V. P. Nascimento, E. C. Passamani, A. Biondo, V. B. Nunes, E. Baggio Saitovitch
Properties of the roughness in NiFe/FeMn exchange-biased system
Applied Surface Science 253 (2007) 6248–6254
X-ray reflectivity and atomic force microscopy analyses were performed in the Si/WTi (7 nm)/NiFe (5 nm)/FeMn (13 nm)/WTi (7 nm) exchange-biased system prepared by magnetron sputtering. Layer-by-layer analyses were done in order to have interfacial roughness parameters quantitatively. X-ray reflectivity results indicate that the successive layer deposition gives rise to a cumulative roughness. In addition, the atomic force microscopic images analyses have revealed that the roughness enhancement caused by the successive layer deposition can be associated with an appearance of a longer wavelength roughness induced by the NiFe layer deposition.
Cited Articles
-
Holý V., Kuběna J., Ohlídal I., Lischka K., Plotz W.,
X-ray reflection from rough layered systems,
Physical Review B 47 (1993) 15896–15903