Notice: Undefined variable: jid in /home/publications/web/journal.php on line 140 Publications in Measurement Science and Technology
Main page | Journal list | Log-in

Publications in Measurement Science and Technology

This journal was preceded by


This journal was succeeded by

Astronomy and Astrophysics
Applied Optics
Applied Physics A: Materials Science and Processing
Acta Physica Polonica A
Review of Scientific Instruments
Acta Physica Slovaca
Diamond and Related Materials
Journal of Applied Physics
Journal of Optics A: Pure and Applied Optics
Journal of Physics and Chemistry of Solids
Journal of Physics D: Applied Physics
Optics Communications
Optics Express
Plasma Chemistry and Plasma Processing
Plasma Physics and Controlled Fusion
Physical Review B
Spectrochimica Acta Part B: Atomic Spectroscopy
Surface Science
Thin Solid Films
Journal of the Optical Society of America A
Advanced Materials Research
Nuclear Instruments and Methods in Physics Research Section B - Beam Interactions Materials and Atoms
Journal of Ceramic Processing Research
Journal of Alloys and Compounds
Materials Letters
International Journal of Hydrogen Energy
Tekstil ve Konfeksiyon
Materials & Design
Polimeri: Plastics and Rubber Journal
Progress in organic coatings
Revista Mexicana de Fisica
Nanoscale Research Letters
Journal Of Electrical Engineering-Elektrotechnicky Casopis
Journal of Applied Polymer Science
Materials Chemistry and Physics
Solar Energy
Materials Research Bulletin
Journal of Nano Research
Journal of Colloid and Interface Science
Ceramics International
Journal of the Electrochemical Society
European Physical Journal-Applied Physics
IEEE Transactions on Plasma Science
Journal of Micromechanics and Microengineering
Indian Journal of Pure & Applied Physics
Metallurgical and Materials Transactions A-Physical Metallurgy and Materials Science
Tribology International
Tribology Letters
Journal of Physical Chemistry A
Journal of Luminescence
Materials Science-Medziagotyra
Rapid Communications in Mass Spectrometry
Nuclear Instruments & Methods in Physics Reserch Section A-Accelerators Spectrometers Detectors and Associated Equipment
Materials Characterization
International Materials Reviews
International Journal of Surface Science and Engineering
Journal of Tribology-Transactions of the ASME
Brazilian Journal of Physics
High Temperature Material Processes
ACS Applied Materials & Interfaces
Optical Materials
Przemysl Chemiczny
European Physical Journal D
Physics of Plasmas
Collection of Czechoslovak Chemical Communications
Bulletin of Materials Science
Journal of Vacuum Science & Technology B
Thermochimica Acta
Journal of Biomedical Materials Research Part A
Korean Journal of Chemical Engineering
Radiation Physics and Chemistry
Advances in Polymer Technology
Contribution to Plasma Physics
Surface Engineering
Journal of Physics: Conference Series
Central European Journal of Physics
Colloid and Polymer Science
Science of Sintering
Computational Materials Science
Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy
International Journal of Electrochemical Science
Journal of Materials Chemistry
Progress in Optics
Optical Materials Express
IEEE Sensors Journal
An Official Journal of the American Association of Pharmaceutical Scientists
Advanced Optical Materials
AAPS PharmSciTech
RSC Advances
Plasma Science & Technology
ECS Journal of Solid State Science and Technology
Optics Letters


Vodák J, Nečas D., Ohlídal M, Ohlídal I.,
Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution,
Measurement Science and Technology Vol. 28 (2017) 025205

Klapetek P, Yacoot A, Grolich P, Valtr M, Nečas D.,
Gwyscan: a library to support non-equidistant Scanning Probe Microscope measurements,
Measurement Science and Technology Vol. 28 3 (2017) 034015

Nečas D., Klapetek P,
Study of user influence in routine SPM data processing,
Measurement Science and Technology Vol. 28 3 (2017) 034014


Nečas D., Čudek V, Vodák J, Ohlídal M, Klapetek P, Benedikt J, Rügner K, Zajíčková L.,
Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry,
Measurement Science and Technology Vol. 25 (2014) 115201

Klapetek P, Nečas D.,
Independent analysis of mechanical data from atomic force microscopy,
Measurement Science and Technology Vol. 25 (2014) 044009


Chen J, Louis E, Wormeester H, Harmsen R, van de Kruijs R, Lee C, van Schaik W, Bijkerk F,
Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry,
Measurement Science and Technology Vol. 22 10 (2011) 105705

Klapetek P, Nečas D., Campbellová A, Yacoot A, Koenders L,
Methods for determining and processing 3D errors and uncertainties for AFM data analysis,
Measurement Science and Technology Vol. 22 2 (2011) 025501

Ohlídal M, Ohlídal I., Klapetek P, Nečas D., Majumdar A,
Measurement of the thickness distribution and optical constants of non-uniform thin films ,
Measurement Science and Technology Vol. 22 8 (2011) 085104


Klapetek P, Ohlídal I., Buršík J,
Atomic force microscopy studies of cross-sections of columnar thin films,
Measurement Science and Technology Vol. 18 (2007) 528–531