Kamil Postava, Tomuo Yamaguchi

Optical functions of low-k materials for interlayer dielectrics

Journal of Applied Physics 89 (2001) 2189–2193

The optical functions of low dielectric constant (low-k) materials have been determined using a high-precision four-zone null spectroscopic ellipsometer in the spectral range from 1.5 to 5.4 eV (230–840 nm wavelength region). The ellipsometric data were fitted simultaneously with near-normal incidence reflectivity spectra (ranging from 0.5 to 6.5 eV). A general method of simultaneous treatment of ellipsometric and reflectivity data is demonstrated on representative materials used in the semiconductor industry for interlayer dielectrics: (1) SiLK—organic dielectric resin from the Dow Chemical Company, (2) Nanoglass—nanoporous silica from the Honeywell Electronic Materials Company, and (3) tetra-ethyl-ortho-silicate (TEOS) (SiO₂)—the standard dielectric material. The low-k materials (SiLK and Nanoglass) were prepared by a standard spin-coating process, while the SiO₂ layer was prepared by thermal decomposition from TEOS onto single-crystal silicon wafers.

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