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Publications in Infrared Physics & Technology

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2025

Vohánka J., Večeře J, Franta D., Ohlídal I.,
Determination of refractive index of crystalline silicon in the infrared region on the basis of interference pattern observed in thick slab,
Infrared Physics & Technology Vol. 149 (2025) 105889


RG Plasma Technologies, CEITEC BUT | Department of Physical Electronics, FSci MU