A. Garcia-Valenzuela, G.E. Sandoval-Romero, C. Sanchez-Perez, L. Castaneda, A. Guadarrama-Santana
Dynamic angle-scanning reflectometer device
Review of Scientific Instruments 77 (2006) 065102
This article describes a simple and fast angle-scanning reflectometer. Approximate formulas for the design and implementation of this type of reflectometer are provided. An experimental device was assembled and its performance was evaluated. The instrument scans the angle of incidence of a laser beam in a range of 5°–10° in less than 0.2 ms. The reflectance equivalent noise of our experimental device was about 0.005. The instrument is suitable to measure the coherent reflectance versus the angle of incidence from light diffusing samples.
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Franta D., Ohlídal I.,
Comparison of effective medium approximation and Rayleigh–Rice theory concerning ellipsometric characterization of rough surfaces,
Optics Communications 248 (2005) 459–467