Publications in Surface Topography: Metrology and Properties

2019

Ohlídal I., Vohánka J., Čermák M., Franta D.,
Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers,
Surface Topography: Metrology and Properties Vol. 7 4 (2019) 045004