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Publications in Measurement Science and Technology

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Astronomy and Astrophysics
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Applied Physics A: Materials Science and Processing
Acta Physica Polonica A
Review of Scientific Instruments
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Spectrochimica Acta Part B: Atomic Spectroscopy
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Thin Solid Films
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Tekstil ve Konfeksiyon
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Revista Mexicana de Fisica
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Tribology International
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Journal of Luminescence
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Rapid Communications in Mass Spectrometry
Nuclear Instruments & Methods in Physics Reserch Section A-Accelerators Spectrometers Detectors and Associated Equipment
Materials Characterization
International Materials Reviews
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Brazilian Journal of Physics
High Temperature Material Processes
ACS Applied Materials & Interfaces
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European Physical Journal D
Physics of Plasmas
Collection of Czechoslovak Chemical Communications
Langmuir
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Journal of Biomedical Materials Research Part A
Korean Journal of Chemical Engineering
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Advances in Polymer Technology
Contribution to Plasma Physics
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Colloid and Polymer Science
Science of Sintering
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Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy
International Journal of Electrochemical Science
INTERNATIONAL JOURNAL OF ENVIRONMENTAL RESEARCH AND PUBLIC HEALTH
Journal of Materials Chemistry
Progress in Optics
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Ionics
IEEE Sensors Journal
Sensors
An Official Journal of the American Association of Pharmaceutical Scientists
Advanced Optical Materials
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RSC Advances
Plasma Science & Technology
ECS Journal of Solid State Science and Technology
Optics Letters


2017

Vodák J, Nečas D., Ohlídal M, Ohlídal I.,
Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution,
Measurement Science and Technology Vol. 28 (2017) 025205

Klapetek P, Yacoot A, Grolich P, Valtr M, Nečas D.,
Gwyscan: a library to support non-equidistant Scanning Probe Microscope measurements,
Measurement Science and Technology Vol. 28 3 (2017) 034015

Nečas D., Klapetek P,
Study of user influence in routine SPM data processing,
Measurement Science and Technology Vol. 28 3 (2017) 034014

2014

Nečas D., Čudek V, Vodák J, Ohlídal M, Klapetek P, Benedikt J, Rügner K, Zajíčková L.,
Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry,
Measurement Science and Technology Vol. 25 (2014) 115201

Klapetek P, Nečas D.,
Independent analysis of mechanical data from atomic force microscopy,
Measurement Science and Technology Vol. 25 (2014) 044009

2011

Chen J, Louis E, Wormeester H, Harmsen R, van de Kruijs R, Lee C, van Schaik W, Bijkerk F,
Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry,
Measurement Science and Technology Vol. 22 10 (2011) 105705

Klapetek P, Nečas D., Campbellová A, Yacoot A, Koenders L,
Methods for determining and processing 3D errors and uncertainties for AFM data analysis,
Measurement Science and Technology Vol. 22 2 (2011) 025501

Ohlídal M, Ohlídal I., Klapetek P, Nečas D., Majumdar A,
Measurement of the thickness distribution and optical constants of non-uniform thin films ,
Measurement Science and Technology Vol. 22 8 (2011) 085104

2007

Klapetek P, Ohlídal I., Buršík J,
Atomic force microscopy studies of cross-sections of columnar thin films,
Measurement Science and Technology Vol. 18 (2007) 528–531