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V.V. Filippov

Method of envelopes for studying a two-film system on a reflecting substrate

Optics and Spectroscopy 101 (2006) 458–462

For determining the optical constants and the thickness of thin films (including strongly absorbing films) by the spectrophotometric method, we propose to deposit them on intermediate films formed on strongly reflecting substrates. Due to this, an interference pattern depending on the optical constants and the thickness of the film under study will be observed in the reflectance spectrum. The method of envelopes of the extrema in the reflectance spectrum that is based on the iterative approach is developed for studying two-film systems.

Cited Articles

  1. Ohlídal I., Franta D., Ohlídal M., Navrátil K.,
    Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances,
    Applied Optics 40 (2001) 5711–5717