S. S. N. Bharadwaja, T. Dechakupt, S. Trolier-McKinstry, H. Beratan

Excimer laser crystallized (Pb,La)(Zr,Ti)O-3 thin films

Journal of the American Ceramic Society 91 (2008) 1580–1585

A KrF pulsed excimer laser (248 nm) was utilized to crystallize sputtered La-modified Pb(Zr,Ti)O-3 (3:30:70) (PLZT) films on LaNiO₃-coated silicon substrates. The film surface was irradiated with defocused laser pulses in an oxygen ambient at various substrate temperatures. Polycrystalline, phase pure perovskite PLZT thin films were produced for substrate temperatures of 250 degrees C and higher. The dielectric constant and loss tangent values of laser-assisted crystallized (10 min exposure at 10 Hz using a substrate temperature of 400 degrees C) PLZT thin films at 10 kHz were 406 and 0.027; in comparison, rapid thermal annealed films (annealed at 700 degrees C for 1 min) showed values of 400 and 0.021, respectively. Laser crystallized films exhibited a remanent polarization value of 14 mu C/cm(2) with a coercive field |(E+c+E-c)|/2 of 95 kV/cm.

Cited Articles

1. Mistrík J., Yamaguchi T., Franta D., Ohlídal I., Hu G. J., Dai N.,
   Optical properties of slightly rough LaNiO₃ thin films studied by spectroscopic ellipsometry and reflectometry,
   Applied Surface Science 244 (2005) 431–434