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Publications in Applied Optics

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Franta D., Nečas D., Ohlídal I.,
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia,
Applied Optics Vol. 54 (2015) 9108-9119


Nečas D., Ohlídal I., Franta D., Ohlídal M, Čudek V, Vodák J,
Measurement of thickness distribution, optical constants and roughness parameters of rough non-uniform ZnSe thin films,
Applied Optics Vol. 53 (2014) 5606-5614


Janicki V, Sancho-Parramon J, Stenzel O, Lappschies M, Goertz B, Rickers C, Polenzky C, Richter U,
Optical characterization of hybrid antireflective coatings using spectrophotometric and ellipsometric measurements,
Applied Optics Vol. 46 (2007) 6084–6091


Ohlídal I., Franta D., Ohlídal M, Navrátil K,
Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances,
Applied Optics Vol. 40 (2001) 5711–5717


Ohlídal I., Navrátil K, Ohlídal M, Druckmüller M,
Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry,
Applied Optics Vol. 33 (1994) 7838–7845


Ohlídal I., Schmidt E, Líbezný M,
Complete unambiguous optical characterization of double layers consisting of two strongly absorbing thin films by combined reflection and transmission ellipsometry,
Applied Optics Vol. 29 (1990) 593–598


Ohlídal I., Navrátil K,
Analysis of the basic statistical properties of randomly rough curved surfaces by shearing interferometry,
Applied Optics Vol. 24 (1985) 2690–2695


Ohlídal I.,
Expression for the reflectance of randomly rough surfaces derived with the Fresnel approximation,
Applied Optics Vol. 19 (1980) 1804–1811