spectrometers Detectors and Associated Equipment
Materials Characterization
International Materials Reviews
International Journal of Surface Science and Engineering
Journal of Tribology-Transactions of the ASME
Brazilian Journal of Physics
High Temperature Material Processes
ACS Applied Materials & Interfaces
Optical Materials
Przemysl Chemiczny
Polimery
European Physical Journal D
Physics of Plasmas
Collection of Czechoslovak Chemical Communications
Langmuir
Bulletin of Materials Science
Journal of Vacuum Science & Technology B
Thermochimica Acta
Journal of Biomedical Materials Research Part A
Korean Journal of Chemical Engineering
Radiation Physics and Chemistry
Advances in Polymer Technology
Contribution to Plasma Physics
Surface Engineering
Journal of Physics: Conference Series
Central European Journal of Physics
Colloid and Polymer Science
Science of Sintering
Computational Materials Science
Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy
International Journal of Electrochemical Science
INTERNATIONAL JOURNAL OF ENVIRONMENTAL RESEARCH AND PUBLIC HEALTH
Journal of Materials Chemistry
Progress in Optics
Optical Materials Express
Ionics
IEEE Sensors Journal
Sensors
An Official Journal of the American Association of Pharmaceutical Scientists
Advanced Optical Materials
AAPS PharmSciTech
RSC Advances
Plasma Science & Technology
ECS Journal of Solid State Science and Technology
Optics Letters


2013

Nečas D., Franta D., Ohlídal I., Poruba A, Wostrý P,
Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films,
Surface and Interface Analysis Vol. 45 (2013) 1188-1192

2010

Campbellová A, Klapetek P, Buršíková V., Valtr M, Buršík J,
Small-load nanoindentation experiments on metals,
Surface and Interface Analysis Vol. 42 6-7, SI (2010) 766-769

2006

Franta D., Ohlídal I., Klapetek P, Nepustilová R, Bajer S,
Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy,
Surface and Interface Analysis Vol. 38 (2006) 842–846

Klapetek P, Ohlídal I., Buršík J,
Applications of scanning thermal microscopy in the analysis of the geometry of patterned structures,
Surface and Interface Analysis Vol. 38 (2006) 383–387

2004

Franta D., Ohlídal I., Klapetek P, Ohlídal M,
Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy,
Surface and Interface Analysis Vol. 36 (2004) 1203–1206

2002

Franta D., Ohlídal I., Klapetek P, Pokorný P,
Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods,
Surface and Interface Analysis Vol. 34 (2002) 759–762

Ohlídal M, Ohlídal I., Franta D., Králík T, Jákl M, Eliáš M.,
Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method,
Surface and Interface Analysis Vol. 34 (2002) 660–663

Klapetek P, Ohlídal I., Franta D., Pokorný P,
Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method,
Surface and Interface Analysis Vol. 33 (2002) 559–564

2001

Franta D., Ohlídal I., Klapetek P, Pokorný P, Ohlídal M,
Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy,
Surface and Interface Analysis Vol. 32 (2001) 91–94

2000

Franta D., Ohlídal I.,
Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry,
Surface and Interface Analysis Vol. 30 (2000) 574–579

1999

Ohlídal I., Franta D., Pinčík E, Ohlídal M,
Complete optical characterization of the SiO2/Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy,
Surface and Interface Analysis Vol. 28 (1999) 240–244

1991

Ohlídal I., Líbezný M,
Ellipsometric analysis of gallium arsenide surfaces,
Surface and Interface Analysis Vol. 17 (1991) 171–176

1990

Ohlídal I., Líbezný M,
Immersion ellipsometry of semiconductor surfaces,
Surface and Interface Analysis Vol. 16 (1990) 46–53