F. E. Ghodsi, S. A. Khayatiyan

Preparation and determination of optical properties of NiO thin films deposited by dip coating technique

Surface Review and Letters 14 (2007) 219–224

The NiO thin films were prepared from NiCl2 center dot 6H(2)O precursor by using sol-gel route. The. lms were deposited on a glass substrate using dip-coating technique. The optical and structural properties of the NiO thin. lms were investigated with respect to dipping rate, number of layers, and annealing temperature. The microstructure of NiO thin. lms and powder were examined by X-ray diffraction (XRD). Various diffraction peaks of NiO powder were observed in the XRD pattern. The morphology of the. lms was studied by using scanning electron microscopy (SEM). The optical characteristics of the samples were determined by using UV-visible spectrophotometer. The results show that the NiO thin. lms are transparent in the visible range. Optical constants (refractive index, extinction coefficient...) were changed by varying dipping rate, number of layers, and annealing temperature.

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