Publications in Journal of Vacuum Science & Technology B

2019

Ohlídal I., Vohánka J., Buršíková V., Ženíšek J, Vasina P, Čermák M., Franta D.,
Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model,
Journal of Vacuum Science & Technology B Vol. 37 6 (2019) 062921

Vohánka J., Nečas D., Franta D.,
Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions,
Journal of Vacuum Science & Technology B Vol. 37 (2019) 062909

Franta D., Vohánka J., Bránecký M, Franta P, Čermák M., Ohlídal I., Čech V,
Optical Properties of the Crystalline Silicon Wafers Described Using the Universal Dispersion Model,
Journal of Vacuum Science & Technology B Vol. 37 (2019) 062907