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Publications in Journal of Applied Physics

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2020

Franta D.,
Symmetry of Linear Dielectric Response Tensors: Dispersion Models Fulfilling Three Fundamental Conditions,
Journal of Applied Physics Vol. 127 (2020) 223101

2018

Franta D., Franta P, Vohánka J., Čermák M., Ohlídal I.,
Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region,
Journal of Applied Physics Vol. 123 (2018) 185707

2015

Eliáš M., Kloc P, Jašek O., Mazánková V, Trunec D., Hrdý R, Zajíčková L.,
Atmospheric pressure barrier discharge at high temperature: Diagnostics and carbon nanotubes deposition,
Journal of Applied Physics Vol. 117 10 (2015) 103301

2011

Ding Q, Wang L, Hu L, Hu T, Wang , Zhang ,
An explanation for laser-induced spallation effect in a-C:H films: Altered phase evolution route caused by hydrogen doping,
Journal of Applied Physics Vol. 109 1 (2011) 013501

Bakradze G, Jeurgens L, Mittemeijer E,
The different initial oxidation kinetics of Zr(0001) and Zr(101̅0) surfaces,
Journal of Applied Physics Vol. 110 2 (2011) 024904

2009

Němec P, Moréac A, Nazabal V, Pavlišta M, Přikryl J, Frumar M,
Ge-Sb-Te thin films deposited by pulsed laser: An ellipsometry and Raman scattering spectroscopy study,
Journal of Applied Physics Vol. 106 10 (2009) 103509

2008

Orava J, Wagner T, Sik J, Prikryl J, Frumar M, Benes L,
Optical properties and phase change transition in Ge(2)Sb(2)Te(5) flash evaporated thin films studied by temperature dependent spectroscopic ellipsometry,
Journal of Applied Physics Vol. 104 4 (2008) 043523

2005

Antoš R, Pištora J, Ohlídal I., Postava K, Mistrík J, Yamaguchi T, Višňovský , Horie M,
Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate,
Journal of Applied Physics Vol. 97 (2005) 053107

2002

Franta D., Ohlídal I., Klapetek P, Montaigne-Ramil A, Bonanni A, Stifter D, Sitter H,
Influence of overlayers on determination of the optical constants of ZnSe thin films,
Journal of Applied Physics Vol. 92 (2002) 1873–1880