Main page | Journal list | Log-in

Roman Antoš, Jan Mistrík, Tomuo Yamaguchi, Štefan Višňovský, Sergej O. Demokritov, Burkard Hillebrands

Evaluation of the quality of Permalloy gratings by diffracted magneto-optical spectroscopy

Optics Express 13 (2005) 4651–4656

Magneto-optical Kerr effect (MOKE) spectroscopy in the –1st diffraction order with p-polarized incidence is applied to study arrays of submicron Permalloy wires at polar magnetization. A theoretical approach combining two methods, the local modes method neglecting the edge effects of wires and the rigorous coupled wave analysis, is derived to evaluate the diffraction losses due to irregularities of the wire edges. A new parameter describing the quality of the edges is defined according to their contribution in the diffracted MOKE. The quality factor, evaluated for two different samples, is successfully compared with irregularities visible on atomic force microscopy pictures.

Download PDF (221 kB)

Cited Articles

  1. Klapetek P., Ohlídal I., Franta D., Montaigne-Ramil A., Bonanni A., Stifter D., Sitter H.,
    Atomic force microscopy characterization of ZnTe epitaxial films,
    Acta Physica Slovaca 53 (2003) 223–230
  2. Klapetek P., Ohlídal I., Franta D., Pokorný P.,
    Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method,
    Surface and Interface Analysis 33 (2002) 559–564
  3. Franta D., Ohlídal I.,
    Ellipsometric parameters and reflectances of thin films with slightly rough boundaries,
    Journal of Modern Optics 45 (1998) 903–934