Publications of Jiří Vohánka
Journal articles with impact factor: 2024, 2023, 2021, 2020, 2019, 2018, 2017, 2004
Journal articles without impact factor: 2018
Conference proceedings available from ISI Web of Science:
Conference proceedings not available from ISI Web of Science:
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Articles in journals with impact factor
2024
Franta D., Hroncová B., Dvořák J., Vohánka J., Franta P., Ohlídal I., Pekař V., Skoda D., Wide spectral range optical characterization of niobium pentoxide (Nb2O5) films by universal dispersion model, Optical Materials 157 (2024) 1161332023
Franta D., Vohánka J., Dvořák J., Franta P., Ohlídal I., Klapetek P., Březina J., Skoda D., Optical Characterization of Gadolinium Fluoride Films Using Universal Dispersion Model, Coatings 13(2) (2023) 218Franta D., Vohánka J., Hroncová B., Dispersion models exhibiting natural optical activity: theory of dielectric response of isotropic systems, Journal of the Optical Society of America B 40 (2023) 2928-2941
2021
Franta D., Vohánka J., Constitutive equations describing optical activity in theory of dispersion, Journal of the Optical Society of America B 38 (2021) 553-561Ohlídal I., Vohánka J., Čermák M., Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization, Coatings 11(22) (2021) 31
2020
Ohlídal I., Vohánka J., Buršíková V., Franta D., Čermák M., Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers, Optics Express 28 (2020) 160-174Vohánka J., Franta D., Čermák M., Homola V., Buršíková V., Ohlídal I., Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials, Optics Express 28 (2020) 5492-5506
Čermák M., Vohánka J., Franta D., Ohlídal I., Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh–Rice theory and Yeh matrix formalism, Physica Scripta 95 (2020) 095503
Vohánka J., Šustek Š., Buršíková V., Šklíbová V., Šulc V., Homola V., Franta D., Čermák M., Ohlídal M., Ohlídal I., Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry, Applied Surface Science 534 (2020) 147625
Ohlídal I., Vohánka J., Buršíková V., Šulc V., Šustek Š., Ohlídal M., Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films, Optics Express 28 (2020) 36796-36811
2019
Franta D., Vohánka J., Čermák M., Franta P., Ohlídal I., Temperature dependent dispersion models applicable in solid state physics, Journal Of Electrical Engineering 70 (2019) 1-15Ohlídal I., Vohánka J., Franta D., Čermák M., Ženíšek J., Vasina P., Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films, Journal Of Electrical Engineering 70 (2019) 16-26
Vohánka J., Čermák M., Franta D., Ohlídal I., Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh–Rice theory, Physica Scripta 94 (2019) 045502
Vohánka J., Ohlídal I., Ohlídal M., Šustek Š., Čermák M., Šulc V., Vasina P., Ženíšek J., Franta D., Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects, Coatings 9(7) (2019) 416
Franta D., Vohánka J., Bránecký M., Franta P., Čermák M., Ohlídal I., Čech V., Optical Properties of the Crystalline Silicon Wafers Described Using the Universal Dispersion Model, Journal of Vacuum Science & Technology B 37 (2019) 062907
Vohánka J., Nečas D., Franta D., Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions, Journal of Vacuum Science & Technology B 37 (2019) 062909
Ohlídal I., Vohánka J., Čermák M., Franta D., Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers, Surface Topography: Metrology and Properties 7(4) (2019) 045004
Ohlídal I., Vohánka J., Buršíková V., Ženíšek J., Vasina P., Čermák M., Franta D., Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model, Journal of Vacuum Science & Technology B 37(6) (2019) 062921
Ohlídal I., Vohánka J., Mistrík J., Čermák M., Vižďa F., Franta D., Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model, Thin Solid Films 692 (2019) 137189
2018
Franta D., Franta P., Vohánka J., Čermák M., Ohlídal I., Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region, Journal of Applied Physics 123 (2018) 185707Čermák M., Vohánka J., Ohlídal I., Franta D., Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory, Journal of Modern Optics 65(14) (2018) 1720-1736
Ohlídal I., Vohánka J., Mistrík J., Čermák M., Franta D., Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers, Surface and Interface Analysis 50 (2018) 1230-1233
Vohánka J., Ohlídal I., Ženíšek J., Vasina P., Čermák M., Franta D., Use of the Richardson extrapolation in optics of inhomogeneous layers: application to optical characterization, Surface and Interface Analysis 50(7) (2018) 757-765
2017
Franta D., Dubroka A., Wang C., Giglia A., Vohánka J., Franta P., Ohlídal I., Temperature-dependent dispersion model of float zone crystalline silicon, Applied Surface Science 421 (2017) 405-419Franta D., Čermák M., Vohánka J., Ohlídal I., Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model, Thin Solid Films 631 (2017) 12-22
Ohlídal I., Vohánka J., Čermák M., Franta D., Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory, Applied Surface Science 419 (2017) 942-956