Publications in Applied Optics

2015

Franta D., Nečas D., Ohlídal I.,
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia,
Applied Optics Vol. 54 (2015) 9108-9119

2014

Nečas D., Ohlídal I., Franta D., Ohlídal M, Čudek V, Vodák J,
Measurement of thickness distribution, optical constants and roughness parameters of rough non-uniform ZnSe thin films,
Applied Optics Vol. 53 (2014) 5606-5614

2007

Janicki V, Sancho-Parramon J, Stenzel O, Lappschies M, Goertz B, Rickers C, Polenzky C, Richter U,
Optical characterization of hybrid antireflective coatings using spectrophotometric and ellipsometric measurements,
Applied Optics Vol. 46 (2007) 6084–6091

2001

Ohlídal I., Franta D., Ohlídal M, Navrátil K,
Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances,
Applied Optics Vol. 40 (2001) 5711–5717

1994

Ohlídal I., Navrátil K, Ohlídal M, Druckmüller M,
Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry,
Applied Optics Vol. 33 (1994) 7838–7845

1990

Ohlídal I., Schmidt E, Líbezný M,
Complete unambiguous optical characterization of double layers consisting of two strongly absorbing thin films by combined reflection and transmission ellipsometry,
Applied Optics Vol. 29 (1990) 593–598

1985

Ohlídal I., Navrátil K,
Analysis of the basic statistical properties of randomly rough curved surfaces by shearing interferometry,
Applied Optics Vol. 24 (1985) 2690–2695

1980

Ohlídal I.,
Expression for the reflectance of randomly rough surfaces derived with the Fresnel approximation,
Applied Optics Vol. 19 (1980) 1804–1811