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Publications in Measurement Science and Technology

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SUB

Nečas D., Yacoot A, Valtr M, Klapetek P,
Demystifying data evaluation in the measurement of periodic structures,
Measurement Science and Technology Vol. 462725284 (SUB) SUB

2020

Klapetek P, Yacoot A, Hortvík V, Duchoň V, Dongmo H, Rerucha S, Valtr M, Nečas D.,
Multiple fibre interferometry setup for probe sample interaction measurements in atomic force microscopy,
Measurement Science and Technology Vol. 31 (2020) 094001

Nečas D., Klapetek P, Valtr M,
Estimation of roughness measurement bias originating from background subtraction,
Measurement Science and Technology Vol. 31 (2020) 094010

2017

Vodák J, Nečas D., Ohlídal M, Ohlídal I.,
Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution,
Measurement Science and Technology Vol. 28 (2017) 025205

Klapetek P, Yacoot A, Grolich P, Valtr M, Nečas D.,
Gwyscan: a library to support non-equidistant Scanning Probe Microscope measurements,
Measurement Science and Technology Vol. 28 3 (2017) 034015

Nečas D., Klapetek P,
Study of user influence in routine SPM data processing,
Measurement Science and Technology Vol. 28 3 (2017) 034014

2014

Nečas D., Čudek V, Vodák J, Ohlídal M, Klapetek P, Benedikt J, Rügner K, Zajíčková L.,
Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry,
Measurement Science and Technology Vol. 25 (2014) 115201

Klapetek P, Nečas D.,
Independent analysis of mechanical data from atomic force microscopy,
Measurement Science and Technology Vol. 25 (2014) 044009

2011

Klapetek P, Nečas D., Campbellová A, Yacoot A, Koenders L,
Methods for determining and processing 3D errors and uncertainties for AFM data analysis,
Measurement Science and Technology Vol. 22 2 (2011) 025501

Ohlídal M, Ohlídal I., Klapetek P, Nečas D., Majumdar A,
Measurement of the thickness distribution and optical constants of non-uniform thin films ,
Measurement Science and Technology Vol. 22 8 (2011) 085104

Chen J, Louis E, Wormeester H, Harmsen R, van de Kruijs R, Lee C, van Schaik W, Bijkerk F,
Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry,
Measurement Science and Technology Vol. 22 10 (2011) 105705

2007

Klapetek P, Ohlídal I., Buršík J,
Atomic force microscopy studies of cross-sections of columnar thin films,
Measurement Science and Technology Vol. 18 (2007) 528–531