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Publications in Applied Optics

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Astronomy and Astrophysics
Applied Optics
Applied Physics A: Materials Science and Processing
Acta Physica Polonica A
Review of Scientific Instruments
Acta Physica Slovaca
Diamond and Related Materials
Journal of Applied Physics
Journal of Optics A: Pure and Applied Optics
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Optics Communications
Optics Express
Plasma Chemistry and Plasma Processing
Plasma Physics and Controlled Fusion
Physical Review B
Spectrochimica Acta Part B: Atomic Spectroscopy
Surface Science
Thin Solid Films
Journal of the Optical Society of America A
Advanced Materials Research
Nuclear Instruments and Methods in Physics Research Section B - Beam Interactions Materials and Atoms
Journal of Ceramic Processing Research
Journal of Alloys and Compounds
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Tekstil ve Konfeksiyon
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Polimeri: Plastics and Rubber Journal
Progress in organic coatings
Revista Mexicana de Fisica
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Materials Characterization
International Materials Reviews
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Brazilian Journal of Physics
High Temperature Material Processes
ACS Applied Materials & Interfaces
Optical Materials
Przemysl Chemiczny
European Physical Journal D
Physics of Plasmas
Collection of Czechoslovak Chemical Communications
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Korean Journal of Chemical Engineering
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Optics Letters


Franta D., Nečas D., Ohlídal I.,
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia,
Applied Optics Vol. 54 (2015) 9108-9119


Nečas D., Ohlídal I., Franta D., Ohlídal M, Čudek V, Vodák J,
Measurement of thickness distribution, optical constants and roughness parameters of rough non-uniform ZnSe thin films,
Applied Optics Vol. 53 (2014) 5606-5614


Janicki V, Sancho-Parramon J, Stenzel O, Lappschies M, Goertz B, Rickers C, Polenzky C, Richter U,
Optical characterization of hybrid antireflective coatings using spectrophotometric and ellipsometric measurements,
Applied Optics Vol. 46 (2007) 6084–6091


Ohlídal I., Franta D., Ohlídal M, Navrátil K,
Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances,
Applied Optics Vol. 40 (2001) 5711–5717


Ohlídal I., Navrátil K, Ohlídal M, Druckmüller M,
Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry,
Applied Optics Vol. 33 (1994) 7838–7845


Ohlídal I., Schmidt E, Líbezný M,
Complete unambiguous optical characterization of double layers consisting of two strongly absorbing thin films by combined reflection and transmission ellipsometry,
Applied Optics Vol. 29 (1990) 593–598


Ohlídal I., Navrátil K,
Analysis of the basic statistical properties of randomly rough curved surfaces by shearing interferometry,
Applied Optics Vol. 24 (1985) 2690–2695


Ohlídal I.,
Expression for the reflectance of randomly rough surfaces derived with the Fresnel approximation,
Applied Optics Vol. 19 (1980) 1804–1811