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Publications in Optics Express

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Ohlídal I., Vohánka J., Buršíková V., Šulc V, Šustek , Ohlídal M,
Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films,
Optics Express Vol. 28 (2020) 36796-36811

Vohánka J., Franta D., Čermák M., Homola V, Buršíková V., Ohlídal I.,
Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials,
Optics Express Vol. 28 (2020) 5492-5506

Ohlídal I., Vohánka J., Buršíková V., Franta D., Čermák M.,
Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers,
Optics Express Vol. 28 (2020) 160-174


Nečas D., Ohlídal I.,
Consolidated series for efficient calculation of the reflection and transmission in rough multilayers,
Optics Express Vol. 22 4 (2014) 4499-4515


Franta D., Ohlídal I., Nečas D.,
Influence of cross-correlation effects on the optical quantities of rough films,
Optics Express Vol. 16 (2008) 7789–7803


Franta D., Nečas D., Zajíčková L.,
Models of dielectric response in disordered solids,
Optics Express Vol. 15 (2007) 16230–16244