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Publications in Microchimica Acta

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2004

Klapetek P, Ohlídal I., Navrátil K,
Atomic force microscopy analysis of statistical roughness of GaAs surfaces originated by thermal oxidation,
Microchimica Acta Vol. 147 (2004) 175–180


RG Plasma Technologies, CEITEC BUT | Department of Physical Electronics, FSci MU