Publications in Acta Physica Slovaca

2005

Ohlídal I., Franta D., Klapetek P,
Combination of optical methods and atomic force microscopy at characterization of thin film systems,
Acta Physica Slovaca Vol. 55 (2005) 271–294

Dvořák P, Jánský J, Zajíčková L., Janča J,
Energy Distribution of Hydrogen Ions in Capacitively Coupled Low Pressure Discharge,
Acta Physica Slovaca Vol. 55 (2005) 441–446

Klapetek P, Ohlídal I.,
Applications of the wavelet transform in AFM data analysis,
Acta Physica Slovaca Vol. 55 (2005) 295–303

2003

Franta D., Ohlídal I., Klapetek P, Montaigne-Ramil A, Bonanni A, Stifter D, Sitter H,
Optical constants of ZnTe and ZnSe epitaxial thin films,
Acta Physica Slovaca Vol. 53 (2003) 95–104

Zajíčková L., Subedi D, Buršíková V., Veltruská K,
Study of Argon Plasma Treatment of Polycarbonate Substrate and its Effect on Film Deposition,
Acta Physica Slovaca Vol. 53 (2003) 489–504

Franta D., Zajíčková L., Buršíková V., Ohlídal I.,
New dispersion model of the optical constants of the DLC films,
Acta Physica Slovaca Vol. 53 (2003) 373–384

Klapetek P, Ohlídal I., Franta D., Montaigne-Ramil A, Bonanni A, Stifter D, Sitter H,
Atomic force microscopy characterization of ZnTe epitaxial films,
Acta Physica Slovaca Vol. 53 (2003) 223–230

2000

Ohlídal I., Franta D.,
Matrix formalism for imperfect thin films,
Acta Physica Slovaca Vol. 50 (2000) 489–500

Franta D., Ohlídal I.,
Analysis of thin films by optical multi-sample methods,
Acta Physica Slovaca Vol. 50 (2000) 411–421

1998

Ohlídal I., Franta D.,
Ellipsometry of Thin Films,
Acta Physica Slovaca Vol. 48 (1998) 459–468

Franta D., Ohlídal I., Munzar D,
Parameterisation of the model of dispersion dependences of solid state optical constants,
Acta Physica Slovaca Vol. 48 (1998) 451–458