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Kamil Postava, Tomuo Yamaguchi, Roman Kantor

Matrix description of coherent and incoherent light reflection and transmission by anisotropic multilayer structures

Applied Optics 41 (2002) 2521–2531

We propose a matrix method for the description of light reflection and transmission by an anisotropic multilayer system consisting of thin and thick layers. A method based on partial-wave matrix summations is applicable in the field of reflection and transmission photometry and ellipsometry. In the case of a thin anisotropic film, the interference effects were described by use of a coherent summation of Jones matrices. Incoherent intensity summations for a thick weakly anisotropic layer were characterized by use of the coherency vector formalism. Observable quantities or Mueller matrix components were obtained from the matrix describing transformation of the coherence vectors.

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Cited Articles

  1. Ohlídal I., Franta D.,
    Matrix formalism for imperfect thin films,
    Acta Physica Slovaca 50 (2000) 489–500