Bor-Jiunn Wen, T. S. Liu

Flexible-characteristics inspection system for flexible substrates by using image feedback control

Diamond and Related Materials 32 (2011) 296-307

The objective of this study is to present a new flexible-characteristic inspection system (FCIS) for measuring bending characteristics of flexible substrates under different bending conditions. In order to quantize bending conditions, charge-coupled device image feedback control is utilized to control radii of curvature of the flexible substrates. As a result, the new technique successfully measures electrical characteristics of flexible polyethylene terephthalate (PET)/indium tin oxide substrates up to 11,000 bending times by using FCIS. In addition, optical-transmittance characteristic measurement of PET/hexamethyldisiloxane substrates up to 5000 bending times under the same radius of curvature is implemented by using FCIS in this study. Inspection results of bending characteristics depicted on flexible displays help a designer or maker of flexible displays design useful and comfortable flexible electronic products.

Cited Articles

1. Zajíčková L., Buršíková V., Kučerová Z., Franclová J., Sťahel P., Peřina V., Macková A.,
   Organosilicon Thin Films Deposited by Plasma Enhanced CVD: Thermal Changes of Chemical Structure and Mechanical Properties,
   Journal of Physics and Chemistry of Solids 68 (2007) 1255–1259